Tuesday

A01 - Oliver Wells Memorial Symposium on the Scanning Electron Microscope

  • Lynne M. Gignac, IBM T. J. Watson Research Center ;
  • David C. Joy, University of Tennessee ;
  • Brendan J. Griffin, University of Western Australia

Platform Session 2

Tuesday, August 05, 2014 8:30 AM - Tuesday, August 05, 2014 10:00 AM

CCC - Room 24

  • Fabian Pease ;
  • Eric Lifshin ;
  • Brendan J. Griffin, University of Western Australia ;
  • David C. Joy, University of Tennessee ;
  • Joseph R Michael

Oliver Wells: My Recollections​

Improved SEM Image Resolution Through the Use of Image Restoration Techniques

Ollie was Right! A Review of Angular Dependence, Detector Bandwidth and Sample Preparation on Contrast in Secondary and Backscattered Electron Images in the SEM

Platform Session 3

Tuesday, August 05, 2014 10:30 AM - Tuesday, August 05, 2014 12:00 PM

CCC - Room 24

  • Raynald Gauvin ;
  • Nicolas Brodusch ;
  • Hendrix Demers ;
  • Patrick Woo ;
  • Iwona Jozwik-Biala ;
  • Kacper Grodecki ;
  • Jacek Baranowski ;
  • Wlodzimierz Strupinski ;
  • Iwona Pasternak ;
  • Aleksandra Krajewska ;
  • Natasha Erdman ;
  • Vern Robertson ;
  • Masateru Shibata ;
  • Lucille A. Giannuzzi, L.A. Giannuzzi and Associates

High Resolution Imaging in the Field Emission Scanning Electron Microscope at Low Accelerating Voltage and with Energy-Filtration of the Electron Signals

Low-kV SEM Imaging of Epitaxial Graphene Grown on Various Substrates.

Ultra Low Voltage Secondary and Backscatter Imaging in FE-SEM – Successes and Challenges

Discussion of Electron Induced Atomic Number Contrast

Platform Session 4

Tuesday, August 05, 2014 1:30 PM - Tuesday, August 05, 2014 3:00 PM

CCC - Room 24

  • Donovan N Leonard ;
  • Dan Gardiner ;
  • Rebecca L. Thomas ;
  • Kayla XT Nguyen ;
  • Justin Richmond-Decker ;
  • Megan E Holtz ;
  • Yonat Milstein ;
  • David A Muller ;
  • Andreas Liebel ;
  • Gerhard Lutz ;
  • Udo Weber ;
  • Adrian Niculae ;
  • Heike Soltau ;
  • Zhu Ruan ;
  • Min Zhang ;
  • Rongguang Zeng ;
  • Bo Da ;
  • Yi Ming ;
  • Shifeng Mao ;
  • Zejun Ding ;
  • Yusuke Ominami ;
  • Masato Nakajima ;
  • Tatsuo Ushiki ;
  • Sukehiro Ito

SEM Through Dielectric Membranes: Secondary Electron Contrast Reversal

Spatial Resolution of Scanning Electron Microscopy Without a Vacuum Chamber

A Detector for Fast Electron Current Measurements based on Silicon Drift Detector Technology

Quantum Monte Carlo Simulation for Atomic Resolution SEM/STEM Image

A Novel Transmission Electron Imaging Technique for Observation of Whole Cells

A02 - Advances in Imaging and Spectroscopy in STEM

  • Nigel D. Browning, Pacific Nortwest National Laboratory ;
  • Peter D. Nellist, University of Oxford ;
  • Maria Varela del Arco, Oak Ridge National Laboratory

Platform Session 2

Tuesday, August 05, 2014 8:30 AM - Tuesday, August 05, 2014 10:00 AM

CCC - Room 14

  • Stephen J. Pennycook ;
  • Ryo Ishikawa ;
  • Andrew Lupini ;
  • Scott D. Findlay ;
  • Rohan Mishra ;
  • Sokrates T. Pantelides ;
  • Jinwoo Hwang ;
  • Jack Y Zhang ;
  • Adrian D'Alfonso ;
  • Lelie J Allen ;
  • Susanne Stemmer ;
  • Gabriel Sanchez-Santolino ;
  • Javier Tornos ;
  • Mariona Cabero ;
  • Maria Varela ;
  • Javier Garcia-Barriocanal ;
  • Carlos Leon ;
  • Jacobo Santamaria ;
  • Robert Klie ;
  • Ahmet Gulec ;
  • Jingjing Liu ;
  • Tadas Paulauskas ;
  • Patrick J Phillips ;
  • Canhui Wang ;
  • Randall Meyer

Tracking Dopant Diffusion Pathways Inside Bulk Materials

Three-Dimensional Observation of Dopant Atoms in Quantitative Scanning Transmission Electron Microscopy

Study of Oxygen Distortions in Titanate – Manganite Interfaces by Aberration Corrected STEM-EELS

Chemical Analysis with Single Atom Sensitivity Using Aberration-Corrected STEM

Platform Session 3

Tuesday, August 05, 2014 10:30 AM - Tuesday, August 05, 2014 12:00 PM

CCC - Room 14

  • Jinwoo Hwang ;
  • Jack Y Zhang ;
  • Susanne Stemmer ;
  • Lewys Jones ;
  • Vidar T Fauske ;
  • Katherine E MacArthur ;
  • Antonius T. J. van Helvoort ;
  • Peter D. Nellist, University of Oxford ;
  • Colin Ophus ;
  • Peter Ercius ;
  • Michael Sarahan ;
  • Cory Czarnik ;
  • Jim Ciston ;
  • Naoya Shibata ;
  • Scott D. Findlay ;
  • Yuichi Ikuhara

Progress in Applications of Quantitative STEM

Visualising the Three-dimensional Morphology and Surface Structure of Metallic Nanoparticles at Atomic Resolution by Automated HAADF STEM Atom Counting

Recording and Using 4D-STEM Datasets in Materials Science

Atomic-Resolution Scanning Transmission Electron Microscopy with Segmented Annular All Field Detector

Platform Session 4

Tuesday, August 05, 2014 1:30 PM - Tuesday, August 05, 2014 3:00 PM

CCC - Room 14

  • Ondrej L Krivanek ;
  • Niklas Dellby ;
  • Tracy C Lovejoy ;
  • Neil J Bacon ;
  • George J Corbin ;
  • Petr Hrncirik ;
  • Zoltan S Szilagyi ;
  • Toshihiro Aoki ;
  • Ray W Carpenter ;
  • Peter A Crozier ;
  • Jiangtao Zhu ;
  • Peter Rez ;
  • Ray F. Egerton ;
  • Philip E Batson ;
  • Tyler R Harvey ;
  • Jordan Chess ;
  • Jordan S Pierce ;
  • Peter Ercius ;
  • Benjamin J McMorran

Exploring Phonon Signals by High Energy / High Spatial Resolution EELS

Characterization of Electron Orbital Angular Momentum Transfer to Nanoparticle Plasmon Modes

High Energy and Spatial Resolution EELS Band Gap Measurements Using a Nion Monochromated Cold Field Emission HERMES Dedicated STEM

Challenges and Opportunities in Materials Science with Next Generation Monochromated EELS

Poster Session 1

Tuesday, August 05, 2014 3:30 PM - Tuesday, August 05, 2014 5:00 PM

CCC - Exhibit Hall AB

  • Everett D Grimley ;
  • Xiahan Sang ;
  • James M LeBeau ;
  • Andrew B Yankovich ;
  • Paul M Voyles ;
  • Anudha Mittal ;
  • Michael Odlyzko ;
  • K. Andre MKhoyan ;
  • Hidetaka Sawada ;
  • Naoki Shimura ;
  • Kazuhito Satoh ;
  • Eiji Okunishi ;
  • Fumio Hosokawa ;
  • Naoya Shibata ;
  • Yuichi Ikuhara ;
  • Lewys Jones ;
  • Gerardo T Martinez ;
  • Armand Béché ;
  • Sandra VanAert ;
  • Peter D. Nellist, University of Oxford ;
  • Paolo Longo, Gatan Inc. ;
  • Teya Topuria ;
  • Phil Rice ;
  • Aziz Aitouchen ;
  • Paul J Thomas ;
  • Ray D Twesten ;
  • Ping Lu ;
  • Eric Romero ;
  • Lin Zhou ;
  • M.J. Kramer ;
  • David J Smith ;
  • Merry Koschan ;
  • Mariya Zhuravleva ;
  • Charles L Melcher ;
  • Gerd Duscher ;
  • Matthew F Chisholm ;
  • Takayoshi Kishida ;
  • Shixin Wang ;
  • Aniruddha Dutta ;
  • Helge Heinrich ;
  • Daesung Park ;
  • Anja Herpers ;
  • Tobias Menke ;
  • Regina Dittmann ;
  • Joachim Maier

Application of the Projective Standard Deviation to STEM Imaging and Analysis

Precision Limits to STEM Imaging from Dynamical Scattering and Channeling of Sub-Angstrom Electron Probes

Dynamics of Electron Beam Channeling in a Single Atomic Column and in Crystals

Resolving 45 pm with 300 kV Aberration Corrected STEM

Getting the Best from an Imperfect Detector – an Alternative Normalisation Procedure for Quantitative HAADF STEM

Simultaneous High-Speed DualEELS and EDS Acquisition at Atomic Level

Improving the Spatial Resolution of Atomic-Scale EDS Mapping for Chemical Imaging and Quantification of Metallic Alloy Structures

Anti-site Defects in Perovskite YAlO3:Ce Using Aberration-corrected STEM

Removal of FEG Fluctuations in STEM Imaging

Interfacial Atomic Number Contrast in Thick Samples

Study of the Ultrathin Ferroelectric BaTiO3 Film using Scanning Transmission Electron Microscopy

A04 - Electron Holography at the Atomic Scale and the Nanoscale

  • H. Lichte, Technishe Universitat Dresden ;
  • D.J. Smith, Arizona State University ;
  • D. Cooper, French Alternative Energies and Atomic Energy Commission ;
  • D. Shindo, Tohoku University

Platform Session 2

Tuesday, August 05, 2014 8:30 AM - Tuesday, August 05, 2014 10:00 AM

HM - Ballroom B

  • Michael A Gribelyuk ;
  • Viorel Ontalus ;
  • Thomas N Adam ;
  • Frieder H Baumann ;
  • Paul Ronsheim ;
  • Rafal E. Dunin-Borkowski ;
  • Jean-Luc Rouviere ;
  • David Cooper ;
  • Zhaofeng Gan ;
  • Daniel Perea ;
  • Yang He ;
  • Robert Colby ;
  • Meng Gu ;
  • Yoo Jinkyoung ;
  • Chong-Min Wang ;
  • Tom Picraux ;
  • David Smith ;
  • Molly McCartney ;
  • Allison Boley ;
  • David F Storm ;
  • Martha R McCartney ;
  • David J Smith

Electron Holography of CMOS Devices with Epitaxial Layers

Field Mapping in Semiconductors by Off-axis Electron Holography: From Devices to Graphene and Single Dopant Atoms.

In Situ Biasing of Tapered Si-Ge NW Heterojunctions using Off-Axis Electron Holography

Characterization of N-polar GaN/AlGaN/GaN Heterostructures Using Electron Holography

Platform Session 3

Tuesday, August 05, 2014 10:30 AM - Tuesday, August 05, 2014 12:00 PM

HM - Ballroom B

  • Rafal E. Dunin-Borkowski ;
  • Nobuyuki Osakabe ;
  • Luying Li ;
  • Kai He ;
  • John Cumings

New Approaches for Measuring Electrostatic Potentials and Charge Density Distributions in Working Devices Using Off-Axis and In-Line Electron Holography

A Newly Developed 1.2MV Field Emission Transmission Electron Microscope and Visualization of Topological Quantum Phenomena

Polarization-induced Charge Distributions at Polytype Interfaces in Semiconductor Nanostructures

A New Design for Measuring Potentials in Operando Nanoelectronic Devices by Electron Holography

A07 - Microscopy and Spectroscopy for Power Generation and Energy Storage

  • Doug Perovic, University of Toronto ;
  • Feng Wang, Brookhaven National Laboratory ;
  • John Walmsley, SINTEF ;
  • Wolfgang Jäger, Christian Albrechts University ;
  • Haimei Zheng, Lawerence Berkeley National Laboratory

Platform Session 2

Tuesday, August 05, 2014 8:30 AM - Tuesday, August 05, 2014 10:00 AM

CCC - Room 15

  • Doug Perovic, University of Toronto ;
  • C. Kisielowski ;
  • S. Helveg ;
  • G. Yuan ;
  • H. Frei ;
  • Samuel Bastien ;
  • Christian Ricolleau ;
  • Nadi Braidy ;
  • Qiao Qiao ;
  • Peter Mirtchev ;
  • Yuyang Zhang ;
  • Manuel A Roldan ;
  • Maria Varela ;
  • Sokrates T. Pantelides ;
  • Doug D Perovic ;
  • Geoffrey Ozin ;
  • Stephen J. Pennycook ;
  • Qianlang Liu ;
  • Peter Crozier

Artificial Photosynthesis: Solar Fuels Nanomaterials

Atom Dynamics at the Gas-Catalysts Interface with Atomic Resolution

Plasma Synthesis of Facetted Nickel nano-Ferrites with Controlled Stoichiometry

Atomic and Electronic Structure of γFe2O3/Cu2O Heterostructured Nanocrystals

Structural Changes of Ta2O5 Photocatalyst under Reaction Conditions

Platform Session 3

Tuesday, August 05, 2014 10:30 AM - Tuesday, August 05, 2014 12:00 PM

CCC - Room 15

  • John C Walmsley ;
  • Randi Holmestad ;
  • Per Erik Vullum ;
  • Thomas W. Hansen ;
  • Federico Masini ;
  • Davide Deiana ;
  • Jane H. Nielsen ;
  • Ib Chorkendorff ;
  • David A Cullen ;
  • Karren L More ;
  • Miguel Lopez-Haro ;
  • Pascale Bayle-Guillemaud ;
  • Laure Guetaz ;
  • Mark Debe ;
  • Dennis F van der Vliet ;
  • Andrew J Steinbach ;
  • Kepeng Song ;
  • Herbert Schmid ;
  • Vesna Srot ;
  • Elisa Gilardi ;
  • Giuliano Gregori ;
  • Kui Du ;
  • Joachim Maier ;
  • Peter A. van Aken ;
  • Jae Hyuck Jang ;
  • Young-Min Kim ;
  • Qian He ;
  • Rohan Mishra ;
  • Liang Qiao ;
  • Michael D Biegalski ;
  • Andrew R. Lupini ;
  • Sokrates T. Pantelides ;
  • Stephen J. Pennycook ;
  • Sergei V. Kalinin ;
  • Albina Y Borisevich

Using (S)TEM Techniques to Study Energy related Materials at the Nanoscale

Morphology of Ruthenium Particles for Methanation Under Reactive Conditions

Fine Tuning Highly Active Pt3Ni7 Nanostructured Thin Films for Fuel Cell Cathodes

Cerium Reduction at the Interface Between Ceria and Yttria-Stabilised Zirconia and Implications for Interfacial Oxygen Non-stoichiometry

Studying Dynamics of Oxygen Vacancy Ordering in Epitaxial LaCoO3 / SrTiO3 Superlattice with Real-Time Observation

Platform Session 4

Tuesday, August 05, 2014 1:30 PM - Tuesday, August 05, 2014 3:00 PM

CCC - Room 15

  • Haimei Zheng, Lawerence Berkeley National Laboratory ;
  • Vladimir P Oleshko ;
  • Thomas Lam ;
  • Dmitry Ruzmetov ;
  • Albert V Davydov ;
  • Sergiy Krylyuk ;
  • Paul Haney ;
  • Henri Lezec ;
  • John Cumings ;
  • A. Alec Talin ;
  • Anmin Nie ;
  • Robert Klie ;
  • Sreeram Vaddiraju ;
  • Reza Shahbazian Yassar ;
  • Dong Su ;
  • Sung-Wook Kim ;
  • Kai He ;
  • Nathalie Pereira ;
  • Glenn G. Amatucci ;
  • Jason Graetz ;
  • Feng Wang, Brookhaven National Laboratory ;
  • Samartha A Channagiri ;
  • Robert M Nichol ;
  • Shrikant C Nagpure ;
  • Babu G Vishwanathan ;
  • David J McComb

In-situ Electrochemical Liquid Cell TEM Visualization of Electrode-Electrolyte Interfaces

Multimode STEM Imaging and Tomography of Radial Heterostructure Nanowire Li-Ion Mini-Batteries

Direct Atomic-Scale Imaging of Multistep Phase Transition During the Lithiation of Nanowires by In-Situ (S)TEM

Probing the Local Chemical and Structural Ordering of Iron Oxyfluoride, a Promising Electrode Material for Li-Ion Battery

Spatially Resolved Characterization of Phases in LiFePO4 Battery Cathodes Using Low Loss Electron Energy-loss Spectroscopy

Poster Session 2

Tuesday, August 05, 2014 3:30 PM - Tuesday, August 05, 2014 5:00 PM

CCC - Exhibit Hall AB

  • Akihiro Tanaka ;
  • Kenichi Tsutsumi ;
  • Hiroshi Onodera ;
  • Toyohiko Tazawa ;
  • Kai He ;
  • Peng Gao ;
  • Nathalie Pereira ;
  • Glenn G. Amatucci ;
  • Yimei Zhu, Brookhaven National Laboratory ;
  • Feng Wang, Brookhaven National Laboratory ;
  • Dong Su ;
  • Micah J Sussman ;
  • Nicolas Brodusch ;
  • Raynald Gauvin ;
  • George P. Demopoulos ;
  • Patrick J Phillips ;
  • Hakim Iddir ;
  • Roy Benedek ;
  • Daniel P Abraham ;
  • Robert F. Klie, University of Illinois at Chicago ;
  • Yifei Yuan ;
  • Anmin Nie ;
  • Sunand Santhanagopalan ;
  • Dennis D Meng ;
  • Reza S Yassar ;
  • Aaron C Johnston-Peck ;
  • Leonid A Bendersky ;
  • Andrew A Herzing ;
  • Ken R Anderson ;
  • Ram Bajaj ;
  • Rohit J Jacob ;
  • Wen-An Chiou ;
  • Michael R Zachariah ;
  • Elliot Padgett ;
  • Megan E Holtz ;
  • David A Muller ;
  • Haijun Wu ;
  • Lidong Zhao ;
  • Fengshan Zheng ;
  • Di Wu ;
  • Yangling Pei ;
  • Xiao Tong ;
  • Jiaqing He ;
  • jiaxin liu ;
  • jia xu ;
  • yudong huang ;
  • Jingyue Liu ;
  • Hossein Alimadadi ;
  • Cecilía Kjartansdóttir ;
  • Takeshi Kasama ;
  • Per Møller ;
  • Khim Karki ;
  • G G Amatucci ;
  • M S Whittingham ;
  • F Wang

An advanced quantitative analysis of Li in LIB with AES Preparation for a clean cross section with the Cross Section Polisher

Quantitative oxidation state analysis of transition metals in a lithium-ion battery with high energy resolution AES

Discovering a Novel Sodiation in FeF2 Electrodes for Sodium-Ion Batteries

Transmission Electron Forward Scattered Diffraction and Low Voltage SEM/STEM Characterization of Binder-Free TiO2 Electrodes

Imaging and Spectroscopy of Pristine and Cycled Li2MnO3

In-situ TEM Study on Electrochemical Behavior of α-MnO2 Nanowire

Characterization of a Layered Lithium Manganese-rich Oxide Cathode Material via Scanning Transmission Electron Microscopy

Microstructural and Microchemical Analyses of Extracted Second-Phase Precipitates in Alpha-Annealed and Beta-Quenched Zircaloy-4

Probing the Reaction Mechanism for Highly Reactive Nanothermite Formulations

Tomography and Spectroscopy of Structure and Degradation in Carbon Electrode Materials for Energy Conversion and Storage

Understanding the role of potassium doping in PbTe-PbS thermoelectrics

ZnO Nanowire Supported Ag Catalyst for Methanol Steam Reforming

Characterization of Aluminum and Nickel Thermochemical Diffusion for Synthesis of Alkaline Water Electrolysis Electrodes

In-Situ TEM Electrochemical Processes in Conversion-Based Li-Ion Battery Electrodes

A12 - 3D Imaging and Microanalysis: Image Analysis and Applications

  • Paul G. Kotula, Sandia National Laboratories ;
  • Keana C.K. Scott

Platform Session 1

Tuesday, August 05, 2014 10:30 AM - Tuesday, August 05, 2014 12:00 PM

CCC - Room 17

  • Michael R Keenan ;
  • Arda Genc ;
  • Jan Ringnalda ;
  • Huikai Cheng ;
  • Paul Fischione ;
  • Meng Gu ;
  • Chong-Min Wang ;
  • Libor Kovarik ;
  • Lee Pullan ;
  • Bert Freitag ;
  • John M Sosa ;
  • Daniel E Huber ;
  • Brian Welk ;
  • Jacob K Jensen ;
  • Robert E. A. Williams ;
  • Stuart Lambert ;
  • Hamish L Fraser ;
  • Bart Goris ;
  • Daniele Zanaga ;
  • Eva Bladt ;
  • Thomas Altantzis ;
  • Sara Bals ;
  • R. Prakash Kolli ;
  • Frederick Meisenkothen

Challenges and Opportunities in the Multivariate Analysis of 3-D Spectral Images

Towards Quantitative 3D Chemical Analysis in TEM Using Quadrant XEDS Detector Geometry

3D ChemiSTEM™ Tomography of Nano-scale Precipitates in High Entropy Alloys

Towards Quantitative EDX Results in Three Dimensions.

Optimization of Experimental Parameters and Specimen Geometry for Pulsed-Laser Atom-Probe Tomography of Copper

Platform Session 2

Tuesday, August 05, 2014 1:30 PM - Tuesday, August 05, 2014 3:00 PM

CCC - Room 17

  • Michael P Marsh ;
  • Keana C.K. Scott ;
  • Rhonda M. Stroud ;
  • Nabil D. Bassim ;
  • Aric W. Sanders ;
  • Anna Fox ;
  • Paul Dresselhaus ;
  • Alexandra E Curtin ;
  • Terry S Yoo ;
  • Bradley C Lowekamp ;
  • Oleg Kuybeda ;
  • Kedar Narayan ;
  • Gabriel A Frank ;
  • Alberto Bartesaghi ;
  • Mario Borgnia ;
  • Sriram Subramaniam ;
  • Guillermo Sapiro ;
  • Michael J Ackerman

Data Processing Challenges for Proper Interpretation of FIB-SEM Nanotomography Imaging Applications

Optimization of Focused Ion Beam-Tomography for Superconducting Electronics

Accelerating Discovery in 3D Microanalysis: Leveraging Open Source Software and Deskside High Performance Computing

Poster Session 1

Tuesday, August 05, 2014 3:30 PM - Tuesday, August 05, 2014 5:00 PM

CCC - Exhibit Hall AB

  • Julie Wittenzellner ;
  • Neal J. Magdefrau ;
  • Daniel Goberman ;
  • Richard McLaughlin ;
  • Sreenivas Bhattiprolu ;
  • Daniel Bufford ;
  • Sarah H Pratt ;
  • Timothy J Boyle ;
  • Khalid Hattar ;
  • Singanallur V Venkatakrishnan ;
  • Ming-Siao Hsiao ;
  • Nick Garvin ;
  • Michael A Jackson ;
  • Marc DeGraef ;
  • Jeff Simmons ;
  • Charles A Bouman ;
  • Lawrence F. Drummy ;
  • Mary Scott ;
  • Chien-Chun Chen ;
  • Hao Zeng ;
  • Peter Ercius ;
  • John Miao ;
  • Misa Hayashida ;
  • Marek Malac ;
  • Michael Bergen ;
  • Ray Egerton ;
  • Jing Charlotte Li ;
  • Dong Su ;
  • Huolin L Xin ;
  • Todd H Brintlinger ;
  • Mark E Twigg ;
  • Harold (Hap) L Hughes ;
  • Scott R Broderick ;
  • Sonal Padalkar ;
  • Santoshrupa Dumpala ;
  • Krishna Rajan ;
  • David L Jaeger ;
  • Sanghita Mridha ;
  • Deep Choudhuri ;
  • Sundeep Mukherjee ;
  • Rajarshi Banerjee ;
  • Diwaker Jha ;
  • Henning Osholm Sørensen ;
  • Dirk Müter ;
  • Susan Louise Svane Stipp ;
  • Kim N Dalby ;
  • Arno P. Merkle ;
  • Leah Lavery ;
  • Jeff Gelb ;
  • Nicolas Piche ;
  • Jiří Janáček ;
  • Lucie Kubínová ;
  • Xiao W Mao ;
  • Phil Fraundorf ;
  • Jamie Daugherty ;
  • P. Fraundorf ;
  • Agustin J Avila-Sakar ;
  • Blake M Milner ;
  • Fei Guo ;
  • Wen Jiang ;
  • B. Ellen Scanley ;
  • Thomas E Sadowski ;
  • Candice I Pelligra ;
  • Melissa E Kreider ;
  • Chinedum O Osuji ;
  • Christine C Broadbridge ;
  • Stephen C Murray ;
  • Jesus G Galaz-Montoya ;
  • Grant Tang ;
  • John F Flanagan ;
  • Steven J Ludtke

3D EDS Applications Using Destructive and Non-Destructive FIB-Based Techniques

Time-Resolved 3D Imaging of Ion Beam Induced Surface Damage in Gold Nanoparticles

Model-Based Iterative Reconstruction for Low-Dose Electron Tomography

Atomic Resolution Tomography of Magnetically Anisotropic FePt Nanoparticles

Electron Diffraction-Based Tilt Angle Measurements in Electron Tomograph

A Model Based Method for Tomographic Reconstructions of Nanoparticle Assemblies

Energy-Filtered Transmission Electron Microscope Tomography of Silicon Nanoparticles in Silicon Dioxide Deposited with High Density Plasma Chemical Vapor Deposition

Data Intensive Imaging for 3D Atom Probe

Compositional Analysis of As-Cast and Crystallized Pd43Cu27Ni10P20 Bulk Metallic Glass

Multi-scale 3D Mapping of Tomography Data

X-Ray Tomography and Finite Elements Simulations of Rock Mechanics

Fusing Multi-Scale and Multi-Modal 3D Imaging and Characterization

Tracing Tubular Objects in 3D Confocal Images Using Haptic Device.

Digital Darkfield Analysis of Lattice-Fringe Images with ImageJ

RGB Analysis of Wedge Angles Around a Perforation in Silicon

Image Restoration via Phase-Derived Drift Correction of Movies of 2D Crystals Acquired with a CMOS Direct Electron Detector.

Use of the Gabor Filter for Edge Detection in the Analysis of Zinc Oxide Nanowire Images

EMAN2.1 - A New Generation of Software for Validated Single Particle Analysis and Single Particle Tomography

A15 - Cs-Correctors: Current State and Ongoing Developments

  • Max Haider, CEOS Gmbh ;
  • Rolf Erni, EMPA

Platform Session 1

Tuesday, August 05, 2014 8:30 AM - Tuesday, August 05, 2014 10:00 AM

CCC - Room 22

  • Juri Barthel ;
  • Thust Andreas ;
  • Demie M Kepaptsoglou ;
  • Andrew R. Lupini ;
  • Dorothea Mücke-Herzberg ;
  • Gareth Vaugan ;
  • Quentin M Ramasse ;
  • Peter Hartel ;
  • Martin Linck ;
  • Frank Kahl ;
  • Heiko Müller ;
  • Max Haider, CEOS Gmbh ;
  • Niklas Dellby ;
  • George J Corbin ;
  • Zeno Dellby ;
  • Tracy C Lovejoy ;
  • Zoltan S Szilagyi ;
  • Matthew F Chisholm ;
  • Ondrej L Krivanek

Lifetime of Optical States in Transmission Electron Microscopy

Performance and Stability of Aberration-Corrected STEMs: a User's Perspective

On Proper Phase Contrast Imaging in Aberration Corrected TEM

Tuning High Order Geometric Aberrations in Quadrupole-Octupole Correctors

Platform Session 2

Tuesday, August 05, 2014 10:30 AM - Tuesday, August 05, 2014 12:00 PM

CCC - Room 22

  • Angus I. Kirkland, University of Oxford ;
  • Etienne Snoeck ;
  • Florent Houdellier ;
  • Yoshifumi Taniguchi ;
  • Aurelien Masseboeuf ;
  • Christophe Gatel ;
  • Julien Nicolai ;
  • Martin J Hytch ;
  • Heiko Müller ;
  • Stephan Uhlemann ;
  • Peter Hartel ;
  • Joachim Zach ;
  • Maximilian Haider ;
  • Koji Kimoto ;
  • Kazuo Ishizuka

Applications of Aberration Corrected TEM and Exit Wave Reconstruction in Materials Science

Off-Axial Aberration Correction Using a B-COR for Lorentz and HREM Modes

Overview of Commercially Available CEOS Hexapole-Type Aberration Correctors.

Quantitative Assessment of Lower-Voltage TEM Performance Using 3D Fourier Transform of Through-Focus Series

Platform Session 3

Tuesday, August 05, 2014 1:30 PM - Tuesday, August 05, 2014 3:00 PM

CCC - Room 22

  • Knut W. Urban ;
  • Chun-Lin Jia ;
  • Lin L. Jin ;
  • Shao-Bo Mi ;
  • Marin M Alexe ;
  • Dietrich M Hesse ;
  • Juri Barthel ;
  • Dawei Wang ;
  • Rafal E. Dunin-Borkowski ;
  • Andreas Thust ;
  • J.G. Wen ;
  • Dean J. Miller ;
  • Russ E Cook ;
  • Nestor J Zaluzec

Aberration-Corrected Transmission Electron Microscopy Reveals Nanoscale Disorder in Bismuth Ferrite Single Crystals

Atomically Resolved 3D Shape Determination of a MgO Crystal Using a Single Aberration Corrected HRTEM Image

Amplitude Contrast Imaging: High Resolution Electron Microscopy Using a Spherical and Chromatic Aberration Corrected TEM

Poster Session 1

Tuesday, August 05, 2014 3:30 PM - Tuesday, August 05, 2014 5:00 PM

CCC - Exhibit Hall AB

  • Edgar Voelkl ;
  • Peter Tiemeijer ;
  • Martin Linck ;
  • Benjamin McMorran ;
  • Jordan Pierce ;
  • Peter Ercius ;
  • Benjamin L. Rickman ;
  • W. Andreas Schroeder ;
  • Reiner Ramlau ;
  • Reinhard Schneider ;
  • John H Roudebush ;
  • Robert J Cava

A Need for Bandwidth Limitations in Electron Microscopes

Aberration-Corrected STEM by Means of Diffraction Gratings

Circumventing Scherzer's Theorem: Large Numerical Aperture Objective Lenses for Pulsed Electron Microscopy

The Real Structure of Cu3Ni2SbO6 and Cu3Co2SbO6 Delafossites with Honeycomb Lattices by Aberration-Corrected HRTEM

A16 - Correlative Microscopy and Microanalysis from Macro to Pico

  • Brian P. Gorman, Colorado School of Mines ;
  • Christoper J. Gilpin, Purdue University ;
  • Mor Baram, McMaster University

Platform Session 2

Tuesday, August 05, 2014 8:30 AM - Tuesday, August 05, 2014 10:00 AM

CCC - Room 21

  • Anders Palmquist ;
  • Kathryn Grandfield ;
  • Matthew D Hecht ;
  • Bryan A Webler ;
  • Yoosuf N. Picard, Carnegie Mellon University ;
  • Tom Wirtz ;
  • David Dowsett ;
  • Santhana Eswara Moorthy ;
  • Yves Fleming ;
  • Shen J Dillon ;
  • Kyong Wook Noh

From Micro to Nano: Correlative 3D Microscopies for Analysis of Biointerfaces

Investigating the Effects of a Heat Treatment on Microstructure of an Ultrahigh Carbon Steel through SEM and In Situ CLSM studies.

SIMS Based Correlative Microscopy for High-Resolution High-Sensitivity Nano-Analytics

In-situ EM Characterization of Li-ion Battery Through Multiple Cycles

Platform Session 3

Tuesday, August 05, 2014 10:30 AM - Tuesday, August 05, 2014 12:00 PM

CCC - Room 21

  • Santhana Eswara Moorthy ;
  • David Dowsett ;
  • Tom Wirtz ;
  • Chikara Sato ;
  • Takaaki Kinoshita ;
  • Takeshi Uemura ;
  • Kazumi Hiarno ;
  • Hidetoshi Nishiyama ;
  • Mari Sato ;
  • Tatsuhiko Ebihara ;
  • Mitsuo Suga ;
  • Shoko Nishihara ;
  • Peijun Zhang ;
  • Sangmi Jun ;
  • Gongpu Zhao ;
  • Zandrea Ambrose ;
  • Simon c Watkins ;
  • Aric W. Sanders ;
  • Kavita Jeerage ;
  • Cindi Schwartz ;
  • Alexandra E Curtin ;
  • Ann N Chiaramonti ;
  • Nassirhadjy Memtily ;
  • Kazuhiro Mio

Correlative Microscopy Using TEM and SIMS: Parallel Ion Electron Spectrometry (PIES) for High-Resolution, High-Sensitivity Elemental Mapping for Applications in Materials Science and Biology

The Atmospheric Scanning Electron Microscope (ASEM) Observes Axonal Segmentation and Synaptic Induction in Solution

Correlative Imaging and Cryo-FIB Processing for Direct Visualization of HIV-1 infection

Correlating Multiscale Measurements of Nanoparticles in Primary Cells

Observation of Tissues in Solution by Atmospheric Scanning Electron Microscope (ASEM)

Poster Session 2

Tuesday, August 05, 2014 3:30 PM - Tuesday, August 05, 2014 5:00 PM

CCC - Exhibit Hall AB

  • LiLung Lai ;
  • Jenny Goulden ;
  • Scott D Sitzman ;
  • Kim Larsen ;
  • Hui Jiang ;
  • Alexandra E Curtin ;
  • Ryan Skinner ;
  • Aric W. Sanders ;
  • Arno P. Merkle ;
  • Jeff Gelb ;
  • Alexander Orchowski ;
  • Jochen Fuchs ;
  • Tanaporn Rojhirunsakool ;
  • Antariksh Singh ;
  • Soumya Nag ;
  • Jaimie S Tiley ;
  • Rajarshi Banerjee ;
  • Jaroslav Jiruše ;
  • Martin Haničinec ;
  • Miloslav Havelka ;
  • Olaf Hollricher ;
  • Wolfram Ibach ;
  • Peter Spizig ;
  • Frank F Hitzel ;
  • Nils Anspach ;
  • Fang Zhou ;
  • Soeren Eyhusen ;
  • Hugues Francois-Saint-Cyr ;
  • Isabelle Martin ;
  • Wilfried Blanc ;
  • Philippe LeCoustumer ;
  • Chrystel Hombourger ;
  • Daniel Neuville ;
  • David Larson ;
  • Ty J Prosa ;
  • Christelle Guillermier ;
  • Santoshrupa Dumpala ;
  • Adedapo A Oni ;
  • Sonal Padalkar ;
  • Scott R Broderick ;
  • James M LeBeau ;
  • Krishna Rajan ;
  • Bruce W Arey ;
  • Daniel E Perea ;
  • Libor Kovarik ;
  • Jia Liu ;
  • Andrew R Felmy ;
  • Wayne Zhao ;
  • Hugh Porter ;
  • Raghaw Rai ;
  • Esther Chen ;
  • Jeremy Russell ;
  • Ingo Schulmeyer ;
  • William G Janssen ;
  • Hugo H Hanson ;
  • Barbara L Armbruster ;
  • Sander V. den Hoedt ;
  • Dirk Schumann ;
  • Sebastian Fuchs ;
  • Jessica Stromberg ;
  • Alexandre Laquerre ;
  • David Mayer ;
  • Michael W Phaneuf ;
  • Hojatollah Vali ;
  • Neil Banerjee ;
  • Alexandra F. Elli ;
  • Eric Hummel ;
  • Christian Boeker ;
  • Mari Sakaue ;
  • Masamichi Shiono ;
  • Mami Konomi ;
  • Junichiro Tomizawa ;
  • Eiko Nakazawa ;
  • Koji Kawai ;
  • Susumu Kuwabata ;
  • Audrey MOLZA ;
  • Jean-Louis MANSOT ;
  • Yves BERCION ;
  • Farid BEGARIN ;
  • Linda Nikolova

The Strategy of Advanced Analysis in Semiconductor Nano-device: from Nanoprobing to Nanoscopy and Nanoanalysis

Multi-scale EBSD and EDS for Detection and Analysis of Spatially Rare Grains and Phases

A Simplified Approach to Determining Resolution of Optical, Ion and Electron Microscope Images

X-ray Microscopy: the Cornerstone for Correlative Characterization Methods in Materials Research and Life Science

Multi-Scale Characterization of Different Generations of Gamma Prime Precipitates in Nickel-based Superalloys Using Correlative Microscopy Techniques

FIB-SEM Instrument with Integrated Raman Spectroscopy for Correlative Microscopy

Hybrid SEM/AFM System from Carl Zeiss Revolutionizes Analysis of Functional Micro- and Nanostructured Specimen

Correlative Compositional Analysis of Fiber-Optic Nanoparticles

Correlative Imaging of Stacking Faults using Atom Probe Tomography (APT) and Scanning Transmission Electron Microscopy (STEM)

Understanding Fayalite Chemistry Using Electron Microscopy and Atom Probe Tomography

Beware of Artifacts When Characterizing Nanometer Device Features Smaller Than a TEM Lamella Thickness in Semiconductor Wafer-foundries

Comprehensive Nanofabrication by Correlating Crossbeam and ORION Nanofab

A Streamlined Technique to Examine Cell Monolayers by Means of Correlative Light and Transmission Electron Microscopy

The SECOM Platform: an Integrated CLEM Solution

Combining Terapixel-Scale SEM Imaging and High-Resolution TEM Studies for Mineral Exploration

Correlative Light and Electron Microscopy – on the way from 2D towards 3D

New preparation Method Using Ionic Liquid for Quick and Faithful SEM Observation of Biological Specimens

Investigation of Friction Wear Process in the Presence of Exfoliated Graphite Nanoparticles Using Correlative In Situ Raman Micro Spectrometry and Post Mortem Raman, Analytical Scanning and Transmission Electron Microscopies

Ionic Liquids Preparation for SEM Observation of Minute Crustacean

Development of High Pressure Freezing and Correlative Light/Electron Microscopy for Drosophila Larvae

A17 - Extended Crystal Defects: Quantification of Strain, Local Atomic Structure and Chemistry

  • Douglas L. Medlin, Sandia National Laboratories ;
  • Jim Ciston Lawrence, Berkeley National Laboratory ;
  • Yoosuf N. Picard, Carnegie Mellon University

Platform Session 2

Tuesday, August 05, 2014 8:30 AM - Tuesday, August 05, 2014 10:00 AM

CCC - Room 12

  • Marc Heggen ;
  • Michael S Titus ;
  • Akane Suzuki ;
  • Michael J Mills ;
  • Tresa M Pollock ;
  • Amy Wang ;
  • Marc DeGraef ;
  • Timothy L Smith ;
  • Matthew L Bowers

Metadislocations in Complex Metallic Alloys

Sub-nanometer Resolution Chemi-STEM EDS Mapping of Superlattice Intrinsic Stacking Faults in Co-based Superalloys

Using Bethe Potentials in the Scattering Matrix for Defect Image Simulations

STEM-Based Characterization of Dislocations and Stacking Faults in Structural Materials

Platform Session 3

Tuesday, August 05, 2014 10:30 AM - Tuesday, August 05, 2014 12:00 PM

CCC - Room 12

  • Naoya Shibata ;
  • Scott D. Findlay ;
  • Yuichi Ikuhara ;
  • Miaolei Yan ;
  • Marc DeGraef ;
  • Yoosuf N. Picard, Carnegie Mellon University ;
  • Paul A Salvador ;
  • Qian He ;
  • Ryo Ishikawa ;
  • Andrew R. Lupini ;
  • Liang Qiao ;
  • Michael D Biegalski ;
  • Albina Borisevich ;
  • Dan Zhou ;
  • Wilfried Sigle ;
  • Yi Wang ;
  • Marion Kelsch ;
  • Yuze Gao ;
  • Hanns-Ulrich Habermeier ;
  • Peter A. van Aken ;
  • Chad M Parish ;
  • Yutai Katoh ;
  • Takaaki Koyanagi ;
  • Sisuke Kondo

Polar Oxide Interface Characterization by Differential Phase Contrast STEM

Defect Analysis in La0.7Sr0.3MnO3 Epitaxial Thin Films by Electron Channeling Contrast Imaging (ECCI)

Toward 3D Mapping of Octahedral Rotations at Perovskite Thin Film Heterointerfaces Unit Cell by Unit Cell

Chemical and Defect Analysis in a ZrO2/LSMO Pillar-Matrix System

Atomic-Resolution Investigation of Irradiation-Induced Defects in Silicon Carbide

Platform Session 4

Tuesday, August 05, 2014 1:30 PM - Tuesday, August 05, 2014 3:00 PM

CCC - Room 12

  • Martin J Hytch ;
  • Christophe Gatel ;
  • Axel Lubk ;
  • Thibaud Denneulin ;
  • Lise Durand ;
  • Nikolay Cherkashin ;
  • Etienne Snoeck ;
  • Burak Ozdol ;
  • Christoph Gammer ;
  • Michael Sarahan ;
  • Andrew Minor ;
  • Martin Couillard ;
  • Adedapo A Oni ;
  • Xiahan Sang ;
  • Aakash Kumar ;
  • Selva V Raju ;
  • Srikant Srinivasan ;
  • Susan B Sinnott ;
  • Surendra K Saxena ;
  • Krishna Rajan ;
  • James M LeBeau ;
  • Suhyun Kim ;
  • Sungho Lee ;
  • Younhuem Jung ;
  • Joong Jung Kim ;
  • Gwangseon Byun ;
  • sunyoung Lee ;
  • Heabum Lee

Local Strain Measurements at Dislocations, Disclinations and Domain Boundaries

Nano-scale Strain Mapping Using Advanced STEM with a Direct Electron Detector

Measuring Strain Fields surrounding Grain-Boundary Dislocations in Silicon using Scanning Transmission Electron Microscopy

Direct Lattice Parameter Measurements Using HAADF-STEM

Quantitative Strain Measurement in Semiconductor Devices by Scanning Moiré Fringe Imaging

Poster Session 2

Tuesday, August 05, 2014 3:30 PM - Tuesday, August 05, 2014 5:00 PM

CCC - Exhibit Hall AB

  • C. Austin Wade ;
  • Masashi Watanabe ;
  • Matthew T Janish ;
  • Paul G. Kotula, Sandia National Laboratories ;
  • Brad L Boyce ;
  • C. Barry Carter ;
  • Amin Azizi ;
  • Xiaolong Zou ;
  • Peter Ercius ;
  • Zhuhua Zhang ;
  • Ana L Elias ;
  • Néstor Perea-López ;
  • Mauricio Terrones ;
  • Boris I. Yakobson ;
  • Nasim Alem ;
  • David C Bell ;
  • Estelle Kalfon-Cohen ;
  • D. L. Medlin ;
  • K. J. Erickson ;
  • S. J. Limmer ;
  • W. G. Yelton ;
  • M. P. Siegal

Ad Hoc Determination of Local Misorientations and Boundary Planes between Grains in TEM by a Dedicated Software Package Developed for the Gatan DigitalMicrograph Platform

Investigation of Bi Segregation of Cu Bicrystal Boundaries Using Aberration-Corrected STEM Depth Sectioning

Observations on Heavily Deformed Tantalum

Atomic-scale Observation of Grains and Grain Boundaries in Monolayers of WS2

Imaging Defects in Quantum Materials

An Electron Microscopic Investigation of (1/3)<0 -1 1 1> Dislocations in Bi2Te3 Nanowires: Defect Crystallography and Relationship to 7-layer Bi3Te4 Defects

A18 - Vendor Symposium: New Tools for Life and Materials Sciences

  • Alice C. Dohnalkova, Pacific Nortwest National Laboratory ;
  • Elizabeth R. Wright, Emory University ;
  • Mark A. Sanders, University of Minnesota

Platform Session 2

Tuesday, August 05, 2014 8:30 AM - Tuesday, August 05, 2014 10:00 AM

CCC - Room 25

  • David Wall ;
  • Fabian-Cyril Sasam ;
  • Tomas Vystavel ;
  • Petr Wandrol ;
  • Jaroslav Jiruše ;
  • Miloslav Havelka ;
  • Martin Haničinec ;
  • Jan Polster ;
  • Tomáš Hrnčíř ;
  • Christian Lang ;
  • Anthony Hyde ;
  • Matthew Hiscock ;
  • Simon Burgess ;
  • James Holland ;
  • Peter Statham ;
  • Chris E Meyer ;
  • Niklas Dellby ;
  • Zeno Dellby ;
  • Gwyn S Skone ;
  • Ondrej L Krivanek ;
  • Ingo Schulmeyer ;
  • Martin Kienle ;
  • Aaron Lewis ;
  • A Komissar ;
  • A Ignatov ;
  • Oleg Fedoroyov ;
  • Eran Maayan

Optimized Electron Column and Detection Scheme for Advanced Imaging and Analysis of Metals

New High-Resolution Low-Voltage and High Performance Analytical FIB-SEM System

Automated SEM Analysis in Industrial Process Control and Scientific Research

Using Nion Swift for Data Collection, Processing, Display and Analysis

Enabling Future Nanotomography and Nanofabrication with Crossbeam technology

AFM integrated with SEM/FIB for complete 3D metrology measurements

Platform Session 3

Tuesday, August 05, 2014 10:30 AM - Tuesday, August 05, 2014 12:00 PM

CCC - Room 25

  • Yoshitaka Aoyama ;
  • Matthew M Nowell ;
  • Stuart I Wright ;
  • Travis Rampton ;
  • René de Kloe ;
  • Andreas Liebel ;
  • Rouven Eckhardt ;
  • Markus Bornschlegl ;
  • Alois Bechteler ;
  • Adrian Niculae ;
  • Heike Soltau ;
  • Robert M Ulfig ;
  • David J Larson ;
  • Thomas F Kelly ;
  • Peter H Clifton ;
  • Ty J Prosa ;
  • Daniel R. Lenz ;
  • Ed X Oltman ;
  • Ryll Henning ;
  • Robert Hartmann ;
  • Martin Huth ;
  • Sebastian Ihle ;
  • Julia Schmidt ;
  • Martin Simson ;
  • Lothar Strueder ;
  • Jan Herrmann ;
  • Gordon Krenz ;
  • Gerhard Lutz

Image Collection using an Auto Data Acquisition System and An Application to Ice Embedded Ribosome

A New Microstructural Imaging Approach Through EBSD Pattern Region of Interest Analysis

Concepts for an Annular Pole Piece Detector for the Simultaneous Measurement of X-Rays and Backscattered Electrons Inside a SEM

Performance Advances in LEAP Systems

The pnCCD for Applications in Transmission Electron Microscopy: Further Development and New Operation Modes

Large Solid Angle Silicon Drift Detectors for EDX Analysis in TEM