Monday

A01 - Oliver Wells Memorial Symposium on the Scanning Electron Microscope

  • Lynne M. Gignac, IBM T. J. Watson Research Center ;
  • David C. Joy, University of Tennessee ;
  • Brendan J. Griffin, University of Western Australia

Platform Session 1

Monday, August 04, 2014 1:30 PM - Monday, August 04, 2014 3:00 PM

CCC - Room 24

  • David C. Joy, University of Tennessee ;
  • Lynne M. Gignac, IBM T. J. Watson Research Center ;
  • Michael Postek ;
  • Andras E Vladar ;
  • Bin Ming ;
  • Yanbo Zou ;
  • Peng Zhang ;
  • ShiFeng Mao ;
  • ZeJun Ding ;
  • Christopher M. Breslin ;
  • Jemima Gonsalves ;
  • Franco Stellari ;
  • Chung-Chin Lin

Oliver Wells (1931-2013) A Brief Memorial

Oliver C. Wells’ Vision: Use of Low-Loss Electrons to Enhance and Measure the Surface Detail in the Scanning Electron Microscope at High Resolution

Model-Based Library for Critical Dimension Metrology by CD-SEM

High Energy BSE/SE/STEM Imaging of 8 um Thick Semiconductor Interconnects

Poster Session 1

Monday, August 04, 2014 3:30 PM - Monday, August 04, 2014 5:00 PM

CCC - Exhibit Hall AB

  • Yoichiro Hashimoto ;
  • Toshiyuki Yokosuka ;
  • Hiroyuki Ito ;
  • Shuichi Takeuchi ;
  • Masahiro Sasajima ;
  • Mitsuru Konno ;
  • Takeshi Otsuka ;
  • Motohiro Nakamura ;
  • Ken-ichi Yamashita ;
  • Masaya Hara ;
  • Felix Timischl ;
  • Kazuhiro Honda ;
  • Masato Kudo ;
  • Shin-ichi Kitamura ;
  • Nicolas Brodusch ;
  • Hendrix Demers ;
  • Raynald Gauvin ;
  • Pavel Čudek ;
  • Josef Jirák ;
  • Vilém Nedla ;
  • Joel Lammatao ;
  • Lisa Chan ;
  • Tony Owens ;
  • Marc DeGraef ;
  • Yoosuf N. Picard, Carnegie Mellon University ;
  • Arome Oyibo ;
  • David M Holburn ;
  • Bernie C Breton ;
  • An Li ;
  • Nicholas H M Caldwell ;
  • Josh M Lovell ;
  • William A Mackie ;
  • Todd W Curtis ;
  • Gerald G Magera

Study About Interpretation of Energy-Filtered BSE Image at Ultra Low Voltage Condition.

SEM Image Observation Using an Electron Energy, and Electron Take-off Angle Filtered Detector.

Ionic Liquid Used for Charge Compensation for High-Resolution Imaging and Analysis in the FE-SEM

Optimization of Signal Detection in Scintillation Secondary Electron Detector for ESEM and SEM.

Measuring the Strain Sensitivity in Si (001) Electron Channeling Patterns Using Higher-order Laue Zone Line Shifts

Quantifying the Effect of Drilling Fluid Contamination on Cement Formation Hydraulic Bond Using Scanning Electron Microscopy

The Application of GPGPU to Automatic Electron Gun Alignment in the Scanning Electron Microscope

Use of HfC(310) as a High Brightness Electron Sources for Advanced Imaging Applications.

A04 - Electron Holography at the Atomic Scale and the Nanoscale

  • M.R. McCartney, Arizona State University ;
  • N. Osakabe, Hitachi Ltd

Platform Session 1

Monday, August 04, 2014 1:30 PM - Monday, August 04, 2014 3:00 PM

HM - Ballroom B

  • Hannes Lichte ;
  • Felix Boerrnert ;
  • Bernd Einenkel ;
  • Andreas Lenk ;
  • Axel Lubk ;
  • Falk Roeder ;
  • Jan Sickmann ;
  • Sebastian Sturm ;
  • Karin Vogel ;
  • Daniel Wolf ;
  • Daisuke Shindo ;
  • Zentaro Akase ;
  • Hyun Soon Park ;
  • Ken Harada ;
  • Hiroto Kasai ;
  • Shawn Pollard ;
  • Marek Malac ;
  • Marco Beleggia ;
  • Masahiro Kawasaki ;
  • Yimei Zhu, Brookhaven National Laboratory

Electron Holography in Solids: Problems and Progress

Collective Motion of Secondary Electrons Visualized by Electron Holography

Accumulated Reconstruction Method for Electron Holography

Magnetic Imaging with a Novel Hole-Free Phase Plate.

Poster Session 1

Monday, August 04, 2014 3:30 PM - Monday, August 04, 2014 5:00 PM

CCC - Exhibit Hall AB

  • Ruriko Tsuneta ;
  • Masaki Ikeda ;
  • Shiano Ono ;
  • Miyuki Yamane ;
  • Akira Sugawara ;
  • Ken Harada ;
  • Masanari Koguchi ;
  • Axel Lubk ;
  • Daniel Wolf ;
  • Falk Röder ;
  • Hannes Lichte ;
  • Cigdem Ozsoy Keskinbora ;
  • Chris B. Boothroyd ;
  • Rafal E. Dunin-Borkowski ;
  • Peter A. van Aken ;
  • Christoph T. Koch ;
  • Teruo Kohashi ;
  • Tomohiro Iwane ;
  • Manabu Shirai ;
  • Toshiaki Tanigaki ;
  • Shinji Aizawa ;
  • Hyun Soon Park ;
  • Tsuyoshi Matsuda ;
  • Daisuke Shindo ;
  • Amir Hossein Tavabi ;
  • Vadim Migunov ;
  • Alexey Savenko ;
  • Azadeh Akhtari-Zavareh ;
  • Louis P Carignan ;
  • Arthur Yelon ;
  • David Menard ;
  • Takeshi Kasama ;
  • Rodney Herring ;
  • Martha McCartney ;
  • Karen L Kavanagh ;
  • Yoshifumi Taniguchi ;
  • Hiroaki Matsumoto ;
  • Desai Zhang ;
  • David J Smith ;
  • Martha R McCartney ;
  • Justin M Shaw ;
  • Taeho Roy Kim ;
  • Ai Leen Koh, Standford University ;
  • Robert Sinclair ;
  • Sadegh Yazdi ;
  • Alexander Berg ;
  • Marco Beleggia ;
  • Magnus T. Borgstrom ;
  • Jakob B. Wagner ;
  • Jesus Cantu-Valle ;
  • Francisco Ruiz-Zepeda ;
  • Ulises Santiago ;
  • Fernando Mendoza-Santoyo ;
  • Miguel Jose-Yacaman ;
  • Arturo Ponce ;
  • David W Shook ;
  • Benjamin J McMorran

Vector Field Tomography by Electron Holography

Electron Holographic Tomography of Mean Free Path Lengths at the nm-scale

Hybridization of Off-Axis and In-line High-Resolution Electron Holography

Superposition of Fraunhofer Diffractions from Fork-Shaped Gratings and their Openings with Electron Vortex Beam

Investigation of Effect of Electron Irradiation on Ionic Liquid Using Electron Holography

Electron Holography of the Magnetic Phase Shift of a Current-Carrying Wire

Magnetic Characterization of Isolated CoFeB/Cu Nanowires by Off-Axis Electron Holography

Lens-Less Foucault Imaging (LLFI) Method for Observing Magnetic Domain Walls

Study of Magnetic Domain Structure in Co(Fe)/Pd Multilayers using Off-axis Electron Holography

Imaging Perpendicular Magnetic Domains in Plan-view Using Lorentz Transmission Electron Microscopy

Evaluation of Doping in GaP Core-Shell Nanowire pn Junction by Off-Axis Electron Holography

Characterization of Metallic and Bimetallic Nanoparticles by Off-Axis Electron Holography

Propagation of Free Electrons Carrying Orbital Angular Momentum Through Magnetic Lenses.

A07 - Microscopy and Spectroscopy for Power Generation and Energy Storage

  • Torsten Schwarz, Max-Planck-Insitut für Eisenforschung GmbH ;
  • Eva Olsson, Chalmers University

Platform Session 1

Monday, August 04, 2014 1:30 PM - Monday, August 04, 2014 3:00 PM

CCC - Room 15

  • Torsten Schwarz, Max-Planck-Insitut für Eisenforschung GmbH ;
  • Oana Cojocaru-Mirédin ;
  • Pyuck-Pa Choi ;
  • Anke Lämmle ;
  • Roland Würz ;
  • Marina Mousel ;
  • Alex Redinger ;
  • Susanne Siebentritt ;
  • Silvana Botti ;
  • Dierk Raabe ;
  • Wei Zhang ;
  • Kristopher Davis ;
  • Winston Schoenfeld ;
  • Patrick Looney ;
  • Feng Wang, Brookhaven National Laboratory ;
  • Stefan Gustafsson ;
  • Olof Bäcke ;
  • Samira Nik ;
  • Anke Sanz-Velasco ;
  • Camilla Lindqvist ;
  • Ergang Wang ;
  • Mats R Andersson ;
  • Christian Müller ;
  • Eva Olsson, Chalmers University ;
  • Frank J. Scheltens ;
  • Michael F. Durstock ;
  • Christopher E. Tabor ;
  • Benjamin J. Leever ;
  • Lawrence F. Drummy ;
  • Michael D. Clark ;
  • Dennis P. Butcher ;
  • Jessica A. Alexander ;
  • David W. McComb ;
  • Vasile-Dan Hodoroaba ;
  • Thomas Wirth ;
  • Ralf Terborg ;
  • Kyung Joong Kim ;
  • Wolfgang E. S. Unger

Nano-scale Characterization of Thin-Film Solar Cells

STEM-EELS Studies of Coordination at Al2O3/Si interfaces in Si Solar Cells

Electron Microscopy of Organic Solar Cells Thermally Stabilized with Fullerene Nucleating Agents

Monochromated Electron Energy-Loss Spectroscopy Spectrum Imaging of Organic Photovoltaic Devices.

Measurement of atomic fractions in Cu(In,Ga)Se2 films by Auger Electron Spectroscopy (AES) and Energy Dispersive Electron Probe Microanalysis (ED-EPMA)

Poster Session 1

Monday, August 04, 2014 3:30 PM - Monday, August 04, 2014 5:00 PM

CCC - Exhibit Hall AB

  • Dietrich Haeussler ;
  • Lothar Houben ;
  • Rafal E. Dunin-Borkowski ;
  • Stephanie Essig ;
  • Frank Dimroth ;
  • Wolfgang Jäger, Christian Albrechts University ;
  • Diego Gardini ;
  • Peter M Mortensen ;
  • Hudson W P Carvalho ;
  • Christian D Damsgaard ;
  • Jan-Dierk Grunwaldt ;
  • Peter A Jensen ;
  • Anker D Jensen ;
  • Jakob B. Wagner ;
  • Liuxian Zhang ;
  • Peter Crozier ;
  • Haoran Yu ;
  • Paul Plachinda ;
  • Liang Zhang ;
  • Miomir Vukmirovic ;
  • Stoyan Bliznakov ;
  • Meng Li ;
  • Radenka Maric ;
  • Radoslav Adzic ;
  • Prashant Kumar ;
  • Jong Seok Jeong ;
  • Bahman Elyassi ;
  • Nafiseh Rajabbeigi ;
  • Michael Tsapatsis ;
  • Andre K Mkhoyan ;
  • Matthias Meffert ;
  • Philipp Müller ;
  • Heike Störmer ;
  • Lana-Simone Unger ;
  • Christian Niedrig ;
  • Stefan F Wagner ;
  • Saim Saher ;
  • Henny JM Bouwmeester ;
  • Ellen Ivers-Tiffée ;
  • Dagmar Gerthsen ;
  • Shuyi Zhang ;
  • Michael Katz ;
  • Xianfeng Du ;
  • George Graham ;
  • Xiaoqing Pan ;
  • Aaron C Jackson ;
  • Yifan Li ;
  • Jacob R Nyzaka ;
  • Yossef A Elabd ;
  • Daniel M Knauss ;
  • Frederick L Beyer ;
  • Scott D Walck ;
  • Lis G. de A. Melo ;
  • Vincent Lee ;
  • Darija Susac ;
  • Viatcheslav Berejnov ;
  • Juergen Stumper ;
  • Gianluigi A Botton ;
  • Adam P Hitchcock ;
  • Davide Deiana ;
  • Arnau Verdaguer-Casadeval ;
  • Patricia Hernandez-Fernandez ;
  • Federico Masini ;
  • Christian Strebel ;
  • David N. McCarthy ;
  • Ander Nierhoff ;
  • Jane H. Nielsen ;
  • Ifan E. L. Stephens ;
  • Ib Chorkendorff ;
  • Thomas W. Hansen ;
  • Goran Drazic ;
  • Marjan Bele ;
  • Andraz Pavlisic ;
  • Primoz Jovanovic ;
  • Milena Zorko ;
  • Nejc Hojnik ;
  • Barbara Jozinovic ;
  • Miran Gaberscek ;
  • Dalaver H Anjum ;
  • Lidong Li ;
  • Somaye Rasouli ;
  • Jonathan Sharman ;
  • Alex Martinez ;
  • Dash Fongalland ;
  • Graham Hards ;
  • Tomokazu Yamamoto ;
  • Deborah Myers ;
  • Kenji Higashida ;
  • Paulo J Ferreira ;
  • Kang Yu ;
  • Daniel J Groom ;
  • Xiaoping Wang ;
  • Zhiwei Yang ;
  • Mallika Gummalla ;
  • Sarah C Ball ;
  • Deborah J Myers ;
  • Jae Hyuck Jang ;
  • Qian He ;
  • Donovan N Leonard ;
  • Albina Y Borisevich ;
  • Young-Min Kim ;
  • Amit Kumar ;
  • Sergei V. Kalinin

Analyses of Interfaces in Wafer-Bonded Tandem Solar Cells by Aberration-Corrected STEM and EELS

Electron Microscopy Study of the Deactivation of Nickel Based Catalysts for Bio Oil Hydrodeoxygenation

Atomic Level In-situ Characterization of Metal/TiO2 Photocatalysts under Light Irradiation in Water Vapor

Evaluation of Phase Segregation in Ternary Pt-Rh-SnO2 Catalysts Prepared from the Vapor Phase

Probing Structure-Property Relationship of Active Metal Nanoparticles on Mesoporous Silica Sorbent

Effect of Yttrium (Y) and Zirconium (Zr) Doping on the Thermodynamical Stability of the Cubic Ba0.5Sr0.5Co0.8Fe0.2O3-δ Phase

Observation of Pt-Atom Complexes in CaTi1-xPtxO3-δ

HAADF STEM of Phase Separated Anion Exchange Membranes Prepared by Ultracryomicrotomy

Effects of Sample Preparation Technique on Quantitative Analysis of Automotive Fuel Cell Catalyst Layers

Local Composition of Alloy Catalysts for Oxygen Reduction by STEM-EDS

In-situ TEM and Atomic-Resolution STEM Study of Highly Active Partially Ordered Cu3Pt Nanoparticles Used as PEM-Fuel Cells Catalyst

STEM-EDS Characterization of Platinum-Modified Nickel Nanoparticles

Aberration Corrected STEM Study on Pt0.8Ni De-alloyed Nanocatalysts for Proton Exchange Membrane Fuel Cells

Degradation Mechanisms of Platinum Nanoparticle Catalysts in Proton Exchange Membrane Fuel Cells: The Role of Particle Size

Uncovering Structure-Properties Relations in Fuel Cells and Catalysts with Quantitative Aberration-Corrected STEM and EELS

A16 - Correlative Microscopy and Microanalysis from Macro to Pico

  • Brian P. Gorman, Colorado School of Mines ;
  • Christoper J. Gilpin, Purdue University ;
  • Mor Baram, McMaster University

Platform Session 1

Monday, August 04, 2014 1:30 PM - Monday, August 04, 2014 3:00 PM

CCC - Room 21

  • Harvey Guthrey ;
  • Steve Johnston ;
  • Brian Gorman ;
  • Mowafak Al-Jassim ;
  • Ann N Chiaramonti ;
  • Jeffrey W Sowards ;
  • Daniel K Schreiber ;
  • James R Fekete ;
  • Michael Engstler ;
  • Jenifer Barrirero ;
  • Naureen Ghafoor ;
  • Magnus Odén ;
  • Frank Mücklich, Saarland University; ;
  • Subhashish Meher ;
  • Peeyush Nandwana ;
  • Tanaporn Rojhirunsakool ;
  • Rajarshi Banerjee ;
  • Yufeng Zheng ;
  • Robert E. A. Williams ;
  • Soumya Nag

Characterization of Photovoltaics: From Cells Properties to Atoms

Understanding the High-Temperature Mechanical Properties of A710 (HSLA-80) Steel With Use of Complementary Atom Probe Tomography and Electron Microscopy

3D Microstructure Characterization and Analysis of Al-Si Foundry Alloys at Different Length Scales

Probing the Crystallography of Ordered Phases by Coupling Orientation Microscopy and Atom Probe Tomography

Investigation of Possible Nucleation Mechanisms for Producing an Ultra-Refined Alpha Phase Microstructure in Beta Titanium Alloys Using High-Resolution Electron Microscopy and 3D Atom Probe Tomography

A17 - Extended Crystal Defects: Quantification of Strain, Local Atomic Structure and Chemistry

  • Douglas L. Medlin, Sandia National Laboratories ;
  • Jim Ciston Lawrence, Berkeley National Laboratory ;
  • Yoosuf N. Picard, Carnegie Mellon University

Platform Session 1

Monday, August 04, 2014 1:30 PM - Monday, August 04, 2014 3:00 PM

CCC - Room 12

  • C. Barry Carter ;
  • Marc DeGraef ;
  • Carol Trager-Cowan ;
  • G. Naresh-Kumar ;
  • Nouf Allehiani ;
  • Simon Kraeusel ;
  • Ben Hourahine ;
  • Stefano Vespucci ;
  • David Thomson ;
  • Jochen Bruckbauer ;
  • Gunnar Kusch ;
  • Paul R Edwards ;
  • Rob W Martin ;
  • Christof Mauder ;
  • Austin P Day ;
  • Aimo Winkelmann ;
  • Arantxa Vilalta-Clemente ;
  • Angus J Wilkinson ;
  • Peter J Parbrook ;
  • Menno J Kappers ;
  • Michelle A Moram ;
  • Rachel A Oliver ;
  • Colin J Humphreys ;
  • Philip Shields ;
  • Emmanuel D Le Boulbar ;
  • Dima Maneuski ;
  • Val O'Shea ;
  • Ken P Mingard

Imaging Extended Defects by TEM

Towards a Uniform Model for Lattice Defect Image Simulations

Electron Channeling Contrast Imaging of Defects in III-Nitride Semiconductors

Poster Session 1

Monday, August 04, 2014 3:30 PM - Monday, August 04, 2014 5:00 PM

CCC - Exhibit Hall AB

  • Michael B Katz ;
  • Mark E Twigg ;
  • Sergey I Maximenko ;
  • Nabil D. Bassim ;
  • Nadeem A Mahadik ;
  • Glenn G Jernigan ;
  • Chad L Canedy ;
  • Joshua Abell ;
  • Chaffra A Affouda ;
  • Amith D Darbal ;
  • Raman D Narayan ;
  • Catherine Vartuli ;
  • Toshi Aoki ;
  • John Mardinly ;
  • Stavros Nicolopoulos ;
  • Jon Karl Weiss ;
  • Noriaki Endo ;
  • Yukihito Kondo ;
  • Juntao Li ;
  • Kangguo Cheng ;
  • Ali Khakifirooz ;
  • Junli Wang ;
  • Alexander Reznicek ;
  • Anita Madan ;
  • Bruce Doris ;
  • Nicolas Loubet ;
  • Hong He ;
  • John Gaudiello ;
  • Wenpei Gao ;
  • Jian-Min Zuo ;
  • Hasti Asayesh-Ardakani ;
  • Mincong Liu ;
  • Yoosuf N. Picard, Carnegie Mellon University

Electron Channeling Contrast Imaging for Non-Destructive Analysis of Extended Defects in Semiconductor Thin Films and Device Structures

Applications of Automated High Resolution Strain Mapping in TEM on the Study of Strain Distribution in MOSFETs

Accuracy of Strain in Strain Maps Improved by Averaging Multiple Maps

Strain Quantification Analysis of Epitaxial SiGe on SOI by Nanobeam Diffraction (NBD)

Measurement of Local Atomic Displacements Reveals Interaction of Au Nanocrystals with Rutile (TiO2) Surface Steps

Atomic Resolution Study of Local Strains in Doped VO2 Nanowires

Strain Associated with Surface-Penetrating Dislocations Visible by Electron Channeling Contrast Imaging

A18 - Vendor Symposium: New Tools for Life and Materials Sciences

  • Alice C. Dohnalkova, Pacific Nortwest National Laboratory ;
  • Elizabeth R. Wright, Emory University ;
  • Mark A. Sanders, University of Minnesota

Platform Session 1

Monday, August 04, 2014 1:30 PM - Monday, August 04, 2014 3:00 PM

CCC - Room 25

  • Madeline J Dukes ;
  • Albert D. Dukes ;
  • Kate L. Klein ;
  • Rebecca L. Thomas ;
  • Deborah F. Kelly ;
  • John Damiano ;
  • Christian Theriault ;
  • Jessica Guttenfelder ;
  • Craig B Arnold ;
  • Thomas J Tague ;
  • Robert A Heintz ;
  • Mark J Wall ;
  • Jennifer L Ramirez ;
  • Richard Price ;
  • Brad Matola ;
  • David C. Joy, University of Tennessee

Applications and Design of Reinforced Silicon Nitride Windows for In-Situ Liquid Transmission Electron Microscopy

TAG Lens: Revolutionizing Optical Microscopy With Ultra-High Speed Variable Focus

A Novel Compact Stand-alone FTIR Microscope for the Analysis of Small Samples

Rapid, High-Resolution Raman Imaging of Pharmaceutical, Biological, and Other Materials with the Thermo Scientific DXRxi.

The Unique Capabilities of Auger Electron Spectroscopy

Secondary Electron Imaging in the Helium Ion Microscope

Poster Session 1

Monday, August 04, 2014 3:30 PM - Monday, August 04, 2014 5:00 PM

CCC - Exhibit Hall AB

  • Keith Thompson ;
  • Noriyuki Inoue ;
  • Ronald Vane ;
  • C. A. Moore ;
  • Markus Bornschlegl ;
  • Adrian Niculae ;
  • Heike Soltau ;
  • Rouven Eckhardt ;
  • Kathrin Hermenau ;
  • Kolawole Bello ;
  • Mileva Radonjic ;
  • Fernandp Godinez ;
  • Omar Solorza-Feria ;
  • Christian Kisielowski ;
  • Petra Specht ;
  • Hector A Calderon ;
  • John M Miller ;
  • Daan Hein Alsem ;
  • Norman Salmon ;
  • Nils Johnson ;
  • James Hutchison ;
  • Johannes Mulders ;
  • Piet Trompenaars ;
  • Erik Bosch ;
  • Remco Geurts ;
  • Ralf Terborg ;
  • Vasile-Dan Hodoroaba ;
  • Meiken Falke ;
  • Andi Käppel ;
  • Robin Cantor ;
  • Hideo Naito ;
  • Andreas Liebel ;
  • Niculae Adrian ;
  • S Kawai ;
  • I Onishi ;
  • T Ishikawa ;
  • K Yagi ;
  • T Iwama ;
  • K Miyatake ;
  • Y Iwasawa ;
  • M Matsushita ;
  • T Kaneyama ;
  • Y Kondo ;
  • Masashi Nojima ;
  • Masato Suzuki ;
  • Tatsuya Adachi ;
  • Sam Hotta ;
  • Makiko Fujii ;
  • Toshio Seki ;
  • Jiro Matsuo ;
  • Yusuke Ominami ;
  • Shinsuke Kawanishi ;
  • Tatsuo Ushiki ;
  • Sukehiro Ito ;
  • Andrew J McCulloch ;
  • Yoann Bruneau ;
  • Guyve Khalili ;
  • Daniel Comparat ;
  • Sean Mulligan ;
  • Tilak Jain ;
  • Erika Duggan ;
  • Er Liu ;
  • Jeffrey A Speir ;
  • Anchi Cheng ;
  • John Nolan ;
  • Bridget Carragher ;
  • Clinton S Potter ;
  • Ty J Prosa ;
  • Brian P Geiser ;
  • Robert M Ulfig ;
  • Thomas F Kelly ;
  • David J Larson

Are EDS Specifications Still Relevant

Introduction of a New Conventional SEM: JSM-IT300LV: The Observation of a Water Containing Specimen with a Cooling Stage at 650 Pa.

Advancements in Decontamination of Vacuum Systems Using Plasma Cleaning

Measurement of Downstream Charge Transport During Plasma Cleaning of Vacuum Chambers

New X-ray Transparent and Light Tight Windows for EDS Detectors

Geochemical Evaluation of Geopressured Geothermal Wellbore Cement

Atomic Resolution Characterization of Ni-base Nanoparticles for Energy Devices.

Functionalized Surfaces to Improve Imaging Conditions in Liquid Cell Transmission Electron Microscopy

A New In-situ Broad Ion Beam, With Energy Range 1 – 500 eV

On the Characterization of the Geometrical Collection Efficiency of Modern EDS Systems

Ultrahigh-Resolution X-ray Microanalysis with a Cryogen-Free Microcalorimeter Spectrometer

Solid State Backscattered Electron Detectors with Improved Image Contrast and Detection Speed

A Double Silicon Drift Type Detector System for EDS with Ultrahigh Efficiency and Throughput for TEM

Development of Au-GCIB Dynamic SIMS and Cluster Size Filtering System

Observation of Wet Samples Using a Novel Atmospheric Scanning Electron Microscope

High-Flux Monochromatic Electron and Ion Beams from Laser Cooled Atoms

Typhon: Multiplexed TEM Sample Preparation

Measurement of Detection Efficiency in Atom Probe Tomography