Wednesday

A02 - Advances in Imaging and Spectroscopy in STEM

  • Nigel D. Browning, Pacific Nortwest National Laboratory ;
  • Peter D. Nellist, University of Oxford ;
  • Maria Varela del Arco, Oak Ridge National Laboratory

Platform Session 5

Wednesday, August 06, 2014 8:30 AM - Wednesday, August 06, 2014 10:00 AM

CCC - Room 14

  • Christopher J. Kiely ;
  • Qian He ;
  • Ramchandra Tiruvalam ;
  • Nikolaos Dimitratos ;
  • Michael M Forde ;
  • Meenakshisundaram Sankar ;
  • Graham J Hutchings ;
  • Raul Arenal ;
  • Katia March ;
  • Chris P. Ewels ;
  • Xavier Rocquefelte ;
  • Mathieu Kociak ;
  • Annick Loiseau ;
  • Odile Stephan ;
  • Gianluigi A Botton ;
  • Matthieu Bugnet ;
  • Karleen J Dudeck ;
  • Nicolas Gauquelin ;
  • Hanshuo Liu ;
  • Sagar Prabhudev ;
  • Andrew Scullion ;
  • Samantha Stambula ;
  • Steffi Y Woo ;
  • Guo-Zhen Zhu ;
  • Hieu P.T. Nguyen ;
  • Zetian Mi ;
  • Valentine V Jmerik ;
  • Dmitrii V Nechaev ;
  • Sergey V Ivanov ;
  • Sergei Rouvimov

Assessing and Controlling the Size, Morphology and Composition of Supported Bimetallic Catalyst Nanoparticles

Experimental and Theoretical Atomic-Resolved EELS Studies on Nitrogen Doped Single-Walled Carbon Nanotubes

Studying Tomorrow's Materials Today: Insights with Quantitative STEM, EELS

Fine Structural Studies of AlGaN Laser Heterostructures with Digitally Alloyed Quantum Wells Grown on c-Al2O3 by Plasma-assisted Molecular Beam Epitaxy

Platform Session 6

Wednesday, August 06, 2014 10:30 AM - Wednesday, August 06, 2014 12:00 PM

CCC - Room 14

  • Leslie J Allen ;
  • Hamish G Brown ;
  • Adrian D'Alfonso ;
  • Jim Ciston ;
  • Yuyuan Lin ;
  • Laurence Marks ;
  • Peter Ercius ;
  • Tyler R Harvey ;
  • Jordan Pierce ;
  • Jordan Chess ;
  • Martin Linck ;
  • Ben McMorran ;
  • Peter D. Nellist, University of Oxford ;
  • Hao Yang ;
  • Juan G Lozano ;
  • Timothy J. Pennycook ;
  • Peter B Hirsch ;
  • Jingyue Liu ;
  • Mark P. Oxley ;
  • Myron D Kapetanakis ;
  • Micah P Prange ;
  • Wu Zhou ;
  • Juan-Carlos Idrobo, Oak Ridge National Laboratory ;
  • Sokrates T. Pantelides ;
  • Stephen J. Pennycook

Modeling Secondary Electron Imaging at Atomic Resolution Using a Focused Coherent Electron Probe

Atomic-resolution Imaging Using Cs-corrected Vortex Beams

STEM Optical Sectioning for Imaging Screw Displacements in Dislocation Core Structures

The Versatile Imaging Capabilities of Aberration-Corrected STEM

Inelastic STEM Imaging Based on Low-Loss Spectroscopy

Platform Session 7

Wednesday, August 06, 2014 1:30 PM - Wednesday, August 06, 2014 3:00 PM

CCC - Room 14

  • Juan C Idrobo ;
  • Myron D Kapetanakis ;
  • Wu Zhou ;
  • Micah P Prange ;
  • Leonardo Basile ;
  • Sokrates T. Pantelides ;
  • Stephen J. Pennycook ;
  • Liu Lei ;
  • Gong Gu ;
  • Juan-Carlos Idrobo, Oak Ridge National Laboratory ;
  • Niklas Dellby ;
  • Toshihiro Aoki ;
  • Juan Salafranca ;
  • John Mardinly ;
  • Ray Carpenter ;
  • Ondrej L Krivanek ;
  • Jong Seok Jeong ;
  • Michael L Odlyzko ;
  • Peng Xu ;
  • Bharat Jalan ;
  • K. Andre Mkhoyan ;
  • Fan Yang ;
  • Frank Scheltens ;
  • David McComb ;
  • David B. Williams ;
  • Marc DeGraef

Atomic Imaging and Spectroscopy of Two-dimensional Materials

Imaging and Spectroscopy of Graphene/Hexagonal Boron Nitride Lateral Heterostructure Interfaces

Monochromatic STEM-EELS for Correlating the Atomic Structure and Optical Properties of Two-Dimensional Materials

Interfaces and Defects in Hybrid Molecular Beam Epitaxy Grown NdTiO3/SrTiO3 Heterostructures

Absorption Corrections for a Four-Quadrant SuperX EDS Detector

Poster Session 3

Wednesday, August 06, 2014 3:30 PM - Wednesday, August 06, 2014 5:00 PM

CCC - Exhibit Hall AB

  • Xiahan Sang ;
  • Everett D Grimley ;
  • Changning Niu ;
  • Douglas L Irving ;
  • James M LeBeau ;
  • Tobias Volkenandt ;
  • Erich Müller ;
  • Dagmar Gerthsen ;
  • Andreas Graff ;
  • Frank Altmann ;
  • Andrzej Dzwilewski ;
  • Bert Freitag ;
  • K. Andre Mkhoyan ;
  • Michael L Odlyzko ;
  • Pinghong Xu ;
  • Claudia M. Macias ;
  • Joey Kistler ;
  • Nutchapon Chotigkrai ;
  • Bruce C. Gates ;
  • Nigel D. Browning, Pacific Nortwest National Laboratory ;
  • Aram Rezikyan ;
  • Lijun Wu ;
  • Xiaoya Shi ;
  • Qiang Li ;
  • Yimei Zhu, Brookhaven National Laboratory ;
  • Mi-Hyang Sheen ;
  • mingzhe Li ;
  • Jong-Hwan Lee ;
  • Young-Woon Kim ;
  • Ahmet Gulec ;
  • Robert F. Klie, University of Illinois at Chicago ;
  • Ganesh Subramanian ;
  • Nan Jiang ;
  • John Spence ;
  • Lindsay Hussey ;
  • Isaac Bryan ;
  • Ronny Kirste ;
  • Wei Guo ;
  • Zachary Bryan ;
  • Seiji Mita ;
  • Ramón Collazo ;
  • Zlatko Sitar ;
  • Vishwanath Suresh ;
  • Sergei Rouvimov ;
  • Tatyana Orlova ;
  • Xinyu Liu ;
  • Jacek K Furdyna ;
  • Debdeep Jena ;
  • Huili G Xing ;
  • Andrew A Herzing ;
  • Xiuli Zhou ;
  • Anton Horl ;
  • Andreas Trugler ;
  • Ulrich Hohenester ;
  • Theodore B Norris ;
  • Yi Wang ;
  • Wilfried Sigle ;
  • Federico Baiutti ;
  • Giuliano Gregori ;
  • Gennady Logvenov ;
  • Joachim Maier ;
  • Peter A. van Aken ;
  • Jing Lu ;
  • Xiao-meng Shen ;
  • Yong-hang Zhang ;
  • David Smith ;
  • Edward R White ;
  • Alex Kerelsky ;
  • Grant Jasmin ;
  • William A Hubbard ;
  • Matthew Mecklenburg ;
  • B. C Regan ;
  • Dalaver H Anjum ;
  • Pradip Sarawade ;
  • Jian Chen ;
  • Qiang Wei ;
  • Jinwen Chen

Putting a New Spin on Scanning Transmission Electron Microscopy

Sample Thickness Determination by Scanning Transmission Electron Microscopy at Low Electron Energies

Analytical ETL/EML Layer Investigation of Blue OLEDs

Channeling of Aberration-corrected STEM Probes at the "Sub-atomic" Scale

Quantitative Z-contrast Imaging in Scanning Transmission Electron Microscopy of Zeolite-supported Metal Clusters and Single-metal-atom Complexes With Single-Atom Sensitivity

Simulation of Decoherence in Fluctuation Electron Microscopy

Accurate Measurement of Thermal Displacement in Filled Skutterudite by Scanning Transmission Electron Microscopy

Including Thermal Vibrations and Bonding in HAADF-STEM Image Simulation

Investigation on Polarization Induced Electro-Optical Property of GaN LED using TEM-EBIC Combined with Cathodoluminescence

In-situ Atomic-Resolution Study of La1-xSrxCoO3 Using Z-contrast Imaging and EELS

Near Edge Fine Structure Analysis of Copper in Cu-Bi2Se3 Topological Insulators

Direct Observation of the Polarity Control Mechanism in Aluminum NItride Grown on Sapphire by Aberration Corrected Scanning Transmission Electron Microscopy.

Atomic Structure of Thin MoSe2 Films Grown by Molecular Beam Epitaxy

Reconciling Theory and Experiment in High-resolution Electron Energy-loss Spectroscopy of Plasmon Modes in Individual Nanostructures

Direct Observation of Asymmetric Sr Diffusion in Sr-δ-Doped La2CuO4

Quantitative Study of Compositional Uniformity and Interfacial Strain in InAs/InAs1-xSbx Type-II Superlattices

STEM EBIC to Study 2D Materials

TEM Investigations of Pt-NPs Loaded Fibrous Nano-Catalyst Support KCC-1

The In Situ TEM Study of Microstructure Alteration of MoS2 under Carburization

A03 - TEM Phase Contrast Imaging in Biological and Materials Science

  • Michael Marko, Wadsworth Center

Platform Session 7

Wednesday, August 06, 2014 1:30 PM - Wednesday, August 06, 2014 3:00 PM

CCC - Room 23

  • Wah Chiu ;
  • Wei Dai ;
  • Caroline Fu ;
  • Desislava Raytcheva ;
  • John F Flanagan ;
  • Htet A Khant ;
  • Xiangan Liu ;
  • Ryan H Rochat ;
  • Cameron Haase-Pettingell ;
  • Jacqueline Piret ;
  • Steve J Ludtke ;
  • Kuniaki Nagayama ;
  • Michael F Schmid ;
  • Jonathan A King ;
  • Elizabeth R. Wright, Emory University ;
  • Ricardo C Guerrero-Ferreira ;
  • Gabriella Kiss ;
  • Joshua D Strauss ;
  • Cheri M Hampton ;
  • Radostin Danev, MPI Biochmeistry ;
  • Bart Buijsse ;
  • Yoshiyuki Fukuda ;
  • Juergen Plitzko ;
  • Wolfgang Baumeister ;
  • Shoh Asano ;
  • Miroslava Schaffer ;
  • Florian Beck ;
  • Vladan Lučić

Visualizing Virus Assembly Intermediates Inside Marine Cyanobacteria by Zernike Phase Contrast Electron Cryo-Tomography

Zernike Phase Contrast Cryo-Electron Tomography of Bacteria and Viruses

Automated Cryo-tomography and Single Particle Analysis with a New Type of Phase Plate

Phase Contrast Cryo-Electron Tomography of Primary Cultured Neuronal Cells

A05 - 15 Years of Focused Ion Beams at M&M

  • Lucille A. Giannuzzi, L.A. Giannuzzi and Associates ;
  • Keana C.K. Scott ;
  • Nicholas Antoniou, Harvard University

Platform Session 7

Wednesday, August 06, 2014 1:30 PM - Wednesday, August 06, 2014 3:00 PM

CCC - Room 17

  • Fred Stevie ;
  • Lucille A. Giannuzzi, L.A. Giannuzzi and Associates ;
  • Srinivas Subramaniam ;
  • Kevin Johnson ;
  • Anne Delobbe ;
  • Olivier Salord ;
  • Tomáš Hrnčíř ;
  • Amandine David ;
  • Pierre Sudraud ;
  • Filip Lopour ;
  • Uk Huh ;
  • Woon Cho ;
  • Ranjan Ramachandra ;
  • David Joy

FIB Applications: A Historical Perspective

Optimization of High Current Xenon Plasma Ion Beams for Applications in Semiconductor Failure Analysis and Development

High Speed TEM Sample Preparation by Xe FIB

He+ Ions for 3D Imaging

Monte Carlo Modeling of Ion Beam Induced Secondary Electrons

A06 - Super Resolution Microscopic Methods

  • Angus I. Kirkland, University of Oxford ;
  • John M. Rodenburg, University of Sheffield

Platform Session 5

Wednesday, August 06, 2014 8:30 AM - Wednesday, August 06, 2014 10:00 AM

CCC - Room 11

  • Jianwei Miao ;
  • Roarke Horstmeyer ;
  • Guoan Zheng ;
  • Xiaoze Ou ;
  • Changhuei Yang ;
  • Andrew Maiden ;
  • Adrian D'Alfonso ;
  • Andrew J Morgan ;
  • Ada W Yan ;
  • Peng Wang ;
  • Hidetaka Sawada ;
  • Angus I. Kirkland, University of Oxford ;
  • Leslie J Allen

Coherent Diffraction Imaging

Modeling Extensions of Fourier Ptychographic Microscopy

Super-resolved Ptychographic Imaging

Generalised Holography Meets Coherent Diffractive Imaging

Platform Session 6

Wednesday, August 06, 2014 10:30 AM - Wednesday, August 06, 2014 12:00 PM

CCC - Room 11

  • Peng Wang ;
  • Angus I. Kirkland, University of Oxford ;
  • Peter D. Nellist, University of Oxford ;
  • Adrian D'Alfonso ;
  • Andrew J Morgan ;
  • Leslie J Allen ;
  • Ayako Hashimoto ;
  • Masaki Takeguchi ;
  • Kazutaka Mitsuishi ;
  • Masayuki Shimojo ;
  • Max Haider, CEOS Gmbh ;
  • Stephan Uhlemann ;
  • Peter Hartel ;
  • Heiko Müller ;
  • T Sasaki ;
  • Hidetaka Sawada ;
  • Fumio Hosokawa ;
  • Kazutomo Suenaga ;
  • Timothy J. Pennycook ;
  • Andrew R. Lupini ;
  • Lewys Jones

Atomically Resolved Scanning Confocal Electron Microscopy Using a Double Aberration-corrected Transmission Electron Microscope

Towards High Resolution in TEM and STEM: What are the Limitations and Achievements

Resolution Enhancement at Low-Accelerating-Voltage by Improvements of Diffraction Limit and Chromatic Aberration

Maximum Efficiency STEM Phase Contrast Imaging

Poster Session 3

Wednesday, August 06, 2014 3:30 PM - Wednesday, August 06, 2014 5:00 PM

CCC - Exhibit Hall AB

  • Vincenzo Grillo ;
  • Ebrahim Karimi ;
  • Roberto Balboni ;
  • Gian Carlo Gazzadi ;
  • Stefano Frabboni ;
  • Erfan Mafakheri ;
  • Robert W Boyd ;
  • Eric Lifshin ;
  • Siwei Lyu ;
  • Yudhishthir R Kandel ;
  • Richard L Moore ;
  • Zdenek Svindrych ;
  • Pavel Krizek ;
  • Evgeny Smirnov ;
  • Martin Ovesny ;
  • Josef Borkovec ;
  • Guy M Hagen ;
  • Prashant Kumar ;
  • Michael Tsapatsis ;
  • Andre K Mkhoyan ;
  • Lothar Strueder ;
  • Jakob Soltau ;
  • Julia Schmidt ;
  • Robert Hartmann ;
  • Martin Huth ;
  • Heike Soltau ;
  • Peter Holl ;
  • Martin Simson ;
  • Gerhard Lutz ;
  • Henning Ryll

Experiments and Potentialities for the Use of Bessel Beam in Superresolution STEM

The Use of Regularized Least Squares Minimization for the Deconvolution of SEM Images

Live Cell Imaging With Spatial Light Modulator-based Optical Sectioning Structured Illumination Microscopy

Crystallographic Structure Determination of MFI-Zeolite Nanosheets

High speed, high throughput two dimensional direct electron detector based on the concept of pnCCDs

A07 - Microscopy and Spectroscopy for Power Generation and Energy Storage

  • Yimei Zhu, Brookhaven National Laboratory ;
  • Eva Olsson, Chalmers University ;
  • Miaofang Chi, Oak Ridge National Laboratory ;
  • Feng Wang, Brookhaven National Laboratory

Platform Session 5

Wednesday, August 06, 2014 8:30 AM - Wednesday, August 06, 2014 10:00 AM

CCC - Room 15

  • Yimei Zhu, Brookhaven National Laboratory ;
  • Marta D Rossell ;
  • Andreas Borgschulte ;
  • Rolf Erni, EMPA ;
  • Fengyuan Shi ;
  • Shih-Han Lo ;
  • Gangjian Tan ;
  • Li-Dong Zhao ;
  • Mercouri G Kanatzidis ;
  • Vinayak Dravid ;
  • J H Dycus ;
  • A Oni ;
  • X Sang ;
  • T Chan ;
  • C Koch ;
  • J M LeBeau ;
  • Katherine A. Spoth ;
  • Yao Sun ;
  • Ulrich Wiesner ;
  • Lena F. Kourkoutis

Revealing the Origin of "Phonon Glass–Electron Crystal" Behavior in Thermoelectric Layered Cobaltate by Accurate Displacement Measurement

Surface Reduction in Monoclinic BiVO4 for Photocatalytic Applications

Nanostructure-Assisted Phonon Scattering in Lead-Free Thermoelectric Materials: A TEM Investigation of the SnTe System

Observing the Interplay Between Composition and Phonon Transport in Bi2Te3-xSex Alloys using ADF STEM

Capturing the Structure of Mesoporous Silica Nanoparticles in Solution with Cryo-TEM

Platform Session 6

Wednesday, August 06, 2014 10:30 AM - Wednesday, August 06, 2014 12:00 PM

CCC - Room 15

  • Huolin L Xin ;
  • Feng Lin ;
  • Barnaby Levin ;
  • Michael J Zachman ;
  • Jörg G Werner ;
  • Ulrich Wiesner ;
  • Lena F. Kourkoutis ;
  • David A Muller ;
  • Charles D Amos ;
  • Jie Song ;
  • John B Goodenough ;
  • Paulo J Ferreira ;
  • Peng Gao ;
  • xiaoya wang ;
  • Liping Wang ;
  • Feng Wang, Brookhaven National Laboratory ;
  • Miaofang Chi, Oak Ridge National Laboratory ;
  • Bo Xu ;
  • Christopher Fell ;
  • Shirley Meng ;
  • jihui Yang ;
  • Sung Joo Kim ;
  • Alireza Kargar ;
  • Deli Wang ;
  • Xiaoqing Pan

A 3-D Phase Evolution Panorama Uncovered Using a Grid-in-a-Coin Cell Method for Conversion Reaction Electrodes in Lithium-ion Batteries

Characterizing Sulfur in TEM and STEM, with Applications to Lithium Sulfur Batteries.

Understanding the Surface Structure of LiNi0.45Mn1.55O4 Spinel Cathodes with Aberration-Corrected HAADF STEM

Tracking Displacement Reactions in CuxV2O5 Cathodes by In-Situ TEM

Probing Electrochemical Cycling Stability of Li-ion Cathode Materials at Atomic-scale

In-situ TEM Observation of Electrochemical Cycling of a Si/TiO2 Composite NW

A08 - Nano-Characterization of Emerging Photovoltaic Materials and Devices

  • Robert F. Klie, University of Illinois at Chicago ;
  • Moon Kim, University of Texas at Dallas

Platform Session 1

Wednesday, August 06, 2014 1:30 PM - Wednesday, August 06, 2014 3:00 PM

CCC - Room 15

  • Yanfa Yan ;
  • Chen Li ;
  • Yelong Wu ;
  • Wanjian Yin ;
  • Zhiwei Wang ;
  • Naba R Paudel ;
  • Jonathan Poplawsky ;
  • Timothy J. Pennycook ;
  • Wyatt K Metzger ;
  • Ingrid Repins ;
  • Mowafak Al-Jassim ;
  • Stephen J. Pennycook ;
  • Ce Sun ;
  • Ning Lu ;
  • Guoda Lian ;
  • Jinguo Wang ;
  • Xin Peng ;
  • Robert F. Klie, University of Illinois at Chicago ;
  • Moon J Kim ;
  • Sarah J. Haigh ;
  • Andrew R. Lupini ;
  • Mark P. Oxley ;
  • Liying Jiang ;
  • Toshihiro Aoki ;
  • John Kouvetakis ;
  • José Menéndez

Defect Physics in Photovoltaic Materials Revealed by Combined High-Resolution Microscopy and Density-Functional Theory Calculation

Creating Single Boundary Between Two CdTe (111) Wafers with Controlled Orientation by Wafer Bonding

Understanding Individual Defects in CdTe Solar Cells: From Atomic Structure to Electrical Activity

High Resolution EELS Study of Ge1-ySny and Ge1-x-ySixSny Alloys

A09 - Frontiers in Analytical TEM-STEM

  • Gianluigi Botton, McMaster University ;
  • Juan-Carlos Idrobo, Oak Ridge National Laboratory ;
  • Ai Leen Koh, Standford University ;
  • Paolo Longo, Gatan Inc.

Platform Session 1

Wednesday, August 06, 2014 8:30 AM - Wednesday, August 06, 2014 10:00 AM

CCC - Room 22

  • Maria Varela ;
  • Juan Salafranca ;
  • Neven Biskup ;
  • Jaume Gazquez ;
  • Mark P. Oxley ;
  • Virat Mehta ;
  • Yuri Suzuki ;
  • Shameek Bose ;
  • Manish Sharma ;
  • Chris Leighton ;
  • Weidong Luo ;
  • Sokrates T. Pantelides ;
  • Stephen J. Pennycook ;
  • Tracy C Lovejoy ;
  • Niklas Dellby ;
  • Toshi Aoki ;
  • George J Corbin ;
  • Petr Hrncirik ;
  • Zoltan S Szilagyi ;
  • Ondrej L Krivanek ;
  • Giuseppe Nicotra ;
  • Paolo Longo, Gatan Inc. ;
  • Mario Scuderi ;
  • Ioannis Deretzis ;
  • Filippo Giannazzo ;
  • Antonino La Magna ;
  • Ray D Twesten ;
  • Corrado R Spinella ;
  • Quentin M Ramasse ;
  • Feridoon Azough ;
  • Roland Mainz ;
  • Demie M Kepaptsoglou ;
  • A Webber ;
  • Daniel Abou-Ras ;
  • Ekin Simsek ;
  • Peter van Aken

Oxygen Vacancy Ordering: a Degree of Freedom that can Control the Structural, Electronic and Magnetic Properties of Transition-Metal Oxide Films.

Energy-Filtered High-Angle Dark Field Mapping of Ultra-Light Elements

Observation of Layer by Layer Graphitization of 4H-SiC, Through Atomic-EELS at Low Energy

Atomic-Scale STEM-EELS Characterization of the Chemistry of Structural Defects and Interfaces in Energy-Related Materials

Platform Session 2

Wednesday, August 06, 2014 10:30 AM - Wednesday, August 06, 2014 12:00 PM

CCC - Room 22

  • Nestor J Zaluzec ;
  • Jan Ringnalda ;
  • Arda Genc ;
  • Libor Kovarik ;
  • Chad M Parish ;
  • Michael K Miller ;
  • Gerald Kothleitner ;
  • Melissa J Neish ;
  • Nathan R Lugg ;
  • Scott D. Findlay ;
  • Werner Grogger ;
  • Ferdinand Hofer ;
  • Leslie J Allen

XEDS in the AEM: Has Everything Thing That Can be Invented, Been Invented?

The Effect of Probe Correctors on the Analytical Results of Non-ideal Samples

Aberration-Corrected Four-Detector STEM-EDS Analysis of Embedded Nanoclusters

Quantitative EDX and EELS Elemental Mapping at Atomic Resolution

A09 - Nano-Characterization of Emerging Photovoltaic Materials and Devices

  • Gianluigi Botton, McMaster University ;
  • Juan-Carlos Idrobo, Oak Ridge National Laboratory ;
  • Ai Leen Koh, Standford University ;
  • Paolo Longo, Gatan Inc.

Platform Session 3

Wednesday, August 06, 2014 1:30 PM - Wednesday, August 06, 2014 3:00 PM

CCC - Room 22

  • Mathieu Kociak ;
  • Judy J Cha ;
  • Kristie Koski ;
  • Kevin Huang ;
  • Ken Wang ;
  • Weidong Luo ;
  • Desheng Kong ;
  • Zongfu Yu ;
  • Shanhui Fan ;
  • Mark L Brongersma ;
  • Yi Cui ;
  • Maureen J Lagos ;
  • Alejandro Reyes-Coronado ;
  • Pedro M Echenique ;
  • Javier Aizpurua ;
  • Philip E Batson ;
  • Robert E. A. Williams ;
  • Santino D Carnivale ;
  • Thomas F Kent ;
  • David J Stowe ;
  • Roberto C Myers ;
  • David W. McComb ;
  • Nahid Talebi ;
  • Burcu Ögüt ;
  • Wilfried Sigle ;
  • Ralf Vogelgesang ;
  • Peter A. van Aken

From Quantum Confinement to Quantum Electrodynamics using nanoCathodoluminescence in a STEM

Tunable Plasmon and Optical Properties of Chalcogenide Nanoplates Using Monochromated Electron Energy Loss Spectroscopy

Attosecond Forces Imposed by Swift Electrons on Nanometer-Sized Metal Particles

Electron Energy Loss Spectroscopy and Localized Cathodoluminescence Characterization of GaN Quantum Discs

Plasmons of Hexamer and Pentamer Nanocavities Probed with Swift Electrons

A09 - Frontiers in Analytical TEM-STEM

Poster Session 1

Wednesday, August 06, 2014 3:30 PM - Wednesday, August 06, 2014 5:00 PM

CCC - Exhibit Hall AB

  • Takahito Hashimoto ;
  • Keiji Tamura ;
  • Hiromi Inada ;
  • Keitaro Watanabe ;
  • Yoshihiro Ohtsu ;
  • Yuya Suzuki ;
  • Takahiro Sato ;
  • Takashi Kanemura ;
  • Simon Burgess ;
  • James Holland ;
  • Iain Anderson ;
  • Susumu Yamaguchi ;
  • Kuniyasu Nakamura ;
  • Masaki Mukai ;
  • Eiji Okunishi ;
  • Masanori Ashino ;
  • Kazuya Omoto ;
  • Tomohisa Fukuda ;
  • Akihiro Ikeda ;
  • kazunori Somehara ;
  • Toshikatsu Kaneyama ;
  • Tomohiro Saitoh ;
  • Tsukasa Hirayama ;
  • Yuichi Ikuhara ;
  • Hendrik O Colijn ;
  • Fan Yang ;
  • David B. Williams ;
  • Alan Sandborg ;
  • David W. McComb ;
  • James Bentley ;
  • James E Wittig ;
  • James R McBride ;
  • Alan O Sandborg ;
  • Patrick Camus ;
  • Brent Hammell ;
  • Jie Shen ;
  • Judy J Cha ;
  • Yuncheng Song ;
  • Minjoo Larry Lee ;
  • Cecile Bonifacio ;
  • Sophie Carenco ;
  • Miquel Salmeron ;
  • Judith C Yang ;
  • Joshua D Sugar ;
  • Alexander A Kane ;
  • Alexandra C Ford ;
  • Michael J Rye ;
  • Lisa M Lowery ;
  • Francois Leonard ;
  • Mohammad Attarian Shandiz ;
  • Francesc Salvat ;
  • Raynald Gauvin ;
  • Qingxiao Wang ;
  • Yihan Zhu ;
  • Jianfeng Huang ;
  • Yu Han ;
  • Franz Philipp Schmidt ;
  • Harald Ditlbacher ;
  • Ulrich Hohenester ;
  • Andreas Hohenau ;
  • Ferdinand Hofer ;
  • Joachim R Krenn ;
  • Jihua Chen ;
  • Marek Malac ;
  • Koji Kimoto ;
  • Ray Egerton ;
  • Prashant Shekhar ;
  • Zubin Jacob ;
  • Yoshifumi Taniguchi ;
  • Vaibhav Gaind ;
  • Hefei Hu ;
  • Milinda Abeykoon ;
  • Lijun Wu ;
  • Yimei Zhu, Brookhaven National Laboratory ;
  • Simon Billinge ;
  • Juchul Park ;
  • Hyo Seon Kim

Development of Two Steradian EDX System for the HD-2700 FE-STEM Equipped with Dual X-MaxN 100 TLE Large Area Windowless SDDs

Monochromator for Aberration-Corrected STEM

Performance of an Improved TEM SDD Detector

Beam Damage During Energy-Dispersive X-ray Spectroscopy of FePt Nanoparticles

A Comparison of Cross Section Formulas and their Effect on Calculated k-factors

Spatially Resolved In and As Distributions in InGaAs/GaP and InGaAs/GaAs Quantum Dot Systems

Thermal Stability Study of Ni-Co Core-Shell Nanoparticles by In Situ TEM

Comparison of Analysis Routines for EDS and EELS Spectrum Images of Electrical Contacts to Single-Walled Carbon Nanotubes.

Monte Carlo Simulation of Electron Energy Loss Spectra of Group III-Nitride Nanoscale Semiconductors

STEM Tomography and Surface Plasmon Imaging of a Au-Pd Bi-metallic Nanorod with Exotic Morphology

Universal Scaling of Surface Plasmon Modes

TEM of Nanostructured Organic and Hybrid Materials for Photovoltaic and Battery Applications

Angle-Resolved Valence EELS of a Single Crystal Gold Sample

Quantitative Structural Analysis of Nanoparticles Using Electron Pair Distribution Function (ePDF)

Characterization of Metal-doped Mn3O4 Particles by Scanning Transmission Electron Microscopy and Electron Energy Loss Spectroscopy

A10 - X-ray Imaging

  • Jeffrey M. Davis, National Institute of Standards and Technology ;
  • Ric Wuhrer, University of Western Sydney ;
  • Eric Telfeyan

Platform Session 1

Wednesday, August 06, 2014 10:30 AM - Wednesday, August 06, 2014 12:00 PM

CCC - Room 12

  • Richard Wuhrer ;
  • Lydia Guja ;
  • David Merritt ;
  • Ken Moran ;
  • Ryan Zeigler ;
  • Paul Carpenter, Washington University in St. Louis ;
  • Bradley L Jolliff ;
  • Yuhei Nakajima ;
  • Minoru Suzuki ;
  • Naoki Kikuchi ;
  • Shunsuke Asahina ;
  • Kazuteru Kawauchi ;
  • Takeshi Nokuo ;
  • Natasha Erdman ;
  • Masateru Shibata ;
  • Anthony Hyde ;
  • Conor McCarthy ;
  • Simon Burgess ;
  • Nigel Meeks ;
  • Michael Haschke ;
  • Ulrich Waldschläger ;
  • Roald Tagle ;
  • Uwe Rossek

X-Ray Mapping Investigations of Salt Migration in Seeds through use of Window and Windowless Silicon Drift Detectors

Identification of New Lithic Clasts in Lunar Breccia 14305 by Micro-CT and Micro-XRF Analysis

Ultra High Solid Angle EDS System Advanced STEM Analysis for FE-SEM

Large Area EDS Mapping: Automated Collection of High Resolution Elemental Maps For Post Acquisition Analysis

Multidimensional Data Sets – Presentation, Evaluation and Extraction

Platform Session 2

Wednesday, August 06, 2014 1:30 PM - Wednesday, August 06, 2014 3:00 PM

CCC - Room 12

  • Timothy D Murphy ;
  • Adam J Roper ;
  • Simon Hager ;
  • Richard Wuhrer ;
  • Peter Leverett ;
  • Peter A Williams ;
  • David Edwards ;
  • Neil Rowlands ;
  • Donna Guarrera ;
  • Richard McLaughlin ;
  • Natasha Erdman ;
  • Vern Robertson ;
  • Chaoyi Teng ;
  • Raynald Gauvin ;
  • Nicolas Brodusch ;
  • Hendrix Demers ;
  • Patrick Woo ;
  • Heike Soltau ;
  • Robert Hartmann ;
  • Peter Holl ;
  • Sebastian Ihle ;
  • Henning Ryll ;
  • Martin Huth ;
  • Julia Schmidt ;
  • Rouven Eckhardt ;
  • Martin Simson ;
  • Jakob Soltau ;
  • Christian Thamm ;
  • Lothar Strueder

Mineral Analyses & Implications on the Dispersion of Bismuth in the Supergene Environment of Eastern Australia.

Investigation of Multiple, Large Area EDS Detectors on an SEM Capable of Various Mounting Geometries for Optimal EDS Analysis

Characterization of Rare Earth Element Ores with High Spatial Resolution Scanning Electron Microscopy

X-Ray Microanalysis with High Spatial Resolution and High Counts Rate with a State of the Art Field Emission Scanning Electron Microscope

High-Speed, High-Resolution pnCCDs as Two-Dimensional Imaging Spectrometers for X-rays and Electrons

A11 - Frontiers of Electron-Probe Microanalysis

  • John Armstrong, Carnegie Institution for Science ;
  • Paul Carpenter, Washington University in St. Louis ;
  • Hideyuki Takahashi, JEOL Inc ;
  • Mike Jercinovic, University of Massachusetts Amherst

Platform Session 1

Wednesday, August 06, 2014 8:30 AM - Wednesday, August 06, 2014 10:00 AM

CCC - Room 24

  • Silvia Richter ;
  • Philippe T Pinard ;
  • Hideyuki Takahashi, JEOL Inc ;
  • Nobuo Handa ;
  • Takanori Murano ;
  • Masato Koike ;
  • Takashi Imazono ;
  • Masaru Koeda ;
  • Tetsuya Nagano ;
  • Hiroyuki Sasai ;
  • Yuki Oue ;
  • Zeno Yonezawa ;
  • Satoshi Kuramoto ;
  • Masami Terauchi ;
  • Shunsuke Asahina ;
  • Yusuke Sakuda ;
  • Naoki Kikuchi ;
  • Kazuteru Kawauchi ;
  • Takeshi Nokuo ;
  • Ferdi Schüth ;
  • Osamu Terasaki

Analytical Challenges and Strategies in FE-EPMA

Present State of TEM-SXES Analysis and its Application to SEM aiming Chemical Analysis of Bulk Materials

Exciting Possibilities of Soft X-ray Emission Spectroscopy as Chemical State Analysis in EPMA and FESEM

Recent Achievement of Electron Beam Deceleration Method for FE-SEM Enhanced Elemental Analysis including Soft X-ray Emission Spectroscopy

Platform Session 2

Wednesday, August 06, 2014 10:30 AM - Wednesday, August 06, 2014 12:00 PM

CCC - Room 24

  • Peter McSwiggen ;
  • John T Armstrong ;
  • Charles Nielsen ;
  • Peter J Statham ;
  • Heather A Lowers ;
  • Doug B Stoeser ;
  • Nicholas Ritchie ;
  • Dale E Newbury

Strategies for Low Accelerating Voltage X-ray Microanalysis of Sub-Micrometer Features with the FE-EPMA

Progress towards Accurate Quantitative Standardless X-ray Analysis at Low kV

Comparative Performance of SDD-EDS and WDS Detectors for Quantitative Analysis of Mineral Specimens: The Next Generation Electron Microprobe

Comparison of SEM-EDS and EPMA-WDS Analysis of Rare Earth Element Containing Minerals from Bokan Mountain, Alaska

Standardless Analysis – Better but Still Risky

Platform Session 3

Wednesday, August 06, 2014 1:30 PM - Wednesday, August 06, 2014 3:00 PM

CCC - Room 24

  • Phillip Gopon ;
  • John Fournelle ;
  • Peter Sobol ;
  • Mike Spicuzza ;
  • Philippe T Pinard ;
  • Silvia Richter ;
  • Xavier Llovet ;
  • John Valley ;
  • Erkki Heikinheimo ;
  • Dale E Newbury ;
  • Nicholas W.M. Ritchie ;
  • Ben Buse ;
  • Stuart Kearns ;
  • Richard B Mott ;
  • Owen E Healy ;
  • Abigail P Lindstrom

Soft X-Ray EPMA Analyses of Extremely Reduced phases from Apollo 16 regolith: problems and solutions for sub-micron analysis

Towards Reliable Quantification of Steel Alloys at Low Voltage

Quantitative X-ray Microanalysis of Low Atomic Number Elements by SEM/SDD-EDS with NIST DTSA II: Carbides and Nitrides and Oxides, Oh My!

Importance of Carbon Contamination in High-Resolution (FEG) EPMA of Silicate Minerals

Quantitative Analysis using Asymmetric Adaptive Pulse Processing

Poster Session 1

Wednesday, August 06, 2014 3:30 PM - Wednesday, August 06, 2014 5:00 PM

CCC - Exhibit Hall AB

  • Claude Merlet ;
  • Andrew N Davis ;
  • Chrystel Hombourger ;
  • Michel Outrequin ;
  • Stuart Kearns ;
  • Ben Buse ;
  • Jon Wade ;
  • Norihisa Mori ;
  • Naoki Kato ;
  • Shigeru Honda ;
  • Syuichi Sakamoto ;
  • Masaru Takakura ;
  • Peter McSwiggen ;
  • Charles Nielsen ;
  • Stephen M Seddio ;
  • Nicholas Ritchie ;
  • Abigail P Lindstrom ;
  • Nicholas W.M. Ritchie ;
  • Julie Chouinard ;
  • John Donovan ;
  • Ellen Aster ;
  • Paul Wallace ;
  • Denton S Ebel ;
  • Ellen J Crapster-Pregont ;
  • Friedrich M Jon ;
  • Guillermina Gonzalez ;
  • Omar Amador ;
  • B L Valle ;
  • G L Santos ;
  • A E Hernandez ;
  • Yu Sun ;
  • Kaustubh Kulkarni ;
  • Mark Aindow ;
  • Anil K Sachdev ;
  • Enrique J Lavernia ;
  • Don Lesher

Analytical Multilayer Model Revisited for High Atomic Numbers at Low Voltage

Quantitative Microanalysis at Low Voltage with a WDS Electron Microprobe Equipped with a FE Column

Mitigating Thermal Beam Damage with Metallic Coats in Low Voltage FEG-EPMA of Geological Materials

Development of an Automated Phase Analysis Procedure for Multi-Component Samples in EPMA

Overcoming Quantitative Challenges Presented By X-Ray Line Interferences in EDS and WDS

Optimizing the Dose for Energy Dispersive Electron Probe X-ray Microanalysis Measurements

Detecting Difficult Minor Elements in Particle Samples by SEM-EDS

Quantitative Mapping of and Secondary Fluorescence Effects in Olivine Hosted Melt Inclusions

Image Analysis of 2D X-ray Intensity Maps: Element Abundances, Mineralogy, and Modal Analysis of Meteorites

Morphology and Elemental Composition of Atmospheric Particles from Mexico Valley by Scanning Electron Microscopy

EPMA Studies on Reactions Between Ti and Al During Spark Plasma Sintering

Improving Analytical Efficiency of WD Spectrometers using Solid-State Detectors

A12 - 3D Imaging and Microanalysis: Image Analysis and Applications

  • Paul G. Kotula, Sandia National Laboratories ;
  • Keana C.K. Scott

Platform Session 2

Wednesday, August 06, 2014 8:30 AM - Wednesday, August 06, 2014 10:00 AM

CCC - Room 17

  • Basma Khoury ;
  • Erin Bigelow ;
  • Lauren Smith ;
  • Robert Goulet ;
  • Erica Scheller ;
  • Nelly Andarawis-Puri ;
  • Karl Jepsen ;
  • Nikolaus L. Cordes ;
  • Srivatsan Seshadri ;
  • George J. Havrilla ;
  • Brian M. Patterson ;
  • Michael Feser ;
  • Xiaoli Yuan ;
  • Ying Gu ;
  • Deming Wang ;
  • Kevin C Henderson ;
  • Paul Gibbs ;
  • Seth D Imhoff ;
  • Amy J. Clarke ;
  • Misa Hayashida ;
  • Michael Bergen ;
  • Peng Li ;
  • Marek Malac ;
  • Jovana Zecevic ;
  • Cedric Gommes ;
  • Heiner Friedrich ;
  • Petra E. de Jongh ;
  • Krijn P. de Jong

The Use of NanoComputed Tomography to Enhance Musculoskeletal Research

Subsurface Particle Analysis using X-Ray Computed Tomography and Confocal X-Ray Fluorescence

Multi-scale Imaging of Al-7at.per. Cu Eutectics using Micro- and Nano-scale X-ray Computed Tomography

Nano-Dot Markers for Electron Tomography Formed by Electron Beam-Induced Deposition: Nanoparticle Agglomerates Application

3D Nanoscale Analysis of Zeolite Catalysts by Electron Tomography and Image Processing

Platform Session 3

Wednesday, August 06, 2014 10:30 AM - Wednesday, August 06, 2014 12:00 PM

CCC - Room 17

  • Tim Dahmen ;
  • Niels de Jonge ;
  • Guillaume Lucas ;
  • Cécile Hébert ;
  • Frédéric Voisard ;
  • Nicolas Brodusch ;
  • Hendrix Demers ;
  • Raynald Gauvin ;
  • Bernard Heymann ;
  • Toby Sanders ;
  • John D Roehling ;
  • Joost Batenburg ;
  • Bruce C. Gates ;
  • Peter Binev ;
  • Ilke Arslan ;
  • Yi Jiang ;
  • Robert Hovden ;
  • David A Muller ;
  • Veit Elser

TFS: Combined Tilt- and Focal Series Scanning Transmission Electron Microscopy.

Optimization of the Data Acquisition and Processing Using a Prior Knowledge of the Camera Characteristics: An EFTEM Case Study.

Monte Carlo Simulation and Experimental High-Angle Annular Dark Field Tomography

The Phantom in the Noise and Validation of 3D EM Reconstructions

Advanced 3-D Reconstruction Algorithms for Electron Tomography

Compressed Sensing, Sparsity, and the Reliability of Tomographic Reconstructions

A13 - Practical Applications and Analytical Trends of Metallography and Microstructure

  • Frauke Hogue, Hogue Metallography ;
  • Frank Mücklich, Saarland University;

Platform Session 1

Wednesday, August 06, 2014 8:30 AM - Wednesday, August 06, 2014 10:00 AM

HM - Ballroom B

  • Dominik Britz ;
  • Andreas Hegetschweiler ;
  • Frank Mücklich, Saarland University; ;
  • Jose L Garcia ;
  • George F Vander Voort

Opening the Door to Fundamental Understanding of Structure and Color Metallography – a Correlative Microscopy Study on Steel

Design of Novel Graded Microstructures for Cutting Tools Assisted by High Resolution Microscopy and Thermodynamic Modeling

Correlative Tomography – Extraction of Reliable Information with Adequate Resolution from mm scale down to sub-nm scale

Measurement of Decarburization of Heat Treated Steel Surfaces

Platform Session 2

Wednesday, August 06, 2014 1:30 PM - Wednesday, August 06, 2014 3:00 PM

HM - Ballroom B

  • Sunniva R Collins ;
  • Yinsheng He ;
  • Kejian Li ;
  • In Shik Cho ;
  • Chang Soon Lee ;
  • In Gyu Park ;
  • Keesam Shin ;
  • Jeff Gelb ;
  • Allen Gu ;
  • Arno P. Merkle ;
  • Leah Lavery ;
  • George F Vander Voort ;
  • Frederick E Schmidt ;
  • Donald F Susan ;
  • Tom E Buchheit ;
  • Jordan M Massad ;
  • Jim R McElhanon ;
  • Mark Reece ;
  • Anita Garg ;
  • Ronald D Noebe

Metallographic Techniques for Revealing the Microstructure of the Expanded Austenite Case on Surface-Hardened Corrosion-Resistant Alloys

Microstructural Evolution of SS304 upon Various Shot Peening Treatments

4D Characterization of Deformation Processes in Aluminum Foams: New Dimensions in Materials Engineering

Microstructure of the Muonionalusta Octahedrite Meteorite

Confirming the Composition of Shape Memory Alloys by Microstructural Characterization

A17 - Extended Crystal Defects: Quantification of Strain, Local Atomic Structure and Chemistry

  • Douglas L. Medlin, Sandia National Laboratories ;
  • Jim Ciston Lawrence, Berkeley National Laboratory ;
  • Yoosuf N. Picard, Carnegie Mellon University

Platform Session 5

Wednesday, August 06, 2014 8:30 AM - Wednesday, August 06, 2014 10:00 AM

CCC - Room 12

  • Chen Li ;
  • Yelong Wu ;
  • Andrew R. Lupini ;
  • Naba R Paudel ;
  • Yanfa Yan ;
  • Stephen J. Pennycook ;
  • Colin Ophus ;
  • Haider Rasool ;
  • Alex Zettle ;
  • Michael F Crommie ;
  • Ulrich Dahmen ;
  • Robert Hovden ;
  • Jonathan Alden ;
  • Adam W Tsen ;
  • Pinshane Y Huang ;
  • Lola Brown ;
  • Jiwoong Park ;
  • Paul L McEuen ;
  • David A Muller ;
  • Yihan Zhu ;
  • Yu Han ;
  • Jianwei Miao

Column-by-Column Imaging of Dislocation Slip Processes in CdTe

Statistical Characterization of High Angle Graphene Grain Boundaries at Atomic Resolution

Atomic Imaging Across Strain Boundaries in Bilayer Graphene with ADF-STEM and DF-TEM

Experimental Evidence of Chiral Gold Nanowires with Boerdijk-Coxeter-Bernal Structure by Atomic-Resolution Imaging

Three-Dimensional Imaging of Dislocations and Defects in Materials at Atomic Resolution Using Electron Tomography