Thursday

A02 - Advances in Imaging and Spectroscopy in STEM

  • Nigel D. Browning, Pacific Nortwest National Laboratory ;
  • Peter D. Nellist, University of Oxford ;
  • Maria Varela del Arco, Oak Ridge National Laboratory

Platform Session 8

Thursday, August 07, 2014 8:30 AM - Thursday, August 07, 2014 10:00 AM

CCC - Room 14

  • Yuichi Ikuhara ;
  • Timothy J. Pennycook ;
  • Lewys Jones ;
  • Henrik Petterson ;
  • Valeria Nicolosi ;
  • Peter D. Nellist, University of Oxford ;
  • Manuel A Roldan ;
  • Juan Salafranca ;
  • Ryo Ishikawa ;
  • Rohan Mishra ;
  • Alberto Lopez-Ortega ;
  • Marta Estrader ;
  • German Salazar-Alvarez ;
  • Josep Nogues ;
  • Stephen J. Pennycook ;
  • Maria Varela ;
  • Pinghong Xu ;
  • Maricruz S. Sanchez ;
  • Andre C. Van Veen ;
  • Nigel D. Browning, Pacific Nortwest National Laboratory ;
  • Johannes A. Lercher ;
  • Qian He ;
  • Jungwon Woo ;
  • Vadim V Guliants ;
  • Albina Borisevich

Grain Boundary Structure Reconstruction due to Vacancies and Dopants in Oxides

Probing Atomic Scale Dynamics with STEM

Atomic-Resolution Monitoring of Structural Phase Transition in Bi-magnetic Core/Shell Oxide Nanoparticles

Ex-situ and In-situ Analysis of MoVTeNb Oxide by Aberration-Corrected Scanning Transmission Electron Microscopy

Novel M1/M2 Heterostructure in Mo-V-M-Ta (M = Te or Sb) Complex Oxide Catalyst Revealed by Aberration Corrected HAADF STEM

Platform Session 9

Thursday, August 07, 2014 1:30 PM - Thursday, August 07, 2014 3:00 PM

CCC - Room 14

  • Masashi Watanabe ;
  • Kazuo Ishizuka ;
  • Matthew L Bowers ;
  • Patrick J Phillips ;
  • Jonghan Kwon ;
  • Matthew C Brandes ;
  • Michael J Mills ;
  • Marc DeGraef ;
  • Robert E. A. Williams ;
  • Bryan D Esser ;
  • Gopal B Viswanathan ;
  • Brian Welk ;
  • Arda Genc ;
  • Mark Gibson ;
  • Leslie J Allen ;
  • David W. McComb ;
  • Hamish L Fraser

Evaluation of Sensitivity of Multivariate Statistical Analysis on STEM Spectrum-Imaging Datasets and its Improvement

Zone Axis STEM Defect Imaging Based on Electron Kossel Patterns

Characterizing Sub-lattice Occupancies in B2 Phases in High Entropy Metallic Alloys using Atomic Resolution STEM-XEDS Mapping

Poster Session 4

Thursday, August 07, 2014 10:30 AM - Thursday, August 07, 2014 12:00 PM

CCC - Exhibit Hall AB

  • Weihao Weng ;
  • Marco A. L. Cordeiro ;
  • Daniel G. Stroppa ;
  • Christopher J. Kiely ;
  • Edson R. Leite ;
  • Chang Wan Han ;
  • Ernesto E. Marinero ;
  • Antonio Aguilar ;
  • Rodolfo Zanella ;
  • Volkan Ortalan ;
  • Cem Akatay ;
  • Paul Dietrich ;
  • Fred Sollberger ;
  • Jeffrey Miller ;
  • Nicholas Delgass ;
  • Fabio Ribeiro ;
  • Eric Stach ;
  • Bryan D Esser ;
  • Adrian D'Alfonso ;
  • Manisha Dixit ;
  • Robert E. A. Williams ;
  • Hamish L Fraser ;
  • Leslie J Allen ;
  • David W. McComb ;
  • Hanne Kauko ;
  • Tim Grieb ;
  • Mazid Munshi ;
  • Knut Müller ;
  • Andreas Rosenauer ;
  • Bjørn-Ove Fimland ;
  • Antonius T. J. van Helvoort ;
  • Jiangtao Zhu ;
  • Peter A Crozier ;
  • Toshihiro Aoki ;
  • James R Anderson ;
  • Mahsa Sina ;
  • Nathalie Pereira ;
  • Glenn G. Amatucci ;
  • Frederic Cosandey ;
  • Subarna Khanal ;
  • Nabraj Bhattarai ;
  • J. Jesus Velazquez-Salazar ;
  • Miguel Jose-Yacaman ;
  • Jia Xu ;
  • Jingyue Liu ;
  • A W Wood ;
  • Y Guan ;
  • K Forghani ;
  • L J Mawst ;
  • T F Kuech ;
  • S E Babcock ;
  • Gilberto Casillas ;
  • Matthew Mecklenburg ;
  • Shaul Aloni ;
  • Edward R White ;
  • Rohan Dhall ;
  • William Hubbard ;
  • Steve Cronin ;
  • Brian Regan

Understanding the Growth Mechanism of CeO2 Nanocrystals by Comparison of Experimental and Simulated HAADF-STEM Images

In situ HAADF-STEM Imaging and Tomography of AuIr Bimetallic Catalysts

Linking Performance with Particle Configuration on Bimetallic Pt/Co/MWCNT Catalysts for Aqueous Phase Reforming by Aberration Corrected STEM coupled with EELS

Understanding B-Site Disorder in HAADF-STEM Images of Double Perovskite Thin Films Using the Quantum Excitation of Phonons Model

The Outward Diffusion of Sb during Nanowire Growth Studied by Quantitative High-Angle Annular Dark Field Scanning Transmission Electron Microscopy.

Full Optical Properties of Carbonaceous Aerosols by High Energy Monochromated Electron Energy-loss Spectroscopy

STEM/EELS Analysis of Conversion Reactions in Cycled FeOF/C

Study of Novel AuCu-Pt Trimetallic Multiply Twinned Nanoparticles with High Index Surfaces

Atomic Resolution Study of the Bonding Between ZnO Nanowires

Unexpected Bismuth Concentration Profiles in MOVPE GaAs1-xBix Films Revealed by HAADF STEM Imaging

New Insights into the Structure of PtPd Bimetallic Nanoparticles and Their Atomic Resolution Images by Cs-Corrected STEM

Improved Temperature Determination from Plasmon Energy Shifts in Aluminum

A03 - TEM Phase Contrast Imaging in Biological and Materials Science

  • Radostin Danev, MPI Biochmeistry ;
  • Michael Marko, Wadsworth Center

Platform Session 8

Thursday, August 07, 2014 8:30 AM - Thursday, August 07, 2014 10:00 AM

CCC - Room 23

  • Robert M Glaeser ;
  • Michael Marko, Wadsworth Center ;
  • Xing Meng ;
  • Chyongere Hsieh ;
  • Gregory Kishchenko ;
  • ArDean Leith ;
  • Simon Hettler ;
  • Jochen Wagner ;
  • Manuel Dries ;
  • Marco Oster ;
  • Rasmus R Schröder ;
  • Dagmar Gerthsen

Investigating the Causes of Electrostatic Charging of Phase Contrast Apertures

Evaluation of the Quality of Zernike Phase Plates

Application of Zach Phase Plates for Phase Contrast Transmission Electron Microscopy: Status and Future Experiments

Inelastic Phase Contrast Using Electrostatic Zach Phase Plates

Platform Session 9

Thursday, August 07, 2014 1:30 PM - Thursday, August 07, 2014 3:00 PM

CCC - Room 23

  • Bart Buijsse ;
  • Gijs van Duinen ;
  • Kasim Sader ;
  • Radostin Danev, MPI Biochmeistry ;
  • Stephan H Irsen ;
  • Patrick Kurth ;
  • Steffen Pattai ;
  • Joerg Wamser ;
  • Daniel Rudolph ;
  • Johannes Overbuschmann ;
  • Yuji Konyuba ;
  • Hirofumi Iijima ;
  • Yutaka Abe ;
  • Mitsuo Suga ;
  • Yoshihiro Ohkura ;
  • Hiroki Minoda ;
  • Takayuki Tamai ;
  • Fumio Hosokawa ;
  • Yukihito Kondo

Challenges in Phase Plate Product Development

Artifact-Free, Long-Lasting Phase Plate

High Throughput Fabrication Process of a Zernike Phase Plate

First Demonstration of Phase Contrast Scanning Transmission Electron Microscopy

Platform Session 10

Thursday, August 07, 2014 3:30 PM - Thursday, August 07, 2014 5:00 PM

CCC - Room 23

  • Yukinori Nagatani ;
  • Kazuyoshi Murata ;
  • Yoshitaka Kimori ;
  • Toshiaki Itoh ;
  • Zempei Saitoh ;
  • Mitsuru Ikeda ;
  • Naoyuki Miyazaki ;
  • Masahiro Ohara ;
  • Kuniaki Nagatani ;
  • Vincenzo Grillo ;
  • Ebrahim Karimi ;
  • Roberto Balboni ;
  • Gian Carlo Gazzadi ;
  • Stefano Frabboni ;
  • Erfan Mafakheri ;
  • Robert W Boyd ;
  • Marek Malac ;
  • Marco Beleggia ;
  • Ray F. Egerton ;
  • Masahiro Kawasaki ;
  • Michael Bergen ;
  • Yoshio Okura ;
  • Isamu Ishikawa ;
  • Kohei Motoki

Ultimate Recovery of Low-Frequencies in Thin-film ZPC-TEM by Inverse Projector

Innovative Phase Plates for Beam Shaping

Charging of Thin-Film Phase Plates under Electron Beam Irradiation.

Poster Session 4

Thursday, August 07, 2014 10:30 AM - Thursday, August 07, 2014 12:00 PM

CCC - Exhibit Hall AB

  • Maryam Khoshouei ;
  • Radostin Danev, MPI Biochmeistry ;
  • Günther Gerisch ;
  • Maria Ecke ;
  • Juergen Plitzko ;
  • Wolfgang Baumeister ;
  • Haixin Sui ;
  • Gregory Kishchenko ;
  • Jie He ;
  • Rebecca Fisher ;
  • Chyongere Hsieh ;
  • Michael Marko, Wadsworth Center ;
  • Manuel Dries ;
  • Simon Hettler ;
  • Björn Gamm ;
  • Erich Müller ;
  • Winfried Send ;
  • Dagmar Gerthsen ;
  • Knut Müller ;
  • Andreas Rosenauer ;
  • Irais I Santana Garcia ;
  • Christian Kisielowski ;
  • Petra Specht ;
  • Hector A Calderon ;
  • Yun-Yu Wang ;
  • John Bruley ;
  • Xing-Zhong Li ;
  • Wen-Yong Zhang ;
  • David J Sellmyer

Phase Contrast Cryo-Electron Tomography and Single Particle Analysis with a New Phase Plate.

Artifact Correction for Zernike Phase-Plate Cryo-Electron Tomography

A Nanocrystalline Hilbert Phase Plate for Phase Contrast Transmission Electron Microscopy

CIGS Nanoparticles Observed in TEM Low Dose Condition. Atomic Resolution and Beam Effects.

Dual Lens Electron Holography for High Spatial Resolution Junction and Strain Mapping of Semiconductor Devices

SAED and HREM Studies of Zr2Co11 Intermetallic Compound

A05 - 15 Years of Focused Ion Beams at M&M

  • Lucille A. Giannuzzi, L.A. Giannuzzi and Associates ;
  • Keana C.K. Scott ;
  • Nicholas Antoniou, Harvard University

Platform Session 8

Thursday, August 07, 2014 8:30 AM - Thursday, August 07, 2014 10:00 AM

CCC - Room 17

  • Pierre Sudraud ;
  • Libor Sedláček ;
  • Jolana Kološová ;
  • Jaroslav Jiruše ;
  • Fred A. Stevie ;
  • Tom Wirtz ;
  • David Dowsett ;
  • Patrick J Phillips ;
  • Hamed Parvaneh ;
  • Robert Hull ;
  • Sven Bauerdick ;
  • Jason E. Sanabia ;
  • Paul Mazarov ;
  • Joel Fridmann ;
  • Lars Bruchhaus ;
  • Ralf Jede

From Space Ion Thrusters to Nanotools

Insulator Analysis Using Combined FIB-SEM instrument with TOF-SIMS

Optimized Detection Limits in FIB-SIMS by Using Reactive Gas Flooding and High Performance Mass Spectrometers

Ion-induced Auger Electron Spectroscopy as a Potential Route to Chemical Focused-Ion Beam Tomography

Advanced Ion Source Technology for High Resolution and Stable FIB Nanofabrication Employing Gallium and New Ion Species

Platform Session 9

Thursday, August 07, 2014 1:30 PM - Thursday, August 07, 2014 3:00 PM

CCC - Room 17

  • Richard M Langford ;
  • Jonathan S Earl ;
  • Arno P. Merkle ;
  • Kim N Dalby ;
  • Henning Osholm Sørensen ;
  • Dirk Mueter ;
  • Diwaker Jha ;
  • Julio C Da Silva ;
  • Susan Louise Svane Stipp ;
  • Nabil D. Bassim ;
  • Rhonda M. Stroud ;
  • Keana C.K. Scott ;
  • Larry Nittler ;
  • Christopher Herd ;
  • Kyle Doudrick ;
  • Shanliangzi Liu ;
  • Eva M Mutunga ;
  • Kate L. Klein ;
  • Kripa K Varanasi ;
  • Konrad Rykaczewski ;
  • Robert E. A. Williams ;
  • John Sosa ;
  • Daniel Huber ;
  • Hamish L Fraser

Application of a FIB/SEM to Study the Occlusion of Dentine Tubules from a Calcium Sodium Phosphosilicate Bioactive Glass (Novamin)

From Oil Field to Ptychography: Applications of FIB SEM in NanoGeoScience

3D Nanoscale Analysis Using Focused Ion Beam Tomography of Carbonaceous Nanoglobules in Matrix Materials From the Tagish Lake Meteorite

In-situ FIB-SEM Experimentation: From Nanoscale Wetting to Nano-fabrication of Gallium-based Liquid Metals

15 Years of Characterizing Titanium Alloys' Microstructure by DBFIB

Platform Session 10

Thursday, August 07, 2014 3:30 PM - Thursday, August 07, 2014 5:00 PM

CCC - Room 17

  • Clarissa A. Wisner ;
  • Frank Bauer ;
  • Scott D Sitzman ;
  • Christian Lang ;
  • Cheryl Hartfield ;
  • Jenny Goulden ;
  • Tsengming Chou ;
  • Maureen E Williams ;
  • Konrad Rykaczewski ;
  • Jessica L Riesterer ;
  • Ron Kelley ;
  • Jaromír Kopeček ;
  • Karel Jurek ;
  • Vít Kopecký ;
  • Ladislav Klimša ;
  • Hanuš Seiner ;
  • Petr Sedlák ;
  • Michal Landa ;
  • Jiří Dluhoš ;
  • Martin Petrenec ;
  • Lukáš Hladík ;
  • Antonín Doupal ;
  • Oleg Heczko

FIB Lift Out of Columnar Carbon Structures

Advancing Materials Characterization in the FIB-SEM with Transmission Kikuchi Diffraction

Cryo-FIB Minimizes Ga+ Milling Artifacts in Sn

Integration of Cryo-FIB-SEM Imaging into Dynamic Thermo-fluidic Experimentation: Applications to Multifunctional Nanoengineered Surface Design

Ga+ Ions and Xe+ Plasma: Complementary FIBs for Resin-Embedded Life Science Sample Analyses

Xenon Focused Ion Beam in the Shape Memory Alloys Investigation – The Case of NiTi and CoNiAl.

Poster Session 4

Thursday, August 07, 2014 10:30 AM - Thursday, August 07, 2014 12:00 PM

CCC - Exhibit Hall AB

  • Eva M Mutunga ;
  • Stacey Lockerman ;
  • Shida Tan ;
  • Richard Livengood ;
  • Andras E Vladar ;
  • Kate L. Klein ;
  • Huimeng Wu ;
  • Shawn M Mcvey ;
  • David Ferranti ;
  • Chuong Huynh ;
  • John Notte ;
  • Lewis Stern ;
  • Matthew S Joens ;
  • James A. J. A. J. Fitzpatrick ;
  • Bernhard Goetze ;
  • Lucille A. Giannuzzi, L.A. Giannuzzi and Associates ;
  • Noel S Smith ;
  • Matthew Hiscock ;
  • Michael Dawson ;
  • Christian Lang ;
  • Cheryl Hartfield ;
  • Peter J Statham ;
  • Mina Abadier ;
  • Rachael L Myers-Ward ;
  • Haizheng Song ;
  • Kurt D Gaskill ;
  • Chip R Eddy ;
  • Tangali S Sudarshan ;
  • Yoosuf N. Picard, Carnegie Mellon University ;
  • Marek Skowronski ;
  • Brandon B Van Leer ;
  • Huikai Cheng ;
  • Jessica L Riesterer ;
  • In-Yong Park ;
  • Takashi Ogawa ;
  • Boklae Cho ;
  • Cheolsu Han ;
  • Ju Hwang Kim ;
  • Sang Jung Ahn ;
  • R. Prakash Kolli ;
  • Frederick Meisenkothen ;
  • Julia Huang ;
  • Xiaoyue Wang ;
  • Kathryn Grandfield ;
  • Xin Man ;
  • Tatsuya Asahata ;
  • Toshiaki Fujii ;
  • Jordan Pierce ;
  • Tyler R Harvey ;
  • Amit Agrawal ;
  • Peter Ercius ;
  • Benjamin J McMorran ;
  • Nabil D. Bassim ;
  • Joshua D Caldwell ;
  • Alexander Giles ;
  • Leonidas E Ocola ;
  • Markus Löffler ;
  • Sayanti Banerjee ;
  • Jens Trommer ;
  • Andre Heinzig ;
  • Walter Weber ;
  • Ehrenfried Zschech ;
  • Wayne Zhao ;
  • Stephen Mongeon ;
  • Bianzhu Fu ;
  • Esther Chen ;
  • Daniel Flatoff ;
  • Nicolas LaManque ;
  • Jeremy Russell ;
  • Aiden A Martin ;
  • Igor Aharonovich ;
  • Milos Toth ;
  • Na Yeon Kim ;
  • Gyeong Hee Ryu ;
  • Hyo Ju Park ;
  • Zonghoon Lee

Focused Helium Ion Beam Nanomachining of Thin Membranes vs. Bulk Substrates

Advantages of Helium and Neon Ion Beams for Intelligent Imaging

Ex-situ Lift Out of PFIB Prepared TEM Specimens

In-situ Quantification of TEM Lamella Thickness and Ga Implantation in the FIB

Site Specific TEM Specimen Preparation for Characterization of Extended Defects in 4H-SiC Epilayers

Ga+ FIB Milling and Measurement of FIB Damage in Sapphire

Blunted Tungsten Tip Cleaning by Nitrogen Gas Etching at Room Temperature without Tip Heating and Cooling

A Focused Ion Beam Specimen Preparation Method to Minimize Gallium Ion Concentration in Copper Atom-Probe Tomography Specimen Tips

FIB Preparation of Bone–Implant Interfaces for Correlative On-Axis Rotation Electron Tomography and Atom Probe Tomography

3D Atom Probe Microscopy Sample Preparation by Using L-Shape FIB-SEM-Ar Triple Beam

Efficient Diffractive Phase Optics for Electrons

Focused Ion Beam Direct-Write Nonofabrication of Surface Phonon Polariton Metamaterial Nanostructures

In-Situ Investigations of Individual Nanowires within a FIB/SEM System

3D Analytical TEM Approach to Effectively Characterize 3D-FinFET Device Features in Semiconductor Wafer-foundries

Gas-Mediated Electron Beam Induced Etching – From Fundamental Physics to Device Fabrication

An Improved Specimen Preparation of Porous Powder Materials for Transmission Electron Microscopy

A08 - Nano-Characterization of Emerging Photovoltaic Materials and Devices

  • Robert F. Klie, University of Illinois at Chicago ;
  • Moon Kim, University of Texas at Dallas

Platform Session 2

Thursday, August 07, 2014 8:30 AM - Thursday, August 07, 2014 10:00 AM

CCC - Room 15

  • Eric Colegrove ;
  • Chris Buurma ;
  • Moon Kim, University of Texas at Dallas ;
  • Robert F. Klie, University of Illinois at Chicago ;
  • Toshihiro Aoki ;
  • Liying Jiang ;
  • Andrew VG Chizmeshya ;
  • José Menéndez ;
  • John Kouvetakis ;
  • David J Smith ;
  • Alexander D Giddings ;
  • Yizhi Wu ;
  • Marcel A Verheijen ;
  • Ty J Prosa ;
  • Fred Roozeboom ;
  • David J Larson ;
  • Erwin W M M Kessels ;
  • C Buurma ;
  • Tadas Paulauskas ;
  • Z Guo ;
  • R Klie ;
  • Maria K. Y. Chan

Characterization of Poly-Crystalline CdTe Solar Cells Using Aberration-Corrected Transmission Electron Microscope

Atomic Scale Studies of Structure and Bonding in AlPSi3 Alloys Grown Lattice-Matched on Si(001)

Compositional and Structural Analysis of Al-Doped ZnO Multilayers by LEAP

Density Functional Theory Modeling of Twin Boundaries in CdTe as Informed by STEM Observations

Platform Session 3

Thursday, August 07, 2014 1:30 PM - Thursday, August 07, 2014 3:00 PM

CCC - Room 15

  • Sebastian S Schmidt ;
  • Jens Dietrich ;
  • Christoph T. Koch ;
  • Bernhard Schaffer ;
  • Miroslava Schaffer ;
  • Max Klingsporn ;
  • Saoussen Merdes ;
  • Daniel Abou-Ras ;
  • Kirstin Alberi ;
  • Brian Fluegel ;
  • Angelo Mascarenhas ;
  • C. Kisielowski ;
  • J.A. Haber ;
  • J.M. Gregoire ;
  • Y. Cai ;
  • Guang Yang ;
  • Guangzhi Hu ;
  • Shaodong Cheng ;
  • Thomas Wagberg

Interfaces and Extended Structural Defects in Chalcopyrite Thin-Film Solar Cells Studied by Transmission Electron Microscopy

Photoluminescence Imaging of Semiconductors

Probing Structure/Property Relationships of Ce-Rich Oxygen Evolution Catalysts by Advanced Transmission Electron Microscopy

Atomic Resolution Characterization of Pt Based Bi-Metallic Nano-Catalysts Using Aberration Corrected STEM

Platform Session 4

Thursday, August 07, 2014 3:30 PM - Thursday, August 07, 2014 5:00 PM

CCC - Room 15

  • Ondrej Dyck ;
  • Andrew A Herzing ;
  • Hyun Wook Ro ;
  • Dean M DeLongchamp ;
  • Benjamin H Savitzky ;
  • Kevin Whitham ;
  • Kaifu Bian ;
  • Robert Hovden ;
  • Tobias Hanrath ;
  • Lena F. Kourkoutis

Electron Energy-Loss Spectroscopic Imaging for Phase Detection in Organic Photovoltaics

Linking Processing Parameters and Morphological Development in Organic Photovoltaics by Energy-Filtered TEM Imaging of Model Multilayer Structures

Three-Dimensional Arrangement and Connectivity of Lead-Chalcogenide Nanoparticle Assemblies for Next Generation Photovoltaics

Poster Session 1

Thursday, August 07, 2014 10:30 AM - Thursday, August 07, 2014 12:00 PM

CCC - Exhibit Hall AB

  • Heayoung P. Yoon ;
  • Paul M. Haney ;
  • Joshua Schumacher ;
  • Kerry Siebein ;
  • Yohan Yoon ;
  • Nikolai B. Zhitenev ;
  • Ahmed K. Al-Kamal ;
  • Jafar Al-Sharab ;
  • Hadi Halim ;
  • Gang Xiong ;
  • Bernard H. Kear ;
  • Ivonne Carvajal ;
  • George P. Demopoulos ;
  • Raynald Gauvin ;
  • Jessica A. Alexander ;
  • Michael F. Durstock ;
  • Christopher E. Tabor ;
  • Benjamin J. Leever ;
  • Lawrence F. Drummy ;
  • Michael D. Clark ;
  • Dennis P. Butcher ;
  • Frank J. Scheltens ;
  • David W. McCOmb ;
  • Julia Deitz ;
  • Santino D Carnivale ;
  • Marc DeGraef ;
  • Yoosuf N. Picard, Carnegie Mellon University ;
  • Stephen Ringel ;
  • Tyler Grassman ;
  • David McComb ;
  • Dinghao Tang ;
  • Yeongho Kim ;
  • Nikolai Faleev ;
  • Christiana Honsberg ;
  • David J Smith

Effects of Focused-Ion-Beam Processing on Local Electrical Measurements of Inorganic Solar Cells

Duplex Nanostructured TiO2 Powder

Spatial Distribution of Light Scattering and Absorption Interactions with TiO2 - Nanoparticles from Monte Carlo and Generalized-Multiparticle-Mie based Simulations for Dye-Sensitized Solar Cell Analysis and Optimization

Investigation of the Use of Stereo-Pair Data Sets in Electron Tomography Characterization of Organic-Based Solar Cells

­Using Electron Channeling Contrast Imaging for Misfit Dislocation Characterization in Heteroepitaxial III-V/Si Thin Films

Microscopic Investigation of Mono-Layer/Multi-Layer Self-Assembled InAs QDs on GaAs1-xSbx/GaAs Composite Substrates for Photovoltaic Solar Cells

A09 - Frontiers in Analytical TEM-STEM

  • Gianluigi Botton, McMaster University ;
  • Juan-Carlos Idrobo, Oak Ridge National Laboratory ;
  • Ai Leen Koh, Standford University ;
  • Paolo Longo, Gatan Inc.

Platform Session 2

Thursday, August 07, 2014 8:30 AM - Thursday, August 07, 2014 10:00 AM

CCC - Room 22

  • Richard D Leapman ;
  • Maria A Aronova ;
  • Timothy J. Pennycook ;
  • Lewys Jones ;
  • Mariona Cabero ;
  • Alberto Ribera-Calzada ;
  • Carlos Leon ;
  • Maria Varela ;
  • Jacobo Santamaria ;
  • Peter Nellist ;
  • Eiji Okunishi ;
  • Noriaki Endo ;
  • Yukihito Kondo ;
  • Steven J Madsen ;
  • Paul J Kempen ;
  • Robert Sinclair ;
  • Paul Cueva ;
  • David A Muller

EELS and EFTEM Analysis of Biological Materials

Optical Sectioning with Atomic Resolution Spectroscopy

Atomic Column Elemental Mapping by STEM-Moiré Method

Observing Plasmon Damping Effects of Metallic Adhesion Layers in E-Beam Synthesized Nanostructures Using STEM-EELS and Raman Spectroscopy

High Resolution Optical and Vibrational Spectroscopy with Low Loss EELS

Platform Session 3

Thursday, August 07, 2014 1:30 PM - Thursday, August 07, 2014 3:00 PM

CCC - Room 22

  • Robert Colby ;
  • H.K.L. Zhang ;
  • Arda Genc ;
  • Lee Pullan ;
  • Bernd Kabius ;
  • Scott Chambers ;
  • Enzo Rotunno ;
  • Vincenzo Grillo ;
  • Toni Markurt ;
  • Thilo Remmele ;
  • Martin Albrecht ;
  • Peter Oleynikov ;
  • Yanhang Ma ;
  • Nobuhisa Fujita ;
  • Javier Garcia-Garcia ;
  • Kyung Byung Yoon ;
  • An Pang Tsai ;
  • Osamu Terasaki ;
  • Santokh Bhadare ;
  • Patrick J Phillips ;
  • Tadas Paulauskas ;
  • Robert Klie ;
  • Neil Rowlands ;
  • Alan Nicholls ;
  • Andrew M Thron ;
  • Aleksandr Polyakov ;
  • Peter (Jim) J Schuck ;
  • Shaul Aloni ;
  • Todd H Brintlinger ;
  • Andy A Herzing ;
  • Jim P Long ;
  • Rhonda M. Stroud ;
  • Igor Vurgaftman ;
  • Blake S Simpkins

The Role of Cation Intermixing, Interfacial Chemistry, and Oxygen Deficiency in Understanding the Properties of the LaFeO3/SrTiO3(100) Interface

Methods for Scanning Transmission Electron Microscopy High Angle Annular Dark Field Based for Three Dimensional Analysis of the Local Composition in Solid Alloys

Structure Analysis of a Hyper-Complex Approximant to Icosahedral Quasicrystal using 3D Electron Diffraction Tomography

Very Large Solid Angle Windowless SDD Applications for Nanostructure and Semiconductor Applications

Investigation of Surface Plasmon Coupling and Damping in Au and Ag Nanoparticle Assemblies by Monochromated Electron Energy Loss Spectroscopy

Electron-Energy Loss and Optical Spectroscopy of Hybrid Nanogap-Antennas on Different Substrates

A10 - X-ray Imaging

  • Jeffrey M. Davis, National Institute of Standards and Technology ;
  • Ric Wuhrer, University of Western Sydney ;
  • Eric Telfeyan

Platform Session 3

Thursday, August 07, 2014 8:30 AM - Thursday, August 07, 2014 10:00 AM

CCC - Room 12

  • Antoine Vandecreme ;
  • Peter Bajcsy ;
  • Nicholas W.M. Ritchie ;
  • John Henry J. Scott ;
  • Jeffrey M. Davis, National Institute of Standards and Technology ;
  • Francis B Lavoie ;
  • Nadi Braidy ;
  • Sonia Blais ;
  • Ryan Gosselin ;
  • Corrie van Hoek

Interactive Analysis of Terabyte-sized SEM-EDS Hyperspectral Images

Support Vector Machines for Classification and Quantitative Analysis

Comparison of Principal Component Analysis and Multivariate Curve Resolution-Alternating Least Squares analysis of XPS spectral maps

How to Process Zillions of Spectra from Spectral Imaging Datasets?

Poster Session 4

Thursday, August 07, 2014 10:30 AM - Thursday, August 07, 2014 12:00 PM

CCC - Exhibit Hall AB

  • Timothy D Murphy ;
  • Peter Fisher ;
  • Adam J Roper ;
  • Jason K Reynolds ;
  • Richard Wuhrer ;
  • Brian M. Patterson ;
  • Nikhilesh Chawla ;
  • Jason Williams ;
  • Xianghui Xiao ;
  • Mathew Robinson ;
  • Zachary Smith ;
  • Kevin C Henderson ;
  • Nikolaus L. Cordes ;
  • Joseph D Ferrara ;
  • Yoichi Araki ;
  • Kensaku Hamada ;
  • Kazuhiko Omote ;
  • Yoshihiro Takeda ;
  • Hendrix Demers ;
  • Nicolas Brodusch ;
  • Ken Moran ;
  • Patrick Woo ;
  • Raynald Gauvin ;
  • Leon Moran

X-ray Mapping Investigations of the Monazites from the Mt Weld Deposit - Compositional Variance as an Indicator of Provenance

In-situ Compression Imaging of Polymer Foams using Synchrotron X-ray Computed Tomography

The Use of a High-Resolution, High-Contrast X-ray Microscope to Probe the Internal Structure of Low Z Materials

X-ray Quantitative Microanalysis Maps across Interfaces of a Cu-Al Roll Bonded Laminate with an Annular Silicon Drift Detector

X-ray Mapping and Chemical Phase Mapping with an Amptek SDD

Platform Session 4

Thursday, August 07, 2014 1:30 PM - Thursday, August 07, 2014 3:00 PM

CCC - Room 12

  • Steffi Rades ;
  • Tobias Salge ;
  • Roland Schmidt ;
  • Vasile-Dan Hodoroaba ;
  • Daniel M Ruscitto ;
  • Elizabeth Cleland ;
  • Lauraine Denault ;
  • David A Wark ;
  • Nikolaus L. Cordes ;
  • Joseph Cowan ;
  • Christopher E. Hamilton ;
  • Kimberly A. Obrey ;
  • Brian M. Patterson ;
  • Si Chen

Need for Large-Area EDX Detectors for Imaging Nanoparticles in a SEM Operating in Transmission Mode

Mineral Classification Using Computer-Controlled Scanning Electron Microscopy

Quantitative Density Analysis of Ultra-Low Density Polymer Foams Using Various X-ray Imaging Techniques

Fluorescence Micro-tomography of Frozen-hydrated Whole Cells using the Bionanoprobe

A11 - Frontiers of Electron-Probe Microanalysis

  • John Armstrong, Carnegie Institution for Science ;
  • Paul Carpenter, Washington University in St. Louis ;
  • Hideyuki Takahashi, JEOL Inc ;
  • Mike Jercinovic, University of Massachusetts Amherst

Platform Session 3

Thursday, August 07, 2014 8:30 AM - Thursday, August 07, 2014 10:00 AM

CCC - Room 24

  • Xavier Llovet ;
  • Philippe T Pinard ;
  • Francesc Salvat ;
  • Paul K Carpenter ;
  • Bradley L Jolliff ;
  • John J. Donovan ;
  • Stephen M Seddio ;
  • Sarah N North-Valencia ;
  • Randy L Korotev ;
  • Ting Lin ;
  • Ed Vicenzi ;
  • Aiden A Martin ;
  • Milos Toth ;
  • Andrew Westphal ;
  • Jeff Beeman ;
  • Eugene Haller

Application of Monte Carlo Calculations to Improve Quantitative Electron Probe Microanalysis

Compositional Mapping by EPMA and μXRF

Spectrum-based Phase Mapping of Apatite and Zoned Monazite Grains using Principal Component Analysis

Using Electron-Probe Microanalysis and Quantitative Compositional Mapping to Study Lithic Clasts in Lunar Meteorites NWA 2727 and NWA 3170

Interdisciplinary X-Ray Microanalysis: From Planets and Comets to Artifacts and Fine Art

Platform Session 4

Thursday, August 07, 2014 1:30 PM - Thursday, August 07, 2014 3:00 PM

CCC - Room 24

  • Karsten Goemann ;
  • Olga V Vasyukova ;
  • Vadim S Kamenetsky ;
  • Colin M. MacRae, CSIRO-Minerals ;
  • Nick C Wilson ;
  • Julien M. Allaz ;
  • Michael J. Jercinovic ;
  • Michael L. Williams ;
  • John J. Donovan ;
  • Paul K Carpenter ;
  • John T Armstrong

Determination of Trace Elements in Quartz by Combined EPMA and CL Microspectrometry

Trace Element Analyses by EMP: Pb-in-Monazite and New Multipoint Background Method

Quantitative Electron-probe Microanalysis and WDS Background Measurement

A New EPMA Method For Fast Trace Element Analysis In Simple Matrices

Platform Session 5

Thursday, August 07, 2014 3:30 PM - Thursday, August 07, 2014 5:00 PM

CCC - Room 24

  • John T Armstrong ;
  • John J. Donovan ;
  • Jon Wade ;
  • Ben Buse ;
  • Stuart Kearns ;
  • Vasile-Dan Hodoroaba ;
  • Ryna B. Marinenko ;
  • Vanessa Rackwitz ;
  • Wolfram Bremser ;
  • Wolfgang E. S. Unger ;
  • Douglas Meier ;
  • Jeffrey M. Davis, National Institute of Standards and Technology ;
  • Frederick Meisenkothen ;
  • Scott A. Wight, National Institute of Standards and Technology ;
  • Craig S Schwandt

What's Still Missing with the Fluorescence Corrections and Should We Care?

FEG-EPMA of Solid State Redox Sensors – the Effect of Secondary Fluorescence on Analytical Precision.

Determination of the k-Values of Copper-Gold Alloys with ED- and WD-EPMA – Results of an Inter-laboratory Comparison

EPMA WDS Quality Assurance: Materials and Methods

Low Energy Microanalysis by EDS or WDS? Comparisons and Concerns from an Analytical Services Laboratory Perspective

Round Table Discussion: Moseley's Legacy at 100 Years

A13 - Practical Applications and Analytical Trends of Metallography and Microstructure

  • Frauke Hogue, Hogue Metallography ;
  • Frank Mücklich, Saarland University;

Platform Session 3

Thursday, August 07, 2014 8:30 AM - Thursday, August 07, 2014 10:00 AM

HM - Ballroom B

  • Jessica A Booth ;
  • Jennifer Carter ;
  • John Lewandowski ;
  • Katherine P Rice ;
  • Robert R. Keller ;
  • Matthew M Nowell ;
  • Stuart I Wright ;
  • Travis Rampton ;
  • René de Kloe ;
  • Ilona Müllerová ;
  • Šárka Mikmeková ;
  • Eliška Mikmeková ;
  • Zuzana Pokorná ;
  • Luděk Frank ;
  • Haibo Yu ;
  • Yu Sun ;
  • Pamir Alpay ;
  • Mark Aindow

EBSD Analysis for Microstructure Characterization of Zr-based Bulk Metallic Glass Composites

Thickness-Dependent Beam Broadening in Transmission EBSD

Advances in Scattered Electron Intensity Distribution Imaging for Microstructural Visualization and Correlations with EBSD Measurements

Exploitation of Contrasts in Low Energy SEM to Reveal True Microstructure

Characterization of the Surface Layer of Ag/W Electrical Contacts

Poster Session 1

Thursday, August 07, 2014 10:30 AM - Thursday, August 07, 2014 12:00 PM

CCC - Exhibit Hall AB

  • Jose Bernal ;
  • Abel García ;
  • Arul M Varman ;
  • Matthew D Hecht ;
  • Bryan A Webler ;
  • Yoosuf N. Picard, Carnegie Mellon University ;
  • Amith D Darbal ;
  • Win-Jin Chang ;
  • Haw-Long Lee ;
  • Yu-Ching Yang ;
  • Young Heon KIM ;
  • Francisco J Baldenebro-Lopez ;
  • Wilber Antunez-Flores ;
  • Enrique Torres-Moye ;
  • Ivanovich Estrada-Guel ;
  • Jose M Herrera-Ramírez ;
  • Cynthia D Gómez-Esparza ;
  • Roberto Martínez-Sánchez ;
  • Nabraj Bhattarai ;
  • Subarna Khanal ;
  • Daniel BAhena ;
  • Arturo Ponce ;
  • Miguel Jose-Yacaman ;
  • C. G. Garay-Reyes ;
  • I. Estrada-Guel ;
  • J.L. Hernández-Rivera ;
  • H.J. Dorantes-Rosales ;
  • J .J Cruz-Rivera ;
  • R. Martínez-Sánchez ;
  • Audel santos ;
  • Veronica Gallegos ;
  • claudia rodriguez ;
  • Hooman Yaghoobnejad Asl ;
  • Louis V. Gambino ;
  • Neal J. Magdefrau ;
  • Mark Aindow ;
  • Yaoyao Ding ;
  • Matthew Gallaugher ;
  • Nicolas Brodusch ;
  • Raynald Gauvin ;
  • Richard R Chromik

A Characterization Study of Initial Gamma Prime Phase Formation Produced by Microwave

A Novel Method for Microstructural Characterization of Cast Iron

A Method for Quantitative Analysis of Carbide Network Path Lengths in Ultrahigh Carbon Steel.

Precession Electron Diffraction Detection and Phase Mapping of Retained Austenite and Carbides in a Heat Treated Low Alloy Carbon Steel Using a JEOL ARM 200 TEM with an AppFive Topspin System for Synchronized Beam Scanning and Precession

Dynamic Analysis of Nanomachining with a Multi-Cracked AFM Cantilever

A Transmission Electron Microscopy Study on Self-Catalyzed GaAs Nanostructures

Equiatomic NiCoAlFeMoTiCrx (x= 0,1) High Entropy Alloys Produced by Mechanical Alloying

Study of Au/Pd and Au/Co Bimetallic Nanoparticles Using Aberration Corrected STEM

Study of coarsening in γ` precipitates by diffusion couples

Influence of Cooling Rate on Corrosion Resistance of the A383 Aluminum to Biofuels E10, E30 and E100

Phase Identification by EBSD Analysis of Non-Metallic Crystallites

Analysis of Titanium Microalloying in As-Received and Oxidized Crofer® 22 APU

Effect of a Coating Induced Residual Stress on Magnetic Domain Structure in Non-Oriented Electrical Steels

Platform Session 4

Thursday, August 07, 2014 1:30 PM - Thursday, August 07, 2014 3:00 PM

HM - Ballroom B

  • Gerhard Schneider ;
  • Natasha Erdman ;
  • Masateru Shibata ;
  • Tara Nylese ;
  • Loïc Sorbier ;
  • Maxime Moreaud ;
  • Frédéric Bazer-Bachi ;
  • Virginie Moizan-Basle ;
  • Lihua Zhang ;
  • Matthew A Wall ;
  • Stefan Harmsen ;
  • Charles Michael Drain ;
  • Moritz F Kircher

Automated Quantitative Materials Microscopy​

Nanoscale Crystallographic Analysis in FE-SEM Using Transmission Kikuchi Diffraction

Use of the Distance Transform for the Integration of Local Measurements: Principle and Application in the Field of Chemical Engineering

Determination on the Structure of Au Nanorods with Pentagonal Cross-Sections by Various TEM Techniques

A14 - Advances in Cathodoluminescence and Soft X-ray Microanalysis

  • Colin M. MacRae, CSIRO-Minerals ;
  • Marion A. Stevens-Kalceff, University of New South Wales ;
  • Scott A. Wight, National Institute of Standards and Technology

Platform Session 1

Thursday, August 07, 2014 8:30 AM - Thursday, August 07, 2014 10:00 AM

CCC - Room 16

  • Masami Terauchi ;
  • Simon Burgess ;
  • Xiaobing Li ;
  • James Holland ;
  • Peter Statham ;
  • Santokh Bhadare ;
  • David Birtwistle ;
  • Alan Protheroe ;
  • Patrick P Camus ;
  • Reinhard Buchhold ;
  • Nick C Wilson ;
  • Colin M. MacRae, CSIRO-Minerals ;
  • Aaron Torpy

Valence Electron State of Carbon Materials Studied by TEM-SXES

Development of Soft X-ray Microanalysis Using Windowless SDD Technology

Using Accurate Solid Angle Tools When Comparing EDS Detector Geometries

Mapping of Weak Cathodoluminescence Signals

Poster Session 1

Thursday, August 07, 2014 10:30 AM - Thursday, August 07, 2014 12:00 PM

CCC - Exhibit Hall AB

  • Norihisa Mori ;
  • Takanori Murano ;
  • Hideyuki Takahashi, JEOL Inc ;
  • Scott A. Wight, National Institute of Standards and Technology ;
  • Greg Gillen

The Present State of Chemical State Analysis in EPMA and WD-SXES

Cathodoluminescence and DART Mass Spectrometry for the Forensic Identification of Explosive and Narcotic Particle Residues on Surfaces

Platform Session 2

Thursday, August 07, 2014 1:30 PM - Thursday, August 07, 2014 3:00 PM

CCC - Room 16

  • John M Hanchar ;
  • Paul R Edwards ;
  • Michael J Wallace ;
  • Gunnar Kusch ;
  • Gunasekar Naresh-Kumar ;
  • Jochen Bruckbauer ;
  • Carol Trager-Cowan ;
  • Kevin P O'Donnell ;
  • Robert W Martin ;
  • Colin M. MacRae, CSIRO-Minerals ;
  • Nick C Wilson ;
  • Aaron Torpy ;
  • Mark Pownceby ;
  • John Hanchar ;
  • Cameron Davidson ;
  • Victor Hugo

Cathodoluminescence Spectra Acquisition Using an Imaging Spectrograph and CCD Detector: Materials Ccharacterization Using Trivalent REE Doped Synthetic and Natural Materials

Cathodoluminescence Hyperspectral Imaging of Nitride Semiconductors: Introducing New Variables.

Zircon Metamictisation Study by Cathodoluminescence and X-ray Imaging

Platform Session 3

Thursday, August 07, 2014 3:30 PM - Thursday, August 07, 2014 5:00 PM

CCC - Room 16

  • Marion A. Stevens-Kalceff, University of New South Wales ;
  • Jens Götze ;
  • Jolana Kološová ;
  • Jaroslav Jiruše ;
  • Colin M. MacRae, CSIRO-Minerals ;
  • Nick C Wilson ;
  • Aaron Torpy ;
  • Steven Kidder ;
  • Zhongsheng Li ;
  • Claudio Delle Piane ;
  • David Dewhurst ;
  • Michael Gaft ;
  • Christoph Lenz ;
  • John M Hanchar ;
  • Gerard Barmarin ;
  • Lutz Nasdala

Cathodoluminescence Microanalysis of Amorphised Quartz

Novel Cathodoluminescence Detector with Extremely Large Field of View

Quartz Overgrowths in Shales and Sandstones studied by EPMA and SIMS

Luminescence Database: An Update