Complete Listing

A01 - Oliver Wells Memorial Symposium on the Scanning Electron Microscope

  • Lynne M. Gignac, IBM T. J. Watson Research Center ;
  • David C. Joy, University of Tennessee ;
  • Brendan J. Griffin, University of Western Australia

Platform Session 1

Monday, August 04, 2014 1:30 PM - Monday, August 04, 2014 3:00 PM

CCC - Room 24

  • David C. Joy, University of Tennessee ;
  • Lynne M. Gignac, IBM T. J. Watson Research Center ;
  • Michael Postek ;
  • Andras E Vladar ;
  • Bin Ming ;
  • Yanbo Zou ;
  • Peng Zhang ;
  • ShiFeng Mao ;
  • ZeJun Ding ;
  • Christopher M. Breslin ;
  • Jemima Gonsalves ;
  • Franco Stellari ;
  • Chung-Chin Lin

Oliver Wells (1931-2013) A Brief Memorial

Oliver C. Wells’ Vision: Use of Low-Loss Electrons to Enhance and Measure the Surface Detail in the Scanning Electron Microscope at High Resolution

Model-Based Library for Critical Dimension Metrology by CD-SEM

High Energy BSE/SE/STEM Imaging of 8 um Thick Semiconductor Interconnects

Poster Session 1

Monday, August 04, 2014 3:30 PM - Monday, August 04, 2014 5:00 PM

CCC - Exhibit Hall AB

  • Yoichiro Hashimoto ;
  • Toshiyuki Yokosuka ;
  • Hiroyuki Ito ;
  • Shuichi Takeuchi ;
  • Masahiro Sasajima ;
  • Mitsuru Konno ;
  • Takeshi Otsuka ;
  • Motohiro Nakamura ;
  • Ken-ichi Yamashita ;
  • Masaya Hara ;
  • Felix Timischl ;
  • Kazuhiro Honda ;
  • Masato Kudo ;
  • Shin-ichi Kitamura ;
  • Nicolas Brodusch ;
  • Hendrix Demers ;
  • Raynald Gauvin ;
  • Pavel Čudek ;
  • Josef Jirák ;
  • Vilém Nedla ;
  • Joel Lammatao ;
  • Lisa Chan ;
  • Tony Owens ;
  • Marc DeGraef ;
  • Yoosuf N. Picard, Carnegie Mellon University ;
  • Arome Oyibo ;
  • David M Holburn ;
  • Bernie C Breton ;
  • An Li ;
  • Nicholas H M Caldwell ;
  • Josh M Lovell ;
  • William A Mackie ;
  • Todd W Curtis ;
  • Gerald G Magera

Study About Interpretation of Energy-Filtered BSE Image at Ultra Low Voltage Condition.

SEM Image Observation Using an Electron Energy, and Electron Take-off Angle Filtered Detector.

Ionic Liquid Used for Charge Compensation for High-Resolution Imaging and Analysis in the FE-SEM

Optimization of Signal Detection in Scintillation Secondary Electron Detector for ESEM and SEM.

Measuring the Strain Sensitivity in Si (001) Electron Channeling Patterns Using Higher-order Laue Zone Line Shifts

Quantifying the Effect of Drilling Fluid Contamination on Cement Formation Hydraulic Bond Using Scanning Electron Microscopy

The Application of GPGPU to Automatic Electron Gun Alignment in the Scanning Electron Microscope

Use of HfC(310) as a High Brightness Electron Sources for Advanced Imaging Applications.

Platform Session 2

Tuesday, August 05, 2014 8:30 AM - Tuesday, August 05, 2014 10:00 AM

CCC - Room 24

  • Fabian Pease ;
  • Eric Lifshin ;
  • Brendan J. Griffin, University of Western Australia ;
  • David C. Joy, University of Tennessee ;
  • Joseph R Michael

Oliver Wells: My Recollections​

Improved SEM Image Resolution Through the Use of Image Restoration Techniques

Ollie was Right! A Review of Angular Dependence, Detector Bandwidth and Sample Preparation on Contrast in Secondary and Backscattered Electron Images in the SEM

Platform Session 3

Tuesday, August 05, 2014 10:30 AM - Tuesday, August 05, 2014 12:00 PM

CCC - Room 24

  • Raynald Gauvin ;
  • Nicolas Brodusch ;
  • Hendrix Demers ;
  • Patrick Woo ;
  • Iwona Jozwik-Biala ;
  • Kacper Grodecki ;
  • Jacek Baranowski ;
  • Wlodzimierz Strupinski ;
  • Iwona Pasternak ;
  • Aleksandra Krajewska ;
  • Natasha Erdman ;
  • Vern Robertson ;
  • Masateru Shibata ;
  • Lucille A. Giannuzzi, L.A. Giannuzzi and Associates

High Resolution Imaging in the Field Emission Scanning Electron Microscope at Low Accelerating Voltage and with Energy-Filtration of the Electron Signals

Low-kV SEM Imaging of Epitaxial Graphene Grown on Various Substrates.

Ultra Low Voltage Secondary and Backscatter Imaging in FE-SEM – Successes and Challenges

Discussion of Electron Induced Atomic Number Contrast

Platform Session 4

Tuesday, August 05, 2014 1:30 PM - Tuesday, August 05, 2014 3:00 PM

CCC - Room 24

  • Donovan N Leonard ;
  • Dan Gardiner ;
  • Rebecca L. Thomas ;
  • Kayla XT Nguyen ;
  • Justin Richmond-Decker ;
  • Megan E Holtz ;
  • Yonat Milstein ;
  • David A Muller ;
  • Andreas Liebel ;
  • Gerhard Lutz ;
  • Udo Weber ;
  • Adrian Niculae ;
  • Heike Soltau ;
  • Zhu Ruan ;
  • Min Zhang ;
  • Rongguang Zeng ;
  • Bo Da ;
  • Yi Ming ;
  • Shifeng Mao ;
  • Zejun Ding ;
  • Yusuke Ominami ;
  • Masato Nakajima ;
  • Tatsuo Ushiki ;
  • Sukehiro Ito

SEM Through Dielectric Membranes: Secondary Electron Contrast Reversal

Spatial Resolution of Scanning Electron Microscopy Without a Vacuum Chamber

A Detector for Fast Electron Current Measurements based on Silicon Drift Detector Technology

Quantum Monte Carlo Simulation for Atomic Resolution SEM/STEM Image

A Novel Transmission Electron Imaging Technique for Observation of Whole Cells

A02 - Advances in Imaging and Spectroscopy in STEM

  • Nigel D. Browning, Pacific Nortwest National Laboratory ;
  • Peter D. Nellist, University of Oxford ;
  • Maria Varela del Arco, Oak Ridge National Laboratory

Platform Session 1

Tuesday, August 05, 2014 8:30 AM - Tuesday, August 05, 2014 10:00 AM

CCC - Room 14

  • Stephen J. Pennycook ;
  • Ryo Ishikawa ;
  • Andrew Lupini ;
  • Scott D. Findlay ;
  • Rohan Mishra ;
  • Sokrates T. Pantelides ;
  • Jinwoo Hwang ;
  • Jack Y Zhang ;
  • Adrian D'Alfonso ;
  • Lelie J Allen ;
  • Susanne Stemmer ;
  • Gabriel Sanchez-Santolino ;
  • Javier Tornos ;
  • Mariona Cabero ;
  • Maria Varela ;
  • Javier Garcia-Barriocanal ;
  • Carlos Leon ;
  • Jacobo Santamaria ;
  • Robert Klie ;
  • Ahmet Gulec ;
  • Jingjing Liu ;
  • Tadas Paulauskas ;
  • Patrick J Phillips ;
  • Canhui Wang ;
  • Randall Meyer

Tracking Dopant Diffusion Pathways Inside Bulk Materials

Three-Dimensional Observation of Dopant Atoms in Quantitative Scanning Transmission Electron Microscopy

Study of Oxygen Distortions in Titanate – Manganite Interfaces by Aberration Corrected STEM-EELS

Chemical Analysis with Single Atom Sensitivity Using Aberration-Corrected STEM

Platform Session 2

Tuesday, August 05, 2014 10:30 AM - Tuesday, August 05, 2014 12:00 PM

CCC - Room 14

  • Jinwoo Hwang ;
  • Jack Y Zhang ;
  • Susanne Stemmer ;
  • Lewys Jones ;
  • Vidar T Fauske ;
  • Katherine E MacArthur ;
  • Antonius T. J. van Helvoort ;
  • Peter D. Nellist, University of Oxford ;
  • Colin Ophus ;
  • Peter Ercius ;
  • Michael Sarahan ;
  • Cory Czarnik ;
  • Jim Ciston ;
  • Naoya Shibata ;
  • Scott D. Findlay ;
  • Yuichi Ikuhara

Progress in Applications of Quantitative STEM

Visualising the Three-dimensional Morphology and Surface Structure of Metallic Nanoparticles at Atomic Resolution by Automated HAADF STEM Atom Counting

Recording and Using 4D-STEM Datasets in Materials Science

Atomic-Resolution Scanning Transmission Electron Microscopy with Segmented Annular All Field Detector

Platform Session 3

Tuesday, August 05, 2014 1:30 PM - Tuesday, August 05, 2014 3:00 PM

CCC - Room 14

  • Ondrej L Krivanek ;
  • Niklas Dellby ;
  • Tracy C Lovejoy ;
  • Neil J Bacon ;
  • George J Corbin ;
  • Petr Hrncirik ;
  • Zoltan S Szilagyi ;
  • Toshihiro Aoki ;
  • Ray W Carpenter ;
  • Peter A Crozier ;
  • Jiangtao Zhu ;
  • Peter Rez ;
  • Ray F. Egerton ;
  • Philip E Batson ;
  • Tyler R Harvey ;
  • Jordan Chess ;
  • Jordan S Pierce ;
  • Peter Ercius ;
  • Benjamin J McMorran

Exploring Phonon Signals by High Energy / High Spatial Resolution EELS

Characterization of Electron Orbital Angular Momentum Transfer to Nanoparticle Plasmon Modes

High Energy and Spatial Resolution EELS Band Gap Measurements Using a Nion Monochromated Cold Field Emission HERMES Dedicated STEM

Challenges and Opportunities in Materials Science with Next Generation Monochromated EELS

Poster Session 1

Tuesday, August 05, 2014 3:30 PM - Tuesday, August 05, 2014 5:00 PM

CCC - Exhibit Hall AB

  • Everett D Grimley ;
  • Xiahan Sang ;
  • James M LeBeau ;
  • Andrew B Yankovich ;
  • Paul M Voyles ;
  • Anudha Mittal ;
  • Michael Odlyzko ;
  • K. Andre MKhoyan ;
  • Hidetaka Sawada ;
  • Naoki Shimura ;
  • Kazuhito Satoh ;
  • Eiji Okunishi ;
  • Fumio Hosokawa ;
  • Naoya Shibata ;
  • Yuichi Ikuhara ;
  • Lewys Jones ;
  • Gerardo T Martinez ;
  • Armand Béché ;
  • Sandra VanAert ;
  • Peter D. Nellist, University of Oxford ;
  • Paolo Longo, Gatan Inc. ;
  • Teya Topuria ;
  • Phil Rice ;
  • Aziz Aitouchen ;
  • Paul J Thomas ;
  • Ray D Twesten ;
  • Ping Lu ;
  • Eric Romero ;
  • Lin Zhou ;
  • M.J. Kramer ;
  • David J Smith ;
  • Merry Koschan ;
  • Mariya Zhuravleva ;
  • Charles L Melcher ;
  • Gerd Duscher ;
  • Matthew F Chisholm ;
  • Takayoshi Kishida ;
  • Shixin Wang ;
  • Aniruddha Dutta ;
  • Helge Heinrich ;
  • Daesung Park ;
  • Anja Herpers ;
  • Tobias Menke ;
  • Regina Dittmann ;
  • Joachim Maier

Application of the Projective Standard Deviation to STEM Imaging and Analysis

Precision Limits to STEM Imaging from Dynamical Scattering and Channeling of Sub-Angstrom Electron Probes

Dynamics of Electron Beam Channeling in a Single Atomic Column and in Crystals

Resolving 45 pm with 300 kV Aberration Corrected STEM

Getting the Best from an Imperfect Detector – an Alternative Normalisation Procedure for Quantitative HAADF STEM

Simultaneous High-Speed DualEELS and EDS Acquisition at Atomic Level

Improving the Spatial Resolution of Atomic-Scale EDS Mapping for Chemical Imaging and Quantification of Metallic Alloy Structures

Anti-site Defects in Perovskite YAlO3:Ce Using Aberration-corrected STEM

Removal of FEG Fluctuations in STEM Imaging

Interfacial Atomic Number Contrast in Thick Samples

Study of the Ultrathin Ferroelectric BaTiO3 Film using Scanning Transmission Electron Microscopy

Platform Session 4

Wednesday, August 06, 2014 8:30 AM - Wednesday, August 06, 2014 10:00 AM

CCC - Room 14

  • Christopher J. Kiely ;
  • Qian He ;
  • Ramchandra Tiruvalam ;
  • Nikolaos Dimitratos ;
  • Michael M Forde ;
  • Meenakshisundaram Sankar ;
  • Graham J Hutchings ;
  • Raul Arenal ;
  • Katia March ;
  • Chris P. Ewels ;
  • Xavier Rocquefelte ;
  • Mathieu Kociak ;
  • Annick Loiseau ;
  • Odile Stephan ;
  • Gianluigi A Botton ;
  • Matthieu Bugnet ;
  • Karleen J Dudeck ;
  • Nicolas Gauquelin ;
  • Hanshuo Liu ;
  • Sagar Prabhudev ;
  • Andrew Scullion ;
  • Samantha Stambula ;
  • Steffi Y Woo ;
  • Guo-Zhen Zhu ;
  • Hieu P.T. Nguyen ;
  • Zetian Mi ;
  • Valentine V Jmerik ;
  • Dmitrii V Nechaev ;
  • Sergey V Ivanov ;
  • Sergei Rouvimov

Assessing and Controlling the Size, Morphology and Composition of Supported Bimetallic Catalyst Nanoparticles

Experimental and Theoretical Atomic-Resolved EELS Studies on Nitrogen Doped Single-Walled Carbon Nanotubes

Studying Tomorrow's Materials Today: Insights with Quantitative STEM, EELS

Fine Structural Studies of AlGaN Laser Heterostructures with Digitally Alloyed Quantum Wells Grown on c-Al2O3 by Plasma-assisted Molecular Beam Epitaxy

Platform Session 5

Wednesday, August 06, 2014 10:30 AM - Wednesday, August 06, 2014 12:00 PM

CCC - Room 14

  • Leslie J Allen ;
  • Hamish G Brown ;
  • Adrian D'Alfonso ;
  • Jim Ciston ;
  • Yuyuan Lin ;
  • Laurence Marks ;
  • Peter Ercius ;
  • Tyler R Harvey ;
  • Jordan Pierce ;
  • Jordan Chess ;
  • Martin Linck ;
  • Ben McMorran ;
  • Peter D. Nellist, University of Oxford ;
  • Hao Yang ;
  • Juan G Lozano ;
  • Timothy J. Pennycook ;
  • Peter B Hirsch ;
  • Jingyue Liu ;
  • Mark P. Oxley ;
  • Myron D Kapetanakis ;
  • Micah P Prange ;
  • Wu Zhou ;
  • Juan-Carlos Idrobo, Oak Ridge National Laboratory ;
  • Sokrates T. Pantelides ;
  • Stephen J. Pennycook

Modeling Secondary Electron Imaging at Atomic Resolution Using a Focused Coherent Electron Probe

Atomic-resolution Imaging Using Cs-corrected Vortex Beams

STEM Optical Sectioning for Imaging Screw Displacements in Dislocation Core Structures

The Versatile Imaging Capabilities of Aberration-Corrected STEM

Inelastic STEM Imaging Based on Low-Loss Spectroscopy

Platform Session 6

Wednesday, August 06, 2014 1:30 PM - Wednesday, August 06, 2014 3:00 PM

CCC - Room 14

  • Juan C Idrobo ;
  • Myron D Kapetanakis ;
  • Wu Zhou ;
  • Micah P Prange ;
  • Leonardo Basile ;
  • Sokrates T. Pantelides ;
  • Stephen J. Pennycook ;
  • Liu Lei ;
  • Gong Gu ;
  • Juan-Carlos Idrobo, Oak Ridge National Laboratory ;
  • Niklas Dellby ;
  • Toshihiro Aoki ;
  • Juan Salafranca ;
  • John Mardinly ;
  • Ray Carpenter ;
  • Ondrej L Krivanek ;
  • Jong Seok Jeong ;
  • Michael L Odlyzko ;
  • Peng Xu ;
  • Bharat Jalan ;
  • K. Andre Mkhoyan ;
  • Fan Yang ;
  • Frank Scheltens ;
  • David McComb ;
  • David B. Williams ;
  • Marc DeGraef

Atomic Imaging and Spectroscopy of Two-dimensional Materials

Imaging and Spectroscopy of Graphene/Hexagonal Boron Nitride Lateral Heterostructure Interfaces

Monochromatic STEM-EELS for Correlating the Atomic Structure and Optical Properties of Two-Dimensional Materials

Interfaces and Defects in Hybrid Molecular Beam Epitaxy Grown NdTiO3/SrTiO3 Heterostructures

Absorption Corrections for a Four-Quadrant SuperX EDS Detector

Poster Session 3

Wednesday, August 06, 2014 3:30 PM - Wednesday, August 06, 2014 5:00 PM

CCC - Exhibit Hall AB

  • Xiahan Sang ;
  • Everett D Grimley ;
  • Changning Niu ;
  • Douglas L Irving ;
  • James M LeBeau ;
  • Tobias Volkenandt ;
  • Erich Müller ;
  • Dagmar Gerthsen ;
  • Andreas Graff ;
  • Frank Altmann ;
  • Andrzej Dzwilewski ;
  • Bert Freitag ;
  • K. Andre Mkhoyan ;
  • Michael L Odlyzko ;
  • Pinghong Xu ;
  • Claudia M. Macias ;
  • Joey Kistler ;
  • Nutchapon Chotigkrai ;
  • Bruce C. Gates ;
  • Nigel D. Browning, Pacific Nortwest National Laboratory ;
  • Aram Rezikyan ;
  • Lijun Wu ;
  • Xiaoya Shi ;
  • Qiang Li ;
  • Yimei Zhu, Brookhaven National Laboratory ;
  • Mi-Hyang Sheen ;
  • mingzhe Li ;
  • Jong-Hwan Lee ;
  • Young-Woon Kim ;
  • Ahmet Gulec ;
  • Robert F. Klie, University of Illinois at Chicago ;
  • Ganesh Subramanian ;
  • Nan Jiang ;
  • John Spence ;
  • Lindsay Hussey ;
  • Isaac Bryan ;
  • Ronny Kirste ;
  • Wei Guo ;
  • Zachary Bryan ;
  • Seiji Mita ;
  • Ramón Collazo ;
  • Zlatko Sitar ;
  • Vishwanath Suresh ;
  • Sergei Rouvimov ;
  • Tatyana Orlova ;
  • Xinyu Liu ;
  • Jacek K Furdyna ;
  • Debdeep Jena ;
  • Huili G Xing ;
  • Andrew A Herzing ;
  • Xiuli Zhou ;
  • Anton Horl ;
  • Andreas Trugler ;
  • Ulrich Hohenester ;
  • Theodore B Norris ;
  • Yi Wang ;
  • Wilfried Sigle ;
  • Federico Baiutti ;
  • Giuliano Gregori ;
  • Gennady Logvenov ;
  • Joachim Maier ;
  • Peter A. van Aken ;
  • Jing Lu ;
  • Xiao-meng Shen ;
  • Yong-hang Zhang ;
  • David Smith ;
  • Edward R White ;
  • Alex Kerelsky ;
  • Grant Jasmin ;
  • William A Hubbard ;
  • Matthew Mecklenburg ;
  • B. C Regan ;
  • Dalaver H Anjum ;
  • Pradip Sarawade ;
  • Jian Chen ;
  • Qiang Wei ;
  • Jinwen Chen

Putting a New Spin on Scanning Transmission Electron Microscopy

Sample Thickness Determination by Scanning Transmission Electron Microscopy at Low Electron Energies

Analytical ETL/EML Layer Investigation of Blue OLEDs

Channeling of Aberration-corrected STEM Probes at the "Sub-atomic" Scale

Quantitative Z-contrast Imaging in Scanning Transmission Electron Microscopy of Zeolite-supported Metal Clusters and Single-metal-atom Complexes With Single-Atom Sensitivity

Simulation of Decoherence in Fluctuation Electron Microscopy

Accurate Measurement of Thermal Displacement in Filled Skutterudite by Scanning Transmission Electron Microscopy

Including Thermal Vibrations and Bonding in HAADF-STEM Image Simulation

Investigation on Polarization Induced Electro-Optical Property of GaN LED using TEM-EBIC Combined with Cathodoluminescence

In-situ Atomic-Resolution Study of La1-xSrxCoO3 Using Z-contrast Imaging and EELS

Near Edge Fine Structure Analysis of Copper in Cu-Bi2Se3 Topological Insulators

Direct Observation of the Polarity Control Mechanism in Aluminum NItride Grown on Sapphire by Aberration Corrected Scanning Transmission Electron Microscopy.

Atomic Structure of Thin MoSe2 Films Grown by Molecular Beam Epitaxy

Reconciling Theory and Experiment in High-resolution Electron Energy-loss Spectroscopy of Plasmon Modes in Individual Nanostructures

Direct Observation of Asymmetric Sr Diffusion in Sr-δ-Doped La2CuO4

Quantitative Study of Compositional Uniformity and Interfacial Strain in InAs/InAs1-xSbx Type-II Superlattices

STEM EBIC to Study 2D Materials

TEM Investigations of Pt-NPs Loaded Fibrous Nano-Catalyst Support KCC-1

The In Situ TEM Study of Microstructure Alteration of MoS2 under Carburization

Platform Session 7

Thursday, August 07, 2014 8:30 AM - Thursday, August 07, 2014 10:00 AM

CCC - Room 14

  • Yuichi Ikuhara ;
  • Timothy J. Pennycook ;
  • Lewys Jones ;
  • Henrik Petterson ;
  • Valeria Nicolosi ;
  • Peter D. Nellist, University of Oxford ;
  • Manuel A Roldan ;
  • Juan Salafranca ;
  • Ryo Ishikawa ;
  • Rohan Mishra ;
  • Alberto Lopez-Ortega ;
  • Marta Estrader ;
  • German Salazar-Alvarez ;
  • Josep Nogues ;
  • Stephen J. Pennycook ;
  • Maria Varela ;
  • Pinghong Xu ;
  • Maricruz S. Sanchez ;
  • Andre C. Van Veen ;
  • Nigel D. Browning, Pacific Nortwest National Laboratory ;
  • Johannes A. Lercher ;
  • Qian He ;
  • Jungwon Woo ;
  • Vadim V Guliants ;
  • Albina Borisevich

Grain Boundary Structure Reconstruction due to Vacancies and Dopants in Oxides

Probing Atomic Scale Dynamics with STEM

Atomic-Resolution Monitoring of Structural Phase Transition in Bi-magnetic Core/Shell Oxide Nanoparticles

Ex-situ and In-situ Analysis of MoVTeNb Oxide by Aberration-Corrected Scanning Transmission Electron Microscopy

Novel M1/M2 Heterostructure in Mo-V-M-Ta (M = Te or Sb) Complex Oxide Catalyst Revealed by Aberration Corrected HAADF STEM

Platform Session 8

Thursday, August 07, 2014 1:30 PM - Thursday, August 07, 2014 3:00 PM

CCC - Room 14

  • Masashi Watanabe ;
  • Kazuo Ishizuka ;
  • Matthew L Bowers ;
  • Patrick J Phillips ;
  • Jonghan Kwon ;
  • Matthew C Brandes ;
  • Michael J Mills ;
  • Marc DeGraef ;
  • Robert E. A. Williams ;
  • Bryan D Esser ;
  • Gopal B Viswanathan ;
  • Brian Welk ;
  • Arda Genc ;
  • Mark Gibson ;
  • Leslie J Allen ;
  • David W. McComb ;
  • Hamish L Fraser

Evaluation of Sensitivity of Multivariate Statistical Analysis on STEM Spectrum-Imaging Datasets and its Improvement

Zone Axis STEM Defect Imaging Based on Electron Kossel Patterns

Characterizing Sub-lattice Occupancies in B2 Phases in High Entropy Metallic Alloys using Atomic Resolution STEM-XEDS Mapping

Poster Session 4

Thursday, August 07, 2014 10:30 AM - Thursday, August 07, 2014 12:00 PM

CCC - Exhibit Hall AB

  • Weihao Weng ;
  • Marco A. L. Cordeiro ;
  • Daniel G. Stroppa ;
  • Christopher J. Kiely ;
  • Edson R. Leite ;
  • Chang Wan Han ;
  • Ernesto E. Marinero ;
  • Antonio Aguilar ;
  • Rodolfo Zanella ;
  • Volkan Ortalan ;
  • Cem Akatay ;
  • Paul Dietrich ;
  • Fred Sollberger ;
  • Jeffrey Miller ;
  • Nicholas Delgass ;
  • Fabio Ribeiro ;
  • Eric Stach ;
  • Bryan D Esser ;
  • Adrian D'Alfonso ;
  • Manisha Dixit ;
  • Robert E. A. Williams ;
  • Hamish L Fraser ;
  • Leslie J Allen ;
  • David W. McComb ;
  • Hanne Kauko ;
  • Tim Grieb ;
  • Mazid Munshi ;
  • Knut Müller ;
  • Andreas Rosenauer ;
  • Bjørn-Ove Fimland ;
  • Antonius T. J. van Helvoort ;
  • Jiangtao Zhu ;
  • Peter A Crozier ;
  • Toshihiro Aoki ;
  • James R Anderson ;
  • Mahsa Sina ;
  • Nathalie Pereira ;
  • Glenn G. Amatucci ;
  • Frederic Cosandey ;
  • Subarna Khanal ;
  • Nabraj Bhattarai ;
  • J. Jesus Velazquez-Salazar ;
  • Miguel Jose-Yacaman ;
  • Jia Xu ;
  • Jingyue Liu ;
  • A W Wood ;
  • Y Guan ;
  • K Forghani ;
  • L J Mawst ;
  • T F Kuech ;
  • S E Babcock ;
  • Gilberto Casillas ;
  • Matthew Mecklenburg ;
  • Shaul Aloni ;
  • Edward R White ;
  • Rohan Dhall ;
  • William Hubbard ;
  • Steve Cronin ;
  • Brian Regan

Understanding the Growth Mechanism of CeO2 Nanocrystals by Comparison of Experimental and Simulated HAADF-STEM Images

In situ HAADF-STEM Imaging and Tomography of AuIr Bimetallic Catalysts

Linking Performance with Particle Configuration on Bimetallic Pt/Co/MWCNT Catalysts for Aqueous Phase Reforming by Aberration Corrected STEM coupled with EELS

Understanding B-Site Disorder in HAADF-STEM Images of Double Perovskite Thin Films Using the Quantum Excitation of Phonons Model

The Outward Diffusion of Sb during Nanowire Growth Studied by Quantitative High-Angle Annular Dark Field Scanning Transmission Electron Microscopy.

Full Optical Properties of Carbonaceous Aerosols by High Energy Monochromated Electron Energy-loss Spectroscopy

STEM/EELS Analysis of Conversion Reactions in Cycled FeOF/C

Study of Novel AuCu-Pt Trimetallic Multiply Twinned Nanoparticles with High Index Surfaces

Atomic Resolution Study of the Bonding Between ZnO Nanowires

Unexpected Bismuth Concentration Profiles in MOVPE GaAs1-xBix Films Revealed by HAADF STEM Imaging

New Insights into the Structure of PtPd Bimetallic Nanoparticles and Their Atomic Resolution Images by Cs-Corrected STEM

Improved Temperature Determination from Plasmon Energy Shifts in Aluminum

A03 - TEM Phase Contrast Imaging in Biological and Materials Science

  • Michael Marko, Wadsworth Center ;
  • Radostin Danev, MPI Biochmeistry

Platform Session 1

Wednesday, August 06, 2014 1:30 PM - Wednesday, August 06, 2014 3:00 PM

CCC - Room 23

  • Wah Chiu ;
  • Wei Dai ;
  • Caroline Fu ;
  • Desislava Raytcheva ;
  • John F Flanagan ;
  • Htet A Khant ;
  • Xiangan Liu ;
  • Ryan H Rochat ;
  • Cameron Haase-Pettingell ;
  • Jacqueline Piret ;
  • Steve J Ludtke ;
  • Kuniaki Nagayama ;
  • Michael F Schmid ;
  • Jonathan A King ;
  • Elizabeth R. Wright, Emory University ;
  • Ricardo C Guerrero-Ferreira ;
  • Gabriella Kiss ;
  • Joshua D Strauss ;
  • Cheri M Hampton ;
  • Radostin Danev, MPI Biochmeistry ;
  • Bart Buijsse ;
  • Yoshiyuki Fukuda ;
  • Juergen Plitzko ;
  • Wolfgang Baumeister ;
  • Shoh Asano ;
  • Miroslava Schaffer ;
  • Florian Beck ;
  • Vladan Lučić

Visualizing Virus Assembly Intermediates Inside Marine Cyanobacteria by Zernike Phase Contrast Electron Cryo-Tomography

Zernike Phase Contrast Cryo-Electron Tomography of Bacteria and Viruses

Automated Cryo-tomography and Single Particle Analysis with a New Type of Phase Plate

Phase Contrast Cryo-Electron Tomography of Primary Cultured Neuronal Cells

Platform Session 2

Thursday, August 07, 2014 8:30 AM - Thursday, August 07, 2014 10:00 AM

CCC - Room 23

  • Robert M Glaeser ;
  • Michael Marko, Wadsworth Center ;
  • Xing Meng ;
  • Chyongere Hsieh ;
  • Gregory Kishchenko ;
  • ArDean Leith ;
  • Simon Hettler ;
  • Jochen Wagner ;
  • Manuel Dries ;
  • Marco Oster ;
  • Rasmus R Schröder ;
  • Dagmar Gerthsen

Investigating the Causes of Electrostatic Charging of Phase Contrast Apertures

Evaluation of the Quality of Zernike Phase Plates

Application of Zach Phase Plates for Phase Contrast Transmission Electron Microscopy: Status and Future Experiments

Inelastic Phase Contrast Using Electrostatic Zach Phase Plates

Platform Session 3

Thursday, August 07, 2014 1:30 PM - Thursday, August 07, 2014 3:00 PM

CCC - Room 23

  • Bart Buijsse ;
  • Gijs van Duinen ;
  • Kasim Sader ;
  • Radostin Danev, MPI Biochmeistry ;
  • Stephan H Irsen ;
  • Patrick Kurth ;
  • Steffen Pattai ;
  • Joerg Wamser ;
  • Daniel Rudolph ;
  • Johannes Overbuschmann ;
  • Yuji Konyuba ;
  • Hirofumi Iijima ;
  • Yutaka Abe ;
  • Mitsuo Suga ;
  • Yoshihiro Ohkura ;
  • Hiroki Minoda ;
  • Takayuki Tamai ;
  • Fumio Hosokawa ;
  • Yukihito Kondo

Challenges in Phase Plate Product Development

Artifact-Free, Long-Lasting Phase Plate

High Throughput Fabrication Process of a Zernike Phase Plate

First Demonstration of Phase Contrast Scanning Transmission Electron Microscopy

Platform Session 4

Thursday, August 07, 2014 3:30 PM - Thursday, August 07, 2014 5:00 PM

CCC - Room 23

  • Yukinori Nagatani ;
  • Kazuyoshi Murata ;
  • Yoshitaka Kimori ;
  • Toshiaki Itoh ;
  • Zempei Saitoh ;
  • Mitsuru Ikeda ;
  • Naoyuki Miyazaki ;
  • Masahiro Ohara ;
  • Kuniaki Nagatani ;
  • Vincenzo Grillo ;
  • Ebrahim Karimi ;
  • Roberto Balboni ;
  • Gian Carlo Gazzadi ;
  • Stefano Frabboni ;
  • Erfan Mafakheri ;
  • Robert W Boyd ;
  • Marek Malac ;
  • Marco Beleggia ;
  • Ray F. Egerton ;
  • Masahiro Kawasaki ;
  • Michael Bergen ;
  • Yoshio Okura ;
  • Isamu Ishikawa ;
  • Kohei Motoki

Ultimate Recovery of Low-Frequencies in Thin-film ZPC-TEM by Inverse Projector

Innovative Phase Plates for Beam Shaping

Charging of Thin-Film Phase Plates under Electron Beam Irradiation.

Poster Session 4

Thursday, August 07, 2014 10:30 AM - Thursday, August 07, 2014 12:00 PM

CCC - Exhibit Hall AB

  • Maryam Khoshouei ;
  • Radostin Danev, MPI Biochmeistry ;
  • Günther Gerisch ;
  • Maria Ecke ;
  • Juergen Plitzko ;
  • Wolfgang Baumeister ;
  • Haixin Sui ;
  • Gregory Kishchenko ;
  • Jie He ;
  • Rebecca Fisher ;
  • Chyongere Hsieh ;
  • Michael Marko, Wadsworth Center ;
  • Manuel Dries ;
  • Simon Hettler ;
  • Björn Gamm ;
  • Erich Müller ;
  • Winfried Send ;
  • Dagmar Gerthsen ;
  • Knut Müller ;
  • Andreas Rosenauer ;
  • Irais I Santana Garcia ;
  • Christian Kisielowski ;
  • Petra Specht ;
  • Hector A Calderon ;
  • Yun-Yu Wang ;
  • John Bruley ;
  • Xing-Zhong Li ;
  • Wen-Yong Zhang ;
  • David J Sellmyer

Phase Contrast Cryo-Electron Tomography and Single Particle Analysis with a New Phase Plate.

Artifact Correction for Zernike Phase-Plate Cryo-Electron Tomography

A Nanocrystalline Hilbert Phase Plate for Phase Contrast Transmission Electron Microscopy

CIGS Nanoparticles Observed in TEM Low Dose Condition. Atomic Resolution and Beam Effects.

Dual Lens Electron Holography for High Spatial Resolution Junction and Strain Mapping of Semiconductor Devices

SAED and HREM Studies of Zr2Co11 Intermetallic Compound

A04 - Electron Holography at the Atomic Scale and the Nanoscale

  • M.R. McCartney, Arizona State University ;
  • N. Osakabe, Hitachi Ltd ;
  • H. Lichte, Technishe Universitat Dresden ;
  • D.J. Smith, Arizona State University ;
  • D. Cooper, French Alternative Energies and Atomic Energy Commission ;
  • D. Shindo, Tohoku University

Platform Session 1

Monday, August 04, 2014 1:30 PM - Monday, August 04, 2014 3:00 PM

HM - Ballroom B

  • Hannes Lichte ;
  • Felix Boerrnert ;
  • Bernd Einenkel ;
  • Andreas Lenk ;
  • Axel Lubk ;
  • Falk Roeder ;
  • Jan Sickmann ;
  • Sebastian Sturm ;
  • Karin Vogel ;
  • Daniel Wolf ;
  • Daisuke Shindo ;
  • Zentaro Akase ;
  • Hyun Soon Park ;
  • Ken Harada ;
  • Hiroto Kasai ;
  • Shawn Pollard ;
  • Marek Malac ;
  • Marco Beleggia ;
  • Masahiro Kawasaki ;
  • Yimei Zhu, Brookhaven National Laboratory

Electron Holography in Solids: Problems and Progress

Collective Motion of Secondary Electrons Visualized by Electron Holography

Accumulated Reconstruction Method for Electron Holography

Magnetic Imaging with a Novel Hole-Free Phase Plate.

Poster Session 1

Monday, August 04, 2014 3:30 PM - Monday, August 04, 2014 5:00 PM

CCC - Exhibit Hall AB

  • Ruriko Tsuneta ;
  • Masaki Ikeda ;
  • Shiano Ono ;
  • Miyuki Yamane ;
  • Akira Sugawara ;
  • Ken Harada ;
  • Masanari Koguchi ;
  • Axel Lubk ;
  • Daniel Wolf ;
  • Falk Röder ;
  • Hannes Lichte ;
  • Cigdem Ozsoy Keskinbora ;
  • Chris B. Boothroyd ;
  • Rafal E. Dunin-Borkowski ;
  • Peter A. van Aken ;
  • Christoph T. Koch ;
  • Teruo Kohashi ;
  • Tomohiro Iwane ;
  • Manabu Shirai ;
  • Toshiaki Tanigaki ;
  • Shinji Aizawa ;
  • Hyun Soon Park ;
  • Tsuyoshi Matsuda ;
  • Daisuke Shindo ;
  • Amir Hossein Tavabi ;
  • Vadim Migunov ;
  • Alexey Savenko ;
  • Azadeh Akhtari-Zavareh ;
  • Louis P Carignan ;
  • Arthur Yelon ;
  • David Menard ;
  • Takeshi Kasama ;
  • Rodney Herring ;
  • Martha McCartney ;
  • Karen L Kavanagh ;
  • Yoshifumi Taniguchi ;
  • Hiroaki Matsumoto ;
  • Desai Zhang ;
  • David J Smith ;
  • Martha R McCartney ;
  • Justin M Shaw ;
  • Taeho Roy Kim ;
  • Ai Leen Koh, Standford University ;
  • Robert Sinclair ;
  • Sadegh Yazdi ;
  • Alexander Berg ;
  • Marco Beleggia ;
  • Magnus T. Borgstrom ;
  • Jakob B. Wagner ;
  • Jesus Cantu-Valle ;
  • Francisco Ruiz-Zepeda ;
  • Ulises Santiago ;
  • Fernando Mendoza-Santoyo ;
  • Miguel Jose-Yacaman ;
  • Arturo Ponce ;
  • David W Shook ;
  • Benjamin J McMorran

Vector Field Tomography by Electron Holography

Electron Holographic Tomography of Mean Free Path Lengths at the nm-scale

Hybridization of Off-Axis and In-line High-Resolution Electron Holography

Superposition of Fraunhofer Diffractions from Fork-Shaped Gratings and their Openings with Electron Vortex Beam

Investigation of Effect of Electron Irradiation on Ionic Liquid Using Electron Holography

Electron Holography of the Magnetic Phase Shift of a Current-Carrying Wire

Magnetic Characterization of Isolated CoFeB/Cu Nanowires by Off-Axis Electron Holography

Lens-Less Foucault Imaging (LLFI) Method for Observing Magnetic Domain Walls

Study of Magnetic Domain Structure in Co(Fe)/Pd Multilayers using Off-axis Electron Holography

Imaging Perpendicular Magnetic Domains in Plan-view Using Lorentz Transmission Electron Microscopy

Evaluation of Doping in GaP Core-Shell Nanowire pn Junction by Off-Axis Electron Holography

Characterization of Metallic and Bimetallic Nanoparticles by Off-Axis Electron Holography

Propagation of Free Electrons Carrying Orbital Angular Momentum Through Magnetic Lenses.

Platform Session 2

Tuesday, August 05, 2014 8:30 AM - Tuesday, August 05, 2014 10:00 AM

HM - Ballroom B

  • Michael A Gribelyuk ;
  • Viorel Ontalus ;
  • Thomas N Adam ;
  • Frieder H Baumann ;
  • Paul Ronsheim ;
  • Rafal E. Dunin-Borkowski ;
  • Jean-Luc Rouviere ;
  • David Cooper ;
  • Zhaofeng Gan ;
  • Daniel Perea ;
  • Yang He ;
  • Robert Colby ;
  • Meng Gu ;
  • Yoo Jinkyoung ;
  • Chong-Min Wang ;
  • Tom Picraux ;
  • David Smith ;
  • Molly McCartney ;
  • Allison Boley ;
  • David F Storm ;
  • Martha R McCartney ;
  • David J Smith

Electron Holography of CMOS Devices with Epitaxial Layers

Field Mapping in Semiconductors by Off-axis Electron Holography: From Devices to Graphene and Single Dopant Atoms.

In Situ Biasing of Tapered Si-Ge NW Heterojunctions using Off-Axis Electron Holography

Characterization of N-polar GaN/AlGaN/GaN Heterostructures Using Electron Holography

Platform Session 3

Tuesday, August 05, 2014 10:30 AM - Tuesday, August 05, 2014 12:00 PM

HM - Ballroom B

  • Rafal E. Dunin-Borkowski ;
  • Nobuyuki Osakabe ;
  • Luying Li ;
  • Kai He ;
  • John Cumings

New Approaches for Measuring Electrostatic Potentials and Charge Density Distributions in Working Devices Using Off-Axis and In-Line Electron Holography

A Newly Developed 1.2MV Field Emission Transmission Electron Microscope and Visualization of Topological Quantum Phenomena

Polarization-induced Charge Distributions at Polytype Interfaces in Semiconductor Nanostructures

A New Design for Measuring Potentials in Operando Nanoelectronic Devices by Electron Holography

A05 - 15 Years of Focused Ion Beams at M&M

  • Lucille A. Giannuzzi, L.A. Giannuzzi and Associates ;
  • Keana C.K. Scott ;
  • Nicholas Antoniou, Harvard University

Platform Session 1

Wednesday, August 06, 2014 1:30 PM - Wednesday, August 06, 2014 3:00 PM

CCC - Room 17

  • Fred Stevie ;
  • Lucille A. Giannuzzi, L.A. Giannuzzi and Associates ;
  • Srinivas Subramaniam ;
  • Kevin Johnson ;
  • Anne Delobbe ;
  • Olivier Salord ;
  • Tomáš Hrnčíř ;
  • Amandine David ;
  • Pierre Sudraud ;
  • Filip Lopour ;
  • Uk Huh ;
  • Woon Cho ;
  • Ranjan Ramachandra ;
  • David Joy

FIB Applications: A Historical Perspective

Optimization of High Current Xenon Plasma Ion Beams for Applications in Semiconductor Failure Analysis and Development

High Speed TEM Sample Preparation by Xe FIB

He+ Ions for 3D Imaging

Monte Carlo Modeling of Ion Beam Induced Secondary Electrons

Platform Session 2

Thursday, August 07, 2014 8:30 AM - Thursday, August 07, 2014 10:00 AM

CCC - Room 17

  • Pierre Sudraud ;
  • Libor Sedláček ;
  • Jolana Kološová ;
  • Jaroslav Jiruše ;
  • Fred A. Stevie ;
  • Tom Wirtz ;
  • David Dowsett ;
  • Patrick J Phillips ;
  • Hamed Parvaneh ;
  • Robert Hull ;
  • Sven Bauerdick ;
  • Jason E. Sanabia ;
  • Paul Mazarov ;
  • Joel Fridmann ;
  • Lars Bruchhaus ;
  • Ralf Jede

From Space Ion Thrusters to Nanotools

Insulator Analysis Using Combined FIB-SEM instrument with TOF-SIMS

Optimized Detection Limits in FIB-SIMS by Using Reactive Gas Flooding and High Performance Mass Spectrometers

Ion-induced Auger Electron Spectroscopy as a Potential Route to Chemical Focused-Ion Beam Tomography

Advanced Ion Source Technology for High Resolution and Stable FIB Nanofabrication Employing Gallium and New Ion Species

Platform Session 3

Thursday, August 07, 2014 1:30 PM - Thursday, August 07, 2014 3:00 PM

CCC - Room 17

  • Richard M Langford ;
  • Jonathan S Earl ;
  • Arno P. Merkle ;
  • Kim N Dalby ;
  • Henning Osholm Sørensen ;
  • Dirk Mueter ;
  • Diwaker Jha ;
  • Julio C Da Silva ;
  • Susan Louise Svane Stipp ;
  • Nabil D. Bassim ;
  • Rhonda M. Stroud ;
  • Keana C.K. Scott ;
  • Larry Nittler ;
  • Christopher Herd ;
  • Kyle Doudrick ;
  • Shanliangzi Liu ;
  • Eva M Mutunga ;
  • Kate L. Klein ;
  • Kripa K Varanasi ;
  • Konrad Rykaczewski ;
  • Robert E. A. Williams ;
  • John Sosa ;
  • Daniel Huber ;
  • Hamish L Fraser

Application of a FIB/SEM to Study the Occlusion of Dentine Tubules from a Calcium Sodium Phosphosilicate Bioactive Glass (Novamin)

From Oil Field to Ptychography: Applications of FIB SEM in NanoGeoScience

3D Nanoscale Analysis Using Focused Ion Beam Tomography of Carbonaceous Nanoglobules in Matrix Materials From the Tagish Lake Meteorite

In-situ FIB-SEM Experimentation: From Nanoscale Wetting to Nano-fabrication of Gallium-based Liquid Metals

15 Years of Characterizing Titanium Alloys' Microstructure by DBFIB

Platform Session 4

Thursday, August 07, 2014 3:30 PM - Thursday, August 07, 2014 5:00 PM

CCC - Room 17

  • Clarissa A. Wisner ;
  • Frank Bauer ;
  • Scott D Sitzman ;
  • Christian Lang ;
  • Cheryl Hartfield ;
  • Jenny Goulden ;
  • Tsengming Chou ;
  • Maureen E Williams ;
  • Konrad Rykaczewski ;
  • Jessica L Riesterer ;
  • Ron Kelley ;
  • Jaromír Kopeček ;
  • Karel Jurek ;
  • Vít Kopecký ;
  • Ladislav Klimša ;
  • Hanuš Seiner ;
  • Petr Sedlák ;
  • Michal Landa ;
  • Jiří Dluhoš ;
  • Martin Petrenec ;
  • Lukáš Hladík ;
  • Antonín Doupal ;
  • Oleg Heczko

FIB Lift Out of Columnar Carbon Structures

Advancing Materials Characterization in the FIB-SEM with Transmission Kikuchi Diffraction

Cryo-FIB Minimizes Ga+ Milling Artifacts in Sn

Integration of Cryo-FIB-SEM Imaging into Dynamic Thermo-fluidic Experimentation: Applications to Multifunctional Nanoengineered Surface Design

Ga+ Ions and Xe+ Plasma: Complementary FIBs for Resin-Embedded Life Science Sample Analyses

Xenon Focused Ion Beam in the Shape Memory Alloys Investigation – The Case of NiTi and CoNiAl.

Poster Session 4

Thursday, August 07, 2014 10:30 AM - Thursday, August 07, 2014 12:00 PM

CCC - Exhibit Hall AB

  • Eva M Mutunga ;
  • Stacey Lockerman ;
  • Shida Tan ;
  • Richard Livengood ;
  • Andras E Vladar ;
  • Kate L. Klein ;
  • Huimeng Wu ;
  • Shawn M Mcvey ;
  • David Ferranti ;
  • Chuong Huynh ;
  • John Notte ;
  • Lewis Stern ;
  • Matthew S Joens ;
  • James A. J. A. J. Fitzpatrick ;
  • Bernhard Goetze ;
  • Lucille A. Giannuzzi, L.A. Giannuzzi and Associates ;
  • Noel S Smith ;
  • Matthew Hiscock ;
  • Michael Dawson ;
  • Christian Lang ;
  • Cheryl Hartfield ;
  • Peter J Statham ;
  • Mina Abadier ;
  • Rachael L Myers-Ward ;
  • Haizheng Song ;
  • Kurt D Gaskill ;
  • Chip R Eddy ;
  • Tangali S Sudarshan ;
  • Yoosuf N. Picard, Carnegie Mellon University ;
  • Marek Skowronski ;
  • Brandon B Van Leer ;
  • Huikai Cheng ;
  • Jessica L Riesterer ;
  • In-Yong Park ;
  • Takashi Ogawa ;
  • Boklae Cho ;
  • Cheolsu Han ;
  • Ju Hwang Kim ;
  • Sang Jung Ahn ;
  • R. Prakash Kolli ;
  • Frederick Meisenkothen ;
  • Julia Huang ;
  • Xiaoyue Wang ;
  • Kathryn Grandfield ;
  • Xin Man ;
  • Tatsuya Asahata ;
  • Toshiaki Fujii ;
  • Jordan Pierce ;
  • Tyler R Harvey ;
  • Amit Agrawal ;
  • Peter Ercius ;
  • Benjamin J McMorran ;
  • Nabil D. Bassim ;
  • Joshua D Caldwell ;
  • Alexander Giles ;
  • Leonidas E Ocola ;
  • Markus Löffler ;
  • Sayanti Banerjee ;
  • Jens Trommer ;
  • Andre Heinzig ;
  • Walter Weber ;
  • Ehrenfried Zschech ;
  • Wayne Zhao ;
  • Stephen Mongeon ;
  • Bianzhu Fu ;
  • Esther Chen ;
  • Daniel Flatoff ;
  • Nicolas LaManque ;
  • Jeremy Russell ;
  • Aiden A Martin ;
  • Igor Aharonovich ;
  • Milos Toth ;
  • Na Yeon Kim ;
  • Gyeong Hee Ryu ;
  • Hyo Ju Park ;
  • Zonghoon Lee

Focused Helium Ion Beam Nanomachining of Thin Membranes vs. Bulk Substrates

Advantages of Helium and Neon Ion Beams for Intelligent Imaging

Ex-situ Lift Out of PFIB Prepared TEM Specimens

In-situ Quantification of TEM Lamella Thickness and Ga Implantation in the FIB

Site Specific TEM Specimen Preparation for Characterization of Extended Defects in 4H-SiC Epilayers

Ga+ FIB Milling and Measurement of FIB Damage in Sapphire

Blunted Tungsten Tip Cleaning by Nitrogen Gas Etching at Room Temperature without Tip Heating and Cooling

A Focused Ion Beam Specimen Preparation Method to Minimize Gallium Ion Concentration in Copper Atom-Probe Tomography Specimen Tips

FIB Preparation of Bone–Implant Interfaces for Correlative On-Axis Rotation Electron Tomography and Atom Probe Tomography

3D Atom Probe Microscopy Sample Preparation by Using L-Shape FIB-SEM-Ar Triple Beam

Efficient Diffractive Phase Optics for Electrons

Focused Ion Beam Direct-Write Nonofabrication of Surface Phonon Polariton Metamaterial Nanostructures

In-Situ Investigations of Individual Nanowires within a FIB/SEM System

3D Analytical TEM Approach to Effectively Characterize 3D-FinFET Device Features in Semiconductor Wafer-foundries

Gas-Mediated Electron Beam Induced Etching – From Fundamental Physics to Device Fabrication

An Improved Specimen Preparation of Porous Powder Materials for Transmission Electron Microscopy

A06 - Super Resolution Microscopic Methods

  • Angus I. Kirkland, University of Oxford ;
  • John M. Rodenburg, University of Sheffield

Platform Session 1

Wednesday, August 06, 2014 8:30 AM - Wednesday, August 06, 2014 10:00 AM

CCC - Room 11

  • Jianwei Miao ;
  • Roarke Horstmeyer ;
  • Guoan Zheng ;
  • Xiaoze Ou ;
  • Changhuei Yang ;
  • Andrew Maiden ;
  • Adrian D'Alfonso ;
  • Andrew J Morgan ;
  • Ada W Yan ;
  • Peng Wang ;
  • Hidetaka Sawada ;
  • Angus I. Kirkland, University of Oxford ;
  • Leslie J Allen

Coherent Diffraction Imaging

Modeling Extensions of Fourier Ptychographic Microscopy

Super-resolved Ptychographic Imaging

Generalised Holography Meets Coherent Diffractive Imaging

Platform Session 2

Wednesday, August 06, 2014 10:30 AM - Wednesday, August 06, 2014 12:00 PM

CCC - Room 11

  • Peng Wang ;
  • Angus I. Kirkland, University of Oxford ;
  • Peter D. Nellist, University of Oxford ;
  • Adrian D'Alfonso ;
  • Andrew J Morgan ;
  • Leslie J Allen ;
  • Ayako Hashimoto ;
  • Masaki Takeguchi ;
  • Kazutaka Mitsuishi ;
  • Masayuki Shimojo ;
  • Max Haider, CEOS Gmbh ;
  • Stephan Uhlemann ;
  • Peter Hartel ;
  • Heiko Müller ;
  • T Sasaki ;
  • Hidetaka Sawada ;
  • Fumio Hosokawa ;
  • Kazutomo Suenaga ;
  • Timothy J. Pennycook ;
  • Andrew R. Lupini ;
  • Lewys Jones

Atomically Resolved Scanning Confocal Electron Microscopy Using a Double Aberration-corrected Transmission Electron Microscope

Towards High Resolution in TEM and STEM: What are the Limitations and Achievements

Resolution Enhancement at Low-Accelerating-Voltage by Improvements of Diffraction Limit and Chromatic Aberration

Maximum Efficiency STEM Phase Contrast Imaging

Poster Session 3

Wednesday, August 06, 2014 3:30 PM - Wednesday, August 06, 2014 5:00 PM

CCC - Exhibit Hall AB

  • Vincenzo Grillo ;
  • Ebrahim Karimi ;
  • Roberto Balboni ;
  • Gian Carlo Gazzadi ;
  • Stefano Frabboni ;
  • Erfan Mafakheri ;
  • Robert W Boyd ;
  • Eric Lifshin ;
  • Siwei Lyu ;
  • Yudhishthir R Kandel ;
  • Richard L Moore ;
  • Zdenek Svindrych ;
  • Pavel Krizek ;
  • Evgeny Smirnov ;
  • Martin Ovesny ;
  • Josef Borkovec ;
  • Guy M Hagen ;
  • Prashant Kumar ;
  • Michael Tsapatsis ;
  • Andre K Mkhoyan ;
  • Lothar Strueder ;
  • Jakob Soltau ;
  • Julia Schmidt ;
  • Robert Hartmann ;
  • Martin Huth ;
  • Heike Soltau ;
  • Peter Holl ;
  • Martin Simson ;
  • Gerhard Lutz ;
  • Henning Ryll

Experiments and Potentialities for the Use of Bessel Beam in Superresolution STEM

The Use of Regularized Least Squares Minimization for the Deconvolution of SEM Images

Live Cell Imaging With Spatial Light Modulator-based Optical Sectioning Structured Illumination Microscopy

Crystallographic Structure Determination of MFI-Zeolite Nanosheets

High speed, high throughput two dimensional direct electron detector based on the concept of pnCCDs

A07 - Microscopy and Spectroscopy for Power Generation and Energy Storage

  • Torsten Schwarz, Max-Planck-Insitut für Eisenforschung GmbH ;
  • Eva Olsson, Chalmers University ;
  • Doug Perovic, University of Toronto ;
  • Feng Wang, Brookhaven National Laboratory ;
  • John Walmsley, SINTEF ;
  • Wolfgang Jäger, Christian Albrechts University ;
  • Haimei Zheng, Lawerence Berkeley National Laboratory ;
  • Yimei Zhu, Brookhaven National Laboratory ;
  • Miaofang Chi, Oak Ridge National Laboratory

Platform Session 1

Monday, August 04, 2014 1:30 PM - Monday, August 04, 2014 3:00 PM

CCC - Room 15

  • Torsten Schwarz, Max-Planck-Insitut für Eisenforschung GmbH ;
  • Oana Cojocaru-Mirédin ;
  • Pyuck-Pa Choi ;
  • Anke Lämmle ;
  • Roland Würz ;
  • Marina Mousel ;
  • Alex Redinger ;
  • Susanne Siebentritt ;
  • Silvana Botti ;
  • Dierk Raabe ;
  • Wei Zhang ;
  • Kristopher Davis ;
  • Winston Schoenfeld ;
  • Patrick Looney ;
  • Feng Wang, Brookhaven National Laboratory ;
  • Stefan Gustafsson ;
  • Olof Bäcke ;
  • Samira Nik ;
  • Anke Sanz-Velasco ;
  • Camilla Lindqvist ;
  • Ergang Wang ;
  • Mats R Andersson ;
  • Christian Müller ;
  • Eva Olsson, Chalmers University ;
  • Frank J. Scheltens ;
  • Michael F. Durstock ;
  • Christopher E. Tabor ;
  • Benjamin J. Leever ;
  • Lawrence F. Drummy ;
  • Michael D. Clark ;
  • Dennis P. Butcher ;
  • Jessica A. Alexander ;
  • David W. McComb ;
  • Vasile-Dan Hodoroaba ;
  • Thomas Wirth ;
  • Ralf Terborg ;
  • Kyung Joong Kim ;
  • Wolfgang E. S. Unger

Nano-scale Characterization of Thin-Film Solar Cells

STEM-EELS Studies of Coordination at Al2O3/Si interfaces in Si Solar Cells

Electron Microscopy of Organic Solar Cells Thermally Stabilized with Fullerene Nucleating Agents

Monochromated Electron Energy-Loss Spectroscopy Spectrum Imaging of Organic Photovoltaic Devices.

Measurement of atomic fractions in Cu(In,Ga)Se2 films by Auger Electron Spectroscopy (AES) and Energy Dispersive Electron Probe Microanalysis (ED-EPMA)

Poster Session 1

Monday, August 04, 2014 3:30 PM - Monday, August 04, 2014 5:00 PM

CCC - Exhibit Hall AB

  • Dietrich Haeussler ;
  • Lothar Houben ;
  • Rafal E. Dunin-Borkowski ;
  • Stephanie Essig ;
  • Frank Dimroth ;
  • Wolfgang Jäger, Christian Albrechts University ;
  • Diego Gardini ;
  • Peter M Mortensen ;
  • Hudson W P Carvalho ;
  • Christian D Damsgaard ;
  • Jan-Dierk Grunwaldt ;
  • Peter A Jensen ;
  • Anker D Jensen ;
  • Jakob B. Wagner ;
  • Liuxian Zhang ;
  • Peter Crozier ;
  • Haoran Yu ;
  • Paul Plachinda ;
  • Liang Zhang ;
  • Miomir Vukmirovic ;
  • Stoyan Bliznakov ;
  • Meng Li ;
  • Radenka Maric ;
  • Radoslav Adzic ;
  • Prashant Kumar ;
  • Jong Seok Jeong ;
  • Bahman Elyassi ;
  • Nafiseh Rajabbeigi ;
  • Michael Tsapatsis ;
  • Andre K Mkhoyan ;
  • Matthias Meffert ;
  • Philipp Müller ;
  • Heike Störmer ;
  • Lana-Simone Unger ;
  • Christian Niedrig ;
  • Stefan F Wagner ;
  • Saim Saher ;
  • Henny JM Bouwmeester ;
  • Ellen Ivers-Tiffée ;
  • Dagmar Gerthsen ;
  • Shuyi Zhang ;
  • Michael Katz ;
  • Xianfeng Du ;
  • George Graham ;
  • Xiaoqing Pan ;
  • Aaron C Jackson ;
  • Yifan Li ;
  • Jacob R Nyzaka ;
  • Yossef A Elabd ;
  • Daniel M Knauss ;
  • Frederick L Beyer ;
  • Scott D Walck ;
  • Lis G. de A. Melo ;
  • Vincent Lee ;
  • Darija Susac ;
  • Viatcheslav Berejnov ;
  • Juergen Stumper ;
  • Gianluigi A Botton ;
  • Adam P Hitchcock ;
  • Davide Deiana ;
  • Arnau Verdaguer-Casadeval ;
  • Patricia Hernandez-Fernandez ;
  • Federico Masini ;
  • Christian Strebel ;
  • David N. McCarthy ;
  • Ander Nierhoff ;
  • Jane H. Nielsen ;
  • Ifan E. L. Stephens ;
  • Ib Chorkendorff ;
  • Thomas W. Hansen ;
  • Goran Drazic ;
  • Marjan Bele ;
  • Andraz Pavlisic ;
  • Primoz Jovanovic ;
  • Milena Zorko ;
  • Nejc Hojnik ;
  • Barbara Jozinovic ;
  • Miran Gaberscek ;
  • Dalaver H Anjum ;
  • Lidong Li ;
  • Somaye Rasouli ;
  • Jonathan Sharman ;
  • Alex Martinez ;
  • Dash Fongalland ;
  • Graham Hards ;
  • Tomokazu Yamamoto ;
  • Deborah Myers ;
  • Kenji Higashida ;
  • Paulo J Ferreira ;
  • Kang Yu ;
  • Daniel J Groom ;
  • Xiaoping Wang ;
  • Zhiwei Yang ;
  • Mallika Gummalla ;
  • Sarah C Ball ;
  • Deborah J Myers ;
  • Jae Hyuck Jang ;
  • Qian He ;
  • Donovan N Leonard ;
  • Albina Y Borisevich ;
  • Young-Min Kim ;
  • Amit Kumar ;
  • Sergei V. Kalinin

Analyses of Interfaces in Wafer-Bonded Tandem Solar Cells by Aberration-Corrected STEM and EELS

Electron Microscopy Study of the Deactivation of Nickel Based Catalysts for Bio Oil Hydrodeoxygenation

Atomic Level In-situ Characterization of Metal/TiO2 Photocatalysts under Light Irradiation in Water Vapor

Evaluation of Phase Segregation in Ternary Pt-Rh-SnO2 Catalysts Prepared from the Vapor Phase

Probing Structure-Property Relationship of Active Metal Nanoparticles on Mesoporous Silica Sorbent

Effect of Yttrium (Y) and Zirconium (Zr) Doping on the Thermodynamical Stability of the Cubic Ba0.5Sr0.5Co0.8Fe0.2O3-δ Phase

Observation of Pt-Atom Complexes in CaTi1-xPtxO3-δ

HAADF STEM of Phase Separated Anion Exchange Membranes Prepared by Ultracryomicrotomy

Effects of Sample Preparation Technique on Quantitative Analysis of Automotive Fuel Cell Catalyst Layers

Local Composition of Alloy Catalysts for Oxygen Reduction by STEM-EDS

In-situ TEM and Atomic-Resolution STEM Study of Highly Active Partially Ordered Cu3Pt Nanoparticles Used as PEM-Fuel Cells Catalyst

STEM-EDS Characterization of Platinum-Modified Nickel Nanoparticles

Aberration Corrected STEM Study on Pt0.8Ni De-alloyed Nanocatalysts for Proton Exchange Membrane Fuel Cells

Degradation Mechanisms of Platinum Nanoparticle Catalysts in Proton Exchange Membrane Fuel Cells: The Role of Particle Size

Uncovering Structure-Properties Relations in Fuel Cells and Catalysts with Quantitative Aberration-Corrected STEM and EELS

Platform Session 2

Tuesday, August 05, 2014 8:30 AM - Tuesday, August 05, 2014 10:00 AM

CCC - Room 15

  • Doug Perovic, University of Toronto ;
  • C. Kisielowski ;
  • S. Helveg ;
  • G. Yuan ;
  • H. Frei ;
  • Samuel Bastien ;
  • Christian Ricolleau ;
  • Nadi Braidy ;
  • Qiao Qiao ;
  • Peter Mirtchev ;
  • Yuyang Zhang ;
  • Manuel A Roldan ;
  • Maria Varela ;
  • Sokrates T. Pantelides ;
  • Doug D Perovic ;
  • Geoffrey Ozin ;
  • Stephen J. Pennycook ;
  • Qianlang Liu ;
  • Peter Crozier

Artificial Photosynthesis: Solar Fuels Nanomaterials

Atom Dynamics at the Gas-Catalysts Interface with Atomic Resolution

Plasma Synthesis of Facetted Nickel nano-Ferrites with Controlled Stoichiometry

Atomic and Electronic Structure of γFe2O3/Cu2O Heterostructured Nanocrystals

Structural Changes of Ta2O5 Photocatalyst under Reaction Conditions

Platform Session 3

Tuesday, August 05, 2014 10:30 AM - Tuesday, August 05, 2014 12:00 PM

CCC - Room 15

  • John C Walmsley ;
  • Randi Holmestad ;
  • Per Erik Vullum ;
  • Thomas W. Hansen ;
  • Federico Masini ;
  • Davide Deiana ;
  • Jane H. Nielsen ;
  • Ib Chorkendorff ;
  • David A Cullen ;
  • Karren L More ;
  • Miguel Lopez-Haro ;
  • Pascale Bayle-Guillemaud ;
  • Laure Guetaz ;
  • Mark Debe ;
  • Dennis F van der Vliet ;
  • Andrew J Steinbach ;
  • Kepeng Song ;
  • Herbert Schmid ;
  • Vesna Srot ;
  • Elisa Gilardi ;
  • Giuliano Gregori ;
  • Kui Du ;
  • Joachim Maier ;
  • Peter A. van Aken ;
  • Jae Hyuck Jang ;
  • Young-Min Kim ;
  • Qian He ;
  • Rohan Mishra ;
  • Liang Qiao ;
  • Michael D Biegalski ;
  • Andrew R. Lupini ;
  • Sokrates T. Pantelides ;
  • Stephen J. Pennycook ;
  • Sergei V. Kalinin ;
  • Albina Y Borisevich

Using (S)TEM Techniques to Study Energy related Materials at the Nanoscale

Morphology of Ruthenium Particles for Methanation Under Reactive Conditions

Fine Tuning Highly Active Pt3Ni7 Nanostructured Thin Films for Fuel Cell Cathodes

Cerium Reduction at the Interface Between Ceria and Yttria-Stabilised Zirconia and Implications for Interfacial Oxygen Non-stoichiometry

Studying Dynamics of Oxygen Vacancy Ordering in Epitaxial LaCoO3 / SrTiO3 Superlattice with Real-Time Observation

Platform Session 4

Tuesday, August 05, 2014 1:30 PM - Tuesday, August 05, 2014 3:00 PM

CCC - Room 15

  • Haimei Zheng, Lawerence Berkeley National Laboratory ;
  • Vladimir P Oleshko ;
  • Thomas Lam ;
  • Dmitry Ruzmetov ;
  • Albert V Davydov ;
  • Sergiy Krylyuk ;
  • Paul Haney ;
  • Henri Lezec ;
  • John Cumings ;
  • A. Alec Talin ;
  • Anmin Nie ;
  • Robert Klie ;
  • Sreeram Vaddiraju ;
  • Reza Shahbazian Yassar ;
  • Dong Su ;
  • Sung-Wook Kim ;
  • Kai He ;
  • Nathalie Pereira ;
  • Glenn G. Amatucci ;
  • Jason Graetz ;
  • Feng Wang, Brookhaven National Laboratory ;
  • Samartha A Channagiri ;
  • Robert M Nichol ;
  • Shrikant C Nagpure ;
  • Babu G Vishwanathan ;
  • David J McComb

In-situ Electrochemical Liquid Cell TEM Visualization of Electrode-Electrolyte Interfaces

Multimode STEM Imaging and Tomography of Radial Heterostructure Nanowire Li-Ion Mini-Batteries

Direct Atomic-Scale Imaging of Multistep Phase Transition During the Lithiation of Nanowires by In-Situ (S)TEM

Probing the Local Chemical and Structural Ordering of Iron Oxyfluoride, a Promising Electrode Material for Li-Ion Battery

Spatially Resolved Characterization of Phases in LiFePO4 Battery Cathodes Using Low Loss Electron Energy-loss Spectroscopy

Poster Session 2

Tuesday, August 05, 2014 3:30 PM - Tuesday, August 05, 2014 5:00 PM

CCC - Exhibit Hall AB

  • Akihiro Tanaka ;
  • Kenichi Tsutsumi ;
  • Hiroshi Onodera ;
  • Toyohiko Tazawa ;
  • Kai He ;
  • Peng Gao ;
  • Nathalie Pereira ;
  • Glenn G. Amatucci ;
  • Yimei Zhu, Brookhaven National Laboratory ;
  • Feng Wang, Brookhaven National Laboratory ;
  • Dong Su ;
  • Micah J Sussman ;
  • Nicolas Brodusch ;
  • Raynald Gauvin ;
  • George P. Demopoulos ;
  • Patrick J Phillips ;
  • Hakim Iddir ;
  • Roy Benedek ;
  • Daniel P Abraham ;
  • Robert F. Klie, University of Illinois at Chicago ;
  • Yifei Yuan ;
  • Anmin Nie ;
  • Sunand Santhanagopalan ;
  • Dennis D Meng ;
  • Reza S Yassar ;
  • Aaron C Johnston-Peck ;
  • Leonid A Bendersky ;
  • Andrew A Herzing ;
  • Ken R Anderson ;
  • Ram Bajaj ;
  • Rohit J Jacob ;
  • Wen-An Chiou ;
  • Michael R Zachariah ;
  • Elliot Padgett ;
  • Megan E Holtz ;
  • David A Muller ;
  • Haijun Wu ;
  • Lidong Zhao ;
  • Fengshan Zheng ;
  • Di Wu ;
  • Yangling Pei ;
  • Xiao Tong ;
  • Jiaqing He ;
  • jiaxin liu ;
  • jia xu ;
  • yudong huang ;
  • Jingyue Liu ;
  • Hossein Alimadadi ;
  • Cecilía Kjartansdóttir ;
  • Takeshi Kasama ;
  • Per Møller ;
  • Khim Karki ;
  • G G Amatucci ;
  • M S Whittingham ;
  • F Wang

An advanced quantitative analysis of Li in LIB with AES Preparation for a clean cross section with the Cross Section Polisher

Quantitative oxidation state analysis of transition metals in a lithium-ion battery with high energy resolution AES

Discovering a Novel Sodiation in FeF2 Electrodes for Sodium-Ion Batteries

Transmission Electron Forward Scattered Diffraction and Low Voltage SEM/STEM Characterization of Binder-Free TiO2 Electrodes

Imaging and Spectroscopy of Pristine and Cycled Li2MnO3

In-situ TEM Study on Electrochemical Behavior of α-MnO2 Nanowire

Characterization of a Layered Lithium Manganese-rich Oxide Cathode Material via Scanning Transmission Electron Microscopy

Microstructural and Microchemical Analyses of Extracted Second-Phase Precipitates in Alpha-Annealed and Beta-Quenched Zircaloy-4

Probing the Reaction Mechanism for Highly Reactive Nanothermite Formulations

Tomography and Spectroscopy of Structure and Degradation in Carbon Electrode Materials for Energy Conversion and Storage

Understanding the role of potassium doping in PbTe-PbS thermoelectrics

ZnO Nanowire Supported Ag Catalyst for Methanol Steam Reforming

Characterization of Aluminum and Nickel Thermochemical Diffusion for Synthesis of Alkaline Water Electrolysis Electrodes

In-Situ TEM Electrochemical Processes in Conversion-Based Li-Ion Battery Electrodes

Platform Session 5

Wednesday, August 06, 2014 8:30 AM - Wednesday, August 06, 2014 10:00 AM

CCC - Room 15

  • Yimei Zhu, Brookhaven National Laboratory ;
  • Marta D Rossell ;
  • Andreas Borgschulte ;
  • Rolf Erni, EMPA ;
  • Fengyuan Shi ;
  • Shih-Han Lo ;
  • Gangjian Tan ;
  • Li-Dong Zhao ;
  • Mercouri G Kanatzidis ;
  • Vinayak Dravid ;
  • J H Dycus ;
  • A Oni ;
  • X Sang ;
  • T Chan ;
  • C Koch ;
  • J M LeBeau ;
  • Katherine A. Spoth ;
  • Yao Sun ;
  • Ulrich Wiesner ;
  • Lena F. Kourkoutis

Revealing the Origin of "Phonon Glass–Electron Crystal" Behavior in Thermoelectric Layered Cobaltate by Accurate Displacement Measurement

Surface Reduction in Monoclinic BiVO4 for Photocatalytic Applications

Nanostructure-Assisted Phonon Scattering in Lead-Free Thermoelectric Materials: A TEM Investigation of the SnTe System

Observing the Interplay Between Composition and Phonon Transport in Bi2Te3-xSex Alloys using ADF STEM

Capturing the Structure of Mesoporous Silica Nanoparticles in Solution with Cryo-TEM

Platform Session 6

Wednesday, August 06, 2014 10:30 AM - Wednesday, August 06, 2014 12:00 PM

CCC - Room 15

  • Huolin L Xin ;
  • Feng Lin ;
  • Barnaby Levin ;
  • Michael J Zachman ;
  • Jörg G Werner ;
  • Ulrich Wiesner ;
  • Lena F. Kourkoutis ;
  • David A Muller ;
  • Charles D Amos ;
  • Jie Song ;
  • John B Goodenough ;
  • Paulo J Ferreira ;
  • Peng Gao ;
  • xiaoya wang ;
  • Liping Wang ;
  • Feng Wang, Brookhaven National Laboratory ;
  • Miaofang Chi, Oak Ridge National Laboratory ;
  • Bo Xu ;
  • Christopher Fell ;
  • Shirley Meng ;
  • jihui Yang ;
  • Sung Joo Kim ;
  • Alireza Kargar ;
  • Deli Wang ;
  • Xiaoqing Pan

A 3-D Phase Evolution Panorama Uncovered Using a Grid-in-a-Coin Cell Method for Conversion Reaction Electrodes in Lithium-ion Batteries

Characterizing Sulfur in TEM and STEM, with Applications to Lithium Sulfur Batteries.

Understanding the Surface Structure of LiNi0.45Mn1.55O4 Spinel Cathodes with Aberration-Corrected HAADF STEM

Tracking Displacement Reactions in CuxV2O5 Cathodes by In-Situ TEM

Probing Electrochemical Cycling Stability of Li-ion Cathode Materials at Atomic-scale

In-situ TEM Observation of Electrochemical Cycling of a Si/TiO2 Composite NW

A08 - Nano-Characterization of Emerging Photovoltaic Materials and Devices

  • Robert F. Klie, University of Illinois at Chicago ;
  • Moon Kim, University of Texas at Dallas

Platform Session 1

Wednesday, August 06, 2014 1:30 PM - Wednesday, August 06, 2014 3:00 PM

CCC - Room 15

  • Yanfa Yan ;
  • Chen Li ;
  • Yelong Wu ;
  • Wanjian Yin ;
  • Zhiwei Wang ;
  • Naba R Paudel ;
  • Jonathan Poplawsky ;
  • Timothy J. Pennycook ;
  • Wyatt K Metzger ;
  • Ingrid Repins ;
  • Mowafak Al-Jassim ;
  • Stephen J. Pennycook ;
  • Ce Sun ;
  • Ning Lu ;
  • Guoda Lian ;
  • Jinguo Wang ;
  • Xin Peng ;
  • Robert F. Klie, University of Illinois at Chicago ;
  • Moon J Kim ;
  • Sarah J. Haigh ;
  • Andrew R. Lupini ;
  • Mark P. Oxley ;
  • Liying Jiang ;
  • Toshihiro Aoki ;
  • John Kouvetakis ;
  • José Menéndez

Defect Physics in Photovoltaic Materials Revealed by Combined High-Resolution Microscopy and Density-Functional Theory Calculation

Creating Single Boundary Between Two CdTe (111) Wafers with Controlled Orientation by Wafer Bonding

Understanding Individual Defects in CdTe Solar Cells: From Atomic Structure to Electrical Activity

High Resolution EELS Study of Ge1-ySny and Ge1-x-ySixSny Alloys

Platform Session 2

Thursday, August 07, 2014 8:30 AM - Thursday, August 07, 2014 10:00 AM

CCC - Room 15

  • Eric Colegrove ;
  • Chris Buurma ;
  • Moon Kim, University of Texas at Dallas ;
  • Robert F. Klie, University of Illinois at Chicago ;
  • Toshihiro Aoki ;
  • Liying Jiang ;
  • Andrew VG Chizmeshya ;
  • José Menéndez ;
  • John Kouvetakis ;
  • David J Smith ;
  • Alexander D Giddings ;
  • Yizhi Wu ;
  • Marcel A Verheijen ;
  • Ty J Prosa ;
  • Fred Roozeboom ;
  • David J Larson ;
  • Erwin W M M Kessels ;
  • C Buurma ;
  • Tadas Paulauskas ;
  • Z Guo ;
  • R Klie ;
  • Maria K. Y. Chan

Characterization of Poly-Crystalline CdTe Solar Cells Using Aberration-Corrected Transmission Electron Microscope

Atomic Scale Studies of Structure and Bonding in AlPSi3 Alloys Grown Lattice-Matched on Si(001)

Compositional and Structural Analysis of Al-Doped ZnO Multilayers by LEAP

Density Functional Theory Modeling of Twin Boundaries in CdTe as Informed by STEM Observations

Platform Session 3

Thursday, August 07, 2014 1:30 PM - Thursday, August 07, 2014 3:00 PM

CCC - Room 15

  • Sebastian S Schmidt ;
  • Jens Dietrich ;
  • Christoph T. Koch ;
  • Bernhard Schaffer ;
  • Miroslava Schaffer ;
  • Max Klingsporn ;
  • Saoussen Merdes ;
  • Daniel Abou-Ras ;
  • Kirstin Alberi ;
  • Brian Fluegel ;
  • Angelo Mascarenhas ;
  • C. Kisielowski ;
  • J.A. Haber ;
  • J.M. Gregoire ;
  • Y. Cai ;
  • Guang Yang ;
  • Guangzhi Hu ;
  • Shaodong Cheng ;
  • Thomas Wagberg

Interfaces and Extended Structural Defects in Chalcopyrite Thin-Film Solar Cells Studied by Transmission Electron Microscopy

Photoluminescence Imaging of Semiconductors

Probing Structure/Property Relationships of Ce-Rich Oxygen Evolution Catalysts by Advanced Transmission Electron Microscopy

Atomic Resolution Characterization of Pt Based Bi-Metallic Nano-Catalysts Using Aberration Corrected STEM

Platform Session 4

Thursday, August 07, 2014 3:30 PM - Thursday, August 07, 2014 5:00 PM

CCC - Room 15

  • Ondrej Dyck ;
  • Andrew A Herzing ;
  • Hyun Wook Ro ;
  • Dean M DeLongchamp ;
  • Benjamin H Savitzky ;
  • Kevin Whitham ;
  • Kaifu Bian ;
  • Robert Hovden ;
  • Tobias Hanrath ;
  • Lena F. Kourkoutis

Electron Energy-Loss Spectroscopic Imaging for Phase Detection in Organic Photovoltaics

Linking Processing Parameters and Morphological Development in Organic Photovoltaics by Energy-Filtered TEM Imaging of Model Multilayer Structures

Three-Dimensional Arrangement and Connectivity of Lead-Chalcogenide Nanoparticle Assemblies for Next Generation Photovoltaics

Poster Session 1

Thursday, August 07, 2014 10:30 AM - Thursday, August 07, 2014 12:00 PM

CCC - Exhibit Hall AB

  • Heayoung P. Yoon ;
  • Paul M. Haney ;
  • Joshua Schumacher ;
  • Kerry Siebein ;
  • Yohan Yoon ;
  • Nikolai B. Zhitenev ;
  • Ahmed K. Al-Kamal ;
  • Jafar Al-Sharab ;
  • Hadi Halim ;
  • Gang Xiong ;
  • Bernard H. Kear ;
  • Ivonne Carvajal ;
  • George P. Demopoulos ;
  • Raynald Gauvin ;
  • Jessica A. Alexander ;
  • Michael F. Durstock ;
  • Christopher E. Tabor ;
  • Benjamin J. Leever ;
  • Lawrence F. Drummy ;
  • Michael D. Clark ;
  • Dennis P. Butcher ;
  • Frank J. Scheltens ;
  • David W. McCOmb ;
  • Julia Deitz ;
  • Santino D Carnivale ;
  • Marc DeGraef ;
  • Yoosuf N. Picard, Carnegie Mellon University ;
  • Stephen Ringel ;
  • Tyler Grassman ;
  • David McComb ;
  • Dinghao Tang ;
  • Yeongho Kim ;
  • Nikolai Faleev ;
  • Christiana Honsberg ;
  • David J Smith

Effects of Focused-Ion-Beam Processing on Local Electrical Measurements of Inorganic Solar Cells

Duplex Nanostructured TiO2 Powder

Spatial Distribution of Light Scattering and Absorption Interactions with TiO2 - Nanoparticles from Monte Carlo and Generalized-Multiparticle-Mie based Simulations for Dye-Sensitized Solar Cell Analysis and Optimization

Investigation of the Use of Stereo-Pair Data Sets in Electron Tomography Characterization of Organic-Based Solar Cells

­Using Electron Channeling Contrast Imaging for Misfit Dislocation Characterization in Heteroepitaxial III-V/Si Thin Films

Microscopic Investigation of Mono-Layer/Multi-Layer Self-Assembled InAs QDs on GaAs1-xSbx/GaAs Composite Substrates for Photovoltaic Solar Cells

A09 - Frontiers in Analytical TEM-STEM

  • Gianluigi Botton, McMaster University ;
  • Juan-Carlos Idrobo, Oak Ridge National Laboratory ;
  • Ai Leen Koh, Standford University ;
  • Paolo Longo, Gatan Inc.

Platform Session 1

Wednesday, August 06, 2014 8:30 AM - Wednesday, August 06, 2014 10:00 AM

CCC - Room 22

  • Maria Varela ;
  • Juan Salafranca ;
  • Neven Biskup ;
  • Jaume Gazquez ;
  • Mark P. Oxley ;
  • Virat Mehta ;
  • Yuri Suzuki ;
  • Shameek Bose ;
  • Manish Sharma ;
  • Chris Leighton ;
  • Weidong Luo ;
  • Sokrates T. Pantelides ;
  • Stephen J. Pennycook ;
  • Tracy C Lovejoy ;
  • Niklas Dellby ;
  • Toshi Aoki ;
  • George J Corbin ;
  • Petr Hrncirik ;
  • Zoltan S Szilagyi ;
  • Ondrej L Krivanek ;
  • Giuseppe Nicotra ;
  • Paolo Longo, Gatan Inc. ;
  • Mario Scuderi ;
  • Ioannis Deretzis ;
  • Filippo Giannazzo ;
  • Antonino La Magna ;
  • Ray D Twesten ;
  • Corrado R Spinella ;
  • Quentin M Ramasse ;
  • Feridoon Azough ;
  • Roland Mainz ;
  • Demie M Kepaptsoglou ;
  • A Webber ;
  • Daniel Abou-Ras ;
  • Ekin Simsek ;
  • Peter van Aken

Oxygen Vacancy Ordering: a Degree of Freedom that can Control the Structural, Electronic and Magnetic Properties of Transition-Metal Oxide Films.

Energy-Filtered High-Angle Dark Field Mapping of Ultra-Light Elements

Observation of Layer by Layer Graphitization of 4H-SiC, Through Atomic-EELS at Low Energy

Atomic-Scale STEM-EELS Characterization of the Chemistry of Structural Defects and Interfaces in Energy-Related Materials

Platform Session 2

Wednesday, August 06, 2014 10:30 AM - Wednesday, August 06, 2014 12:00 PM

CCC - Room 22

  • Nestor J Zaluzec ;
  • Jan Ringnalda ;
  • Arda Genc ;
  • Libor Kovarik ;
  • Chad M Parish ;
  • Michael K Miller ;
  • Gerald Kothleitner ;
  • Melissa J Neish ;
  • Nathan R Lugg ;
  • Scott D. Findlay ;
  • Werner Grogger ;
  • Ferdinand Hofer ;
  • Leslie J Allen

XEDS in the AEM: Has Everything Thing That Can be Invented, Been Invented?

The Effect of Probe Correctors on the Analytical Results of Non-ideal Samples

Aberration-Corrected Four-Detector STEM-EDS Analysis of Embedded Nanoclusters

Quantitative EDX and EELS Elemental Mapping at Atomic Resolution

Platform Session 3

Wednesday, August 06, 2014 1:30 PM - Wednesday, August 06, 2014 3:00 PM

CCC - Room 22

  • Mathieu Kociak ;
  • Judy J Cha ;
  • Kristie Koski ;
  • Kevin Huang ;
  • Ken Wang ;
  • Weidong Luo ;
  • Desheng Kong ;
  • Zongfu Yu ;
  • Shanhui Fan ;
  • Mark L Brongersma ;
  • Yi Cui ;
  • Maureen J Lagos ;
  • Alejandro Reyes-Coronado ;
  • Pedro M Echenique ;
  • Javier Aizpurua ;
  • Philip E Batson ;
  • Robert E. A. Williams ;
  • Santino D Carnivale ;
  • Thomas F Kent ;
  • David J Stowe ;
  • Roberto C Myers ;
  • David W. McComb ;
  • Nahid Talebi ;
  • Burcu Ögüt ;
  • Wilfried Sigle ;
  • Ralf Vogelgesang ;
  • Peter A. van Aken

From Quantum Confinement to Quantum Electrodynamics using nanoCathodoluminescence in a STEM

Tunable Plasmon and Optical Properties of Chalcogenide Nanoplates Using Monochromated Electron Energy Loss Spectroscopy

Attosecond Forces Imposed by Swift Electrons on Nanometer-Sized Metal Particles

Electron Energy Loss Spectroscopy and Localized Cathodoluminescence Characterization of GaN Quantum Discs

Plasmons of Hexamer and Pentamer Nanocavities Probed with Swift Electrons

Poster Session 1

Wednesday, August 06, 2014 3:30 PM - Wednesday, August 06, 2014 5:00 PM

CCC - Exhibit Hall AB

  • Takahito Hashimoto ;
  • Keiji Tamura ;
  • Hiromi Inada ;
  • Keitaro Watanabe ;
  • Yoshihiro Ohtsu ;
  • Yuya Suzuki ;
  • Takahiro Sato ;
  • Takashi Kanemura ;
  • Simon Burgess ;
  • James Holland ;
  • Iain Anderson ;
  • Susumu Yamaguchi ;
  • Kuniyasu Nakamura ;
  • Masaki Mukai ;
  • Eiji Okunishi ;
  • Masanori Ashino ;
  • Kazuya Omoto ;
  • Tomohisa Fukuda ;
  • Akihiro Ikeda ;
  • kazunori Somehara ;
  • Toshikatsu Kaneyama ;
  • Tomohiro Saitoh ;
  • Tsukasa Hirayama ;
  • Yuichi Ikuhara ;
  • Hendrik O Colijn ;
  • Fan Yang ;
  • David B. Williams ;
  • Alan Sandborg ;
  • David W. McComb ;
  • James Bentley ;
  • James E Wittig ;
  • James R McBride ;
  • Alan O Sandborg ;
  • Patrick Camus ;
  • Brent Hammell ;
  • Jie Shen ;
  • Judy J Cha ;
  • Yuncheng Song ;
  • Minjoo Larry Lee ;
  • Cecile Bonifacio ;
  • Sophie Carenco ;
  • Miquel Salmeron ;
  • Judith C Yang ;
  • Joshua D Sugar ;
  • Alexander A Kane ;
  • Alexandra C Ford ;
  • Michael J Rye ;
  • Lisa M Lowery ;
  • Francois Leonard ;
  • Mohammad Attarian Shandiz ;
  • Francesc Salvat ;
  • Raynald Gauvin ;
  • Qingxiao Wang ;
  • Yihan Zhu ;
  • Jianfeng Huang ;
  • Yu Han ;
  • Franz Philipp Schmidt ;
  • Harald Ditlbacher ;
  • Ulrich Hohenester ;
  • Andreas Hohenau ;
  • Ferdinand Hofer ;
  • Joachim R Krenn ;
  • Jihua Chen ;
  • Marek Malac ;
  • Koji Kimoto ;
  • Ray Egerton ;
  • Prashant Shekhar ;
  • Zubin Jacob ;
  • Yoshifumi Taniguchi ;
  • Vaibhav Gaind ;
  • Hefei Hu ;
  • Milinda Abeykoon ;
  • Lijun Wu ;
  • Yimei Zhu, Brookhaven National Laboratory ;
  • Simon Billinge ;
  • Juchul Park ;
  • Hyo Seon Kim

Development of Two Steradian EDX System for the HD-2700 FE-STEM Equipped with Dual X-MaxN 100 TLE Large Area Windowless SDDs

Monochromator for Aberration-Corrected STEM

Performance of an Improved TEM SDD Detector

Beam Damage During Energy-Dispersive X-ray Spectroscopy of FePt Nanoparticles

A Comparison of Cross Section Formulas and their Effect on Calculated k-factors

Spatially Resolved In and As Distributions in InGaAs/GaP and InGaAs/GaAs Quantum Dot Systems

Thermal Stability Study of Ni-Co Core-Shell Nanoparticles by In Situ TEM

Comparison of Analysis Routines for EDS and EELS Spectrum Images of Electrical Contacts to Single-Walled Carbon Nanotubes.

Monte Carlo Simulation of Electron Energy Loss Spectra of Group III-Nitride Nanoscale Semiconductors

STEM Tomography and Surface Plasmon Imaging of a Au-Pd Bi-metallic Nanorod with Exotic Morphology

Universal Scaling of Surface Plasmon Modes

TEM of Nanostructured Organic and Hybrid Materials for Photovoltaic and Battery Applications

Angle-Resolved Valence EELS of a Single Crystal Gold Sample

Quantitative Structural Analysis of Nanoparticles Using Electron Pair Distribution Function (ePDF)

Characterization of Metal-doped Mn3O4 Particles by Scanning Transmission Electron Microscopy and Electron Energy Loss Spectroscopy

Platform Session 2

Thursday, August 07, 2014 8:30 AM - Thursday, August 07, 2014 10:00 AM

CCC - Room 22

  • Richard D Leapman ;
  • Maria A Aronova ;
  • Timothy J. Pennycook ;
  • Lewys Jones ;
  • Mariona Cabero ;
  • Alberto Ribera-Calzada ;
  • Carlos Leon ;
  • Maria Varela ;
  • Jacobo Santamaria ;
  • Peter Nellist ;
  • Eiji Okunishi ;
  • Noriaki Endo ;
  • Yukihito Kondo ;
  • Steven J Madsen ;
  • Paul J Kempen ;
  • Robert Sinclair ;
  • Paul Cueva ;
  • David A Muller

EELS and EFTEM Analysis of Biological Materials

Optical Sectioning with Atomic Resolution Spectroscopy

Atomic Column Elemental Mapping by STEM-Moiré Method

Observing Plasmon Damping Effects of Metallic Adhesion Layers in E-Beam Synthesized Nanostructures Using STEM-EELS and Raman Spectroscopy

High Resolution Optical and Vibrational Spectroscopy with Low Loss EELS

Platform Session 3

Thursday, August 07, 2014 1:30 PM - Thursday, August 07, 2014 3:00 PM

CCC - Room 22

  • Robert Colby ;
  • H.K.L. Zhang ;
  • Arda Genc ;
  • Lee Pullan ;
  • Bernd Kabius ;
  • Scott Chambers ;
  • Enzo Rotunno ;
  • Vincenzo Grillo ;
  • Toni Markurt ;
  • Thilo Remmele ;
  • Martin Albrecht ;
  • Peter Oleynikov ;
  • Yanhang Ma ;
  • Nobuhisa Fujita ;
  • Javier Garcia-Garcia ;
  • Kyung Byung Yoon ;
  • An Pang Tsai ;
  • Osamu Terasaki ;
  • Santokh Bhadare ;
  • Patrick J Phillips ;
  • Tadas Paulauskas ;
  • Robert Klie ;
  • Neil Rowlands ;
  • Alan Nicholls ;
  • Andrew M Thron ;
  • Aleksandr Polyakov ;
  • Peter (Jim) J Schuck ;
  • Shaul Aloni ;
  • Todd H Brintlinger ;
  • Andy A Herzing ;
  • Jim P Long ;
  • Rhonda M. Stroud ;
  • Igor Vurgaftman ;
  • Blake S Simpkins

The Role of Cation Intermixing, Interfacial Chemistry, and Oxygen Deficiency in Understanding the Properties of the LaFeO3/SrTiO3(100) Interface

Methods for Scanning Transmission Electron Microscopy High Angle Annular Dark Field Based for Three Dimensional Analysis of the Local Composition in Solid Alloys

Structure Analysis of a Hyper-Complex Approximant to Icosahedral Quasicrystal using 3D Electron Diffraction Tomography

Very Large Solid Angle Windowless SDD Applications for Nanostructure and Semiconductor Applications

Investigation of Surface Plasmon Coupling and Damping in Au and Ag Nanoparticle Assemblies by Monochromated Electron Energy Loss Spectroscopy

Electron-Energy Loss and Optical Spectroscopy of Hybrid Nanogap-Antennas on Different Substrates

A10 - X-ray Imaging

  • Jeffrey M. Davis, National Institute of Standards and Technology ;
  • Ric Wuhrer, University of Western Sydney ;
  • Eric Telfeyan

Platform Session 1

Wednesday, August 06, 2014 10:30 AM - Wednesday, August 06, 2014 12:00 PM

CCC - Room 12

  • Richard Wuhrer ;
  • Lydia Guja ;
  • David Merritt ;
  • Ken Moran ;
  • Ryan Zeigler ;
  • Paul Carpenter, Washington University in St. Louis ;
  • Bradley L Jolliff ;
  • Yuhei Nakajima ;
  • Minoru Suzuki ;
  • Naoki Kikuchi ;
  • Shunsuke Asahina ;
  • Kazuteru Kawauchi ;
  • Takeshi Nokuo ;
  • Natasha Erdman ;
  • Masateru Shibata ;
  • Anthony Hyde ;
  • Conor McCarthy ;
  • Simon Burgess ;
  • Nigel Meeks ;
  • Michael Haschke ;
  • Ulrich Waldschläger ;
  • Roald Tagle ;
  • Uwe Rossek

X-Ray Mapping Investigations of Salt Migration in Seeds through use of Window and Windowless Silicon Drift Detectors

Identification of New Lithic Clasts in Lunar Breccia 14305 by Micro-CT and Micro-XRF Analysis

Ultra High Solid Angle EDS System Advanced STEM Analysis for FE-SEM

Large Area EDS Mapping: Automated Collection of High Resolution Elemental Maps For Post Acquisition Analysis

Multidimensional Data Sets – Presentation, Evaluation and Extraction

Platform Session 2

Wednesday, August 06, 2014 1:30 PM - Wednesday, August 06, 2014 3:00 PM

CCC - Room 12

  • Timothy D Murphy ;
  • Adam J Roper ;
  • Simon Hager ;
  • Richard Wuhrer ;
  • Peter Leverett ;
  • Peter A Williams ;
  • David Edwards ;
  • Neil Rowlands ;
  • Donna Guarrera ;
  • Richard McLaughlin ;
  • Natasha Erdman ;
  • Vern Robertson ;
  • Chaoyi Teng ;
  • Raynald Gauvin ;
  • Nicolas Brodusch ;
  • Hendrix Demers ;
  • Patrick Woo ;
  • Heike Soltau ;
  • Robert Hartmann ;
  • Peter Holl ;
  • Sebastian Ihle ;
  • Henning Ryll ;
  • Martin Huth ;
  • Julia Schmidt ;
  • Rouven Eckhardt ;
  • Martin Simson ;
  • Jakob Soltau ;
  • Christian Thamm ;
  • Lothar Strueder

Mineral Analyses & Implications on the Dispersion of Bismuth in the Supergene Environment of Eastern Australia.

Investigation of Multiple, Large Area EDS Detectors on an SEM Capable of Various Mounting Geometries for Optimal EDS Analysis

Characterization of Rare Earth Element Ores with High Spatial Resolution Scanning Electron Microscopy

X-Ray Microanalysis with High Spatial Resolution and High Counts Rate with a State of the Art Field Emission Scanning Electron Microscope

High-Speed, High-Resolution pnCCDs as Two-Dimensional Imaging Spectrometers for X-rays and Electrons

Platform Session 3

Thursday, August 07, 2014 8:30 AM - Thursday, August 07, 2014 10:00 AM

CCC - Room 12

  • Antoine Vandecreme ;
  • Peter Bajcsy ;
  • Nicholas W.M. Ritchie ;
  • John Henry J. Scott ;
  • Jeffrey M. Davis, National Institute of Standards and Technology ;
  • Francis B Lavoie ;
  • Nadi Braidy ;
  • Sonia Blais ;
  • Ryan Gosselin ;
  • Corrie van Hoek

Interactive Analysis of Terabyte-sized SEM-EDS Hyperspectral Images

Support Vector Machines for Classification and Quantitative Analysis

Comparison of Principal Component Analysis and Multivariate Curve Resolution-Alternating Least Squares analysis of XPS spectral maps

How to Process Zillions of Spectra from Spectral Imaging Datasets?

Poster Session 4

Thursday, August 07, 2014 10:30 AM - Thursday, August 07, 2014 12:00 PM

CCC - Exhibit Hall AB

  • Timothy D Murphy ;
  • Peter Fisher ;
  • Adam J Roper ;
  • Jason K Reynolds ;
  • Richard Wuhrer ;
  • Brian M. Patterson ;
  • Nikhilesh Chawla ;
  • Jason Williams ;
  • Xianghui Xiao ;
  • Mathew Robinson ;
  • Zachary Smith ;
  • Kevin C Henderson ;
  • Nikolaus L. Cordes ;
  • Joseph D Ferrara ;
  • Yoichi Araki ;
  • Kensaku Hamada ;
  • Kazuhiko Omote ;
  • Yoshihiro Takeda ;
  • Hendrix Demers ;
  • Nicolas Brodusch ;
  • Ken Moran ;
  • Patrick Woo ;
  • Raynald Gauvin ;
  • Leon Moran

X-ray Mapping Investigations of the Monazites from the Mt Weld Deposit - Compositional Variance as an Indicator of Provenance

In-situ Compression Imaging of Polymer Foams using Synchrotron X-ray Computed Tomography

The Use of a High-Resolution, High-Contrast X-ray Microscope to Probe the Internal Structure of Low Z Materials

X-ray Quantitative Microanalysis Maps across Interfaces of a Cu-Al Roll Bonded Laminate with an Annular Silicon Drift Detector

X-ray Mapping and Chemical Phase Mapping with an Amptek SDD

Platform Session 4

Thursday, August 07, 2014 1:30 PM - Thursday, August 07, 2014 3:00 PM

CCC - Room 12

  • Steffi Rades ;
  • Tobias Salge ;
  • Roland Schmidt ;
  • Vasile-Dan Hodoroaba ;
  • Daniel M Ruscitto ;
  • Elizabeth Cleland ;
  • Lauraine Denault ;
  • David A Wark ;
  • Nikolaus L. Cordes ;
  • Joseph Cowan ;
  • Christopher E. Hamilton ;
  • Kimberly A. Obrey ;
  • Brian M. Patterson ;
  • Si Chen

Need for Large-Area EDX Detectors for Imaging Nanoparticles in a SEM Operating in Transmission Mode

Mineral Classification Using Computer-Controlled Scanning Electron Microscopy

Quantitative Density Analysis of Ultra-Low Density Polymer Foams Using Various X-ray Imaging Techniques

Fluorescence Micro-tomography of Frozen-hydrated Whole Cells using the Bionanoprobe

A11 - Frontiers of Electron-Probe Microanalysis

  • John Armstrong, Carnegie Institution for Science ;
  • Paul Carpenter, Washington University in St. Louis ;
  • Hideyuki Takahashi, JEOL Inc ;
  • Mike Jercinovic, University of Massachusetts Amherst

Platform Session 1

Wednesday, August 06, 2014 8:30 AM - Wednesday, August 06, 2014 10:00 AM

CCC - Room 24

  • Silvia Richter ;
  • Philippe T Pinard ;
  • Hideyuki Takahashi, JEOL Inc ;
  • Nobuo Handa ;
  • Takanori Murano ;
  • Masato Koike ;
  • Takashi Imazono ;
  • Masaru Koeda ;
  • Tetsuya Nagano ;
  • Hiroyuki Sasai ;
  • Yuki Oue ;
  • Zeno Yonezawa ;
  • Satoshi Kuramoto ;
  • Masami Terauchi ;
  • Shunsuke Asahina ;
  • Yusuke Sakuda ;
  • Naoki Kikuchi ;
  • Kazuteru Kawauchi ;
  • Takeshi Nokuo ;
  • Ferdi Schüth ;
  • Osamu Terasaki

Analytical Challenges and Strategies in FE-EPMA

Present State of TEM-SXES Analysis and its Application to SEM aiming Chemical Analysis of Bulk Materials

Exciting Possibilities of Soft X-ray Emission Spectroscopy as Chemical State Analysis in EPMA and FESEM

Recent Achievement of Electron Beam Deceleration Method for FE-SEM Enhanced Elemental Analysis including Soft X-ray Emission Spectroscopy

Platform Session 2

Wednesday, August 06, 2014 10:30 AM - Wednesday, August 06, 2014 12:00 PM

CCC - Room 24

  • Peter McSwiggen ;
  • John T Armstrong ;
  • Charles Nielsen ;
  • Peter J Statham ;
  • Heather A Lowers ;
  • Doug B Stoeser ;
  • Nicholas Ritchie ;
  • Dale E Newbury

Strategies for Low Accelerating Voltage X-ray Microanalysis of Sub-Micrometer Features with the FE-EPMA

Progress towards Accurate Quantitative Standardless X-ray Analysis at Low kV

Comparative Performance of SDD-EDS and WDS Detectors for Quantitative Analysis of Mineral Specimens: The Next Generation Electron Microprobe

Comparison of SEM-EDS and EPMA-WDS Analysis of Rare Earth Element Containing Minerals from Bokan Mountain, Alaska

Standardless Analysis – Better but Still Risky

Platform Session 3

Wednesday, August 06, 2014 1:30 PM - Wednesday, August 06, 2014 3:00 PM

CCC - Room 24

  • Phillip Gopon ;
  • John Fournelle ;
  • Peter Sobol ;
  • Mike Spicuzza ;
  • Philippe T Pinard ;
  • Silvia Richter ;
  • Xavier Llovet ;
  • John Valley ;
  • Erkki Heikinheimo ;
  • Dale E Newbury ;
  • Nicholas W.M. Ritchie ;
  • Ben Buse ;
  • Stuart Kearns ;
  • Richard B Mott ;
  • Owen E Healy ;
  • Abigail P Lindstrom

Soft X-Ray EPMA Analyses of Extremely Reduced phases from Apollo 16 regolith: problems and solutions for sub-micron analysis

Towards Reliable Quantification of Steel Alloys at Low Voltage

Quantitative X-ray Microanalysis of Low Atomic Number Elements by SEM/SDD-EDS with NIST DTSA II: Carbides and Nitrides and Oxides, Oh My!

Importance of Carbon Contamination in High-Resolution (FEG) EPMA of Silicate Minerals

Quantitative Analysis using Asymmetric Adaptive Pulse Processing

Poster Session 1

Wednesday, August 06, 2014 3:30 PM - Wednesday, August 06, 2014 5:00 PM

CCC - Exhibit Hall AB

  • Claude Merlet ;
  • Andrew N Davis ;
  • Chrystel Hombourger ;
  • Michel Outrequin ;
  • Stuart Kearns ;
  • Ben Buse ;
  • Jon Wade ;
  • Norihisa Mori ;
  • Naoki Kato ;
  • Shigeru Honda ;
  • Syuichi Sakamoto ;
  • Masaru Takakura ;
  • Peter McSwiggen ;
  • Charles Nielsen ;
  • Stephen M Seddio ;
  • Nicholas Ritchie ;
  • Abigail P Lindstrom ;
  • Nicholas W.M. Ritchie ;
  • Julie Chouinard ;
  • John Donovan ;
  • Ellen Aster ;
  • Paul Wallace ;
  • Denton S Ebel ;
  • Ellen J Crapster-Pregont ;
  • Friedrich M Jon ;
  • Guillermina Gonzalez ;
  • Omar Amador ;
  • B L Valle ;
  • G L Santos ;
  • A E Hernandez ;
  • Yu Sun ;
  • Kaustubh Kulkarni ;
  • Mark Aindow ;
  • Anil K Sachdev ;
  • Enrique J Lavernia ;
  • Don Lesher

Analytical Multilayer Model Revisited for High Atomic Numbers at Low Voltage

Quantitative Microanalysis at Low Voltage with a WDS Electron Microprobe Equipped with a FE Column

Mitigating Thermal Beam Damage with Metallic Coats in Low Voltage FEG-EPMA of Geological Materials

Development of an Automated Phase Analysis Procedure for Multi-Component Samples in EPMA

Overcoming Quantitative Challenges Presented By X-Ray Line Interferences in EDS and WDS

Optimizing the Dose for Energy Dispersive Electron Probe X-ray Microanalysis Measurements

Detecting Difficult Minor Elements in Particle Samples by SEM-EDS

Quantitative Mapping of and Secondary Fluorescence Effects in Olivine Hosted Melt Inclusions

Image Analysis of 2D X-ray Intensity Maps: Element Abundances, Mineralogy, and Modal Analysis of Meteorites

Morphology and Elemental Composition of Atmospheric Particles from Mexico Valley by Scanning Electron Microscopy

EPMA Studies on Reactions Between Ti and Al During Spark Plasma Sintering

Improving Analytical Efficiency of WD Spectrometers using Solid-State Detectors

Platform Session 4

Thursday, August 07, 2014 8:30 AM - Thursday, August 07, 2014 10:00 AM

CCC - Room 24

  • Xavier Llovet ;
  • Philippe T Pinard ;
  • Francesc Salvat ;
  • Paul K Carpenter ;
  • Bradley L Jolliff ;
  • John J. Donovan ;
  • Stephen M Seddio ;
  • Sarah N North-Valencia ;
  • Randy L Korotev ;
  • Ting Lin ;
  • Ed Vicenzi ;
  • Aiden A Martin ;
  • Milos Toth ;
  • Andrew Westphal ;
  • Jeff Beeman ;
  • Eugene Haller

Application of Monte Carlo Calculations to Improve Quantitative Electron Probe Microanalysis

Compositional Mapping by EPMA and μXRF

Spectrum-based Phase Mapping of Apatite and Zoned Monazite Grains using Principal Component Analysis

Using Electron-Probe Microanalysis and Quantitative Compositional Mapping to Study Lithic Clasts in Lunar Meteorites NWA 2727 and NWA 3170

Interdisciplinary X-Ray Microanalysis: From Planets and Comets to Artifacts and Fine Art

Platform Session 5

Thursday, August 07, 2014 1:30 PM - Thursday, August 07, 2014 3:00 PM

CCC - Room 24

  • Karsten Goemann ;
  • Olga V Vasyukova ;
  • Vadim S Kamenetsky ;
  • Colin M. MacRae, CSIRO-Minerals ;
  • Nick C Wilson ;
  • Julien M. Allaz ;
  • Michael J. Jercinovic ;
  • Michael L. Williams ;
  • John J. Donovan ;
  • Paul K Carpenter ;
  • John T Armstrong

Determination of Trace Elements in Quartz by Combined EPMA and CL Microspectrometry

Trace Element Analyses by EMP: Pb-in-Monazite and New Multipoint Background Method

Quantitative Electron-probe Microanalysis and WDS Background Measurement

A New EPMA Method For Fast Trace Element Analysis In Simple Matrices

Platform Session 6

Thursday, August 07, 2014 3:30 PM - Thursday, August 07, 2014 5:00 PM

CCC - Room 24

  • John T Armstrong ;
  • John J. Donovan ;
  • Jon Wade ;
  • Ben Buse ;
  • Stuart Kearns ;
  • Vasile-Dan Hodoroaba ;
  • Ryna B. Marinenko ;
  • Vanessa Rackwitz ;
  • Wolfram Bremser ;
  • Wolfgang E. S. Unger ;
  • Douglas Meier ;
  • Jeffrey M. Davis, National Institute of Standards and Technology ;
  • Frederick Meisenkothen ;
  • Scott A. Wight, National Institute of Standards and Technology ;
  • Craig S Schwandt

What's Still Missing with the Fluorescence Corrections and Should We Care?

FEG-EPMA of Solid State Redox Sensors – the Effect of Secondary Fluorescence on Analytical Precision.

Determination of the k-Values of Copper-Gold Alloys with ED- and WD-EPMA – Results of an Inter-laboratory Comparison

EPMA WDS Quality Assurance: Materials and Methods

Low Energy Microanalysis by EDS or WDS? Comparisons and Concerns from an Analytical Services Laboratory Perspective

Round Table Discussion: Moseley's Legacy at 100 Years

A12 - 3D Imaging and Microanalysis: Image Analysis and Applications

  • Paul G. Kotula, Sandia National Laboratories ;
  • Keana C.K. Scott

Platform Session 1

Tuesday, August 05, 2014 10:30 AM - Tuesday, August 05, 2014 12:00 PM

CCC - Room 17

  • Michael R Keenan ;
  • Arda Genc ;
  • Jan Ringnalda ;
  • Huikai Cheng ;
  • Paul Fischione ;
  • Meng Gu ;
  • Chong-Min Wang ;
  • Libor Kovarik ;
  • Lee Pullan ;
  • Bert Freitag ;
  • John M Sosa ;
  • Daniel E Huber ;
  • Brian Welk ;
  • Jacob K Jensen ;
  • Robert E. A. Williams ;
  • Stuart Lambert ;
  • Hamish L Fraser ;
  • Bart Goris ;
  • Daniele Zanaga ;
  • Eva Bladt ;
  • Thomas Altantzis ;
  • Sara Bals ;
  • R. Prakash Kolli ;
  • Frederick Meisenkothen

Challenges and Opportunities in the Multivariate Analysis of 3-D Spectral Images

Towards Quantitative 3D Chemical Analysis in TEM Using Quadrant XEDS Detector Geometry

3D ChemiSTEM™ Tomography of Nano-scale Precipitates in High Entropy Alloys

Towards Quantitative EDX Results in Three Dimensions.

Optimization of Experimental Parameters and Specimen Geometry for Pulsed-Laser Atom-Probe Tomography of Copper

Platform Session 2

Tuesday, August 05, 2014 1:30 PM - Tuesday, August 05, 2014 3:00 PM

CCC - Room 17

  • Michael P Marsh ;
  • Keana C.K. Scott ;
  • Rhonda M. Stroud ;
  • Nabil D. Bassim ;
  • Aric W. Sanders ;
  • Anna Fox ;
  • Paul Dresselhaus ;
  • Alexandra E Curtin ;
  • Terry S Yoo ;
  • Bradley C Lowekamp ;
  • Oleg Kuybeda ;
  • Kedar Narayan ;
  • Gabriel A Frank ;
  • Alberto Bartesaghi ;
  • Mario Borgnia ;
  • Sriram Subramaniam ;
  • Guillermo Sapiro ;
  • Michael J Ackerman

Data Processing Challenges for Proper Interpretation of FIB-SEM Nanotomography Imaging Applications

Optimization of Focused Ion Beam-Tomography for Superconducting Electronics

Accelerating Discovery in 3D Microanalysis: Leveraging Open Source Software and Deskside High Performance Computing

Poster Session 1

Tuesday, August 05, 2014 3:30 PM - Tuesday, August 05, 2014 5:00 PM

CCC - Exhibit Hall AB

  • Julie Wittenzellner ;
  • Neal J. Magdefrau ;
  • Daniel Goberman ;
  • Richard McLaughlin ;
  • Sreenivas Bhattiprolu ;
  • Daniel Bufford ;
  • Sarah H Pratt ;
  • Timothy J Boyle ;
  • Khalid Hattar ;
  • Singanallur V Venkatakrishnan ;
  • Ming-Siao Hsiao ;
  • Nick Garvin ;
  • Michael A Jackson ;
  • Marc DeGraef ;
  • Jeff Simmons ;
  • Charles A Bouman ;
  • Lawrence F. Drummy ;
  • Mary Scott ;
  • Chien-Chun Chen ;
  • Hao Zeng ;
  • Peter Ercius ;
  • John Miao ;
  • Misa Hayashida ;
  • Marek Malac ;
  • Michael Bergen ;
  • Ray Egerton ;
  • Jing Charlotte Li ;
  • Dong Su ;
  • Huolin L Xin ;
  • Todd H Brintlinger ;
  • Mark E Twigg ;
  • Harold (Hap) L Hughes ;
  • Scott R Broderick ;
  • Sonal Padalkar ;
  • Santoshrupa Dumpala ;
  • Krishna Rajan ;
  • David L Jaeger ;
  • Sanghita Mridha ;
  • Deep Choudhuri ;
  • Sundeep Mukherjee ;
  • Rajarshi Banerjee ;
  • Diwaker Jha ;
  • Henning Osholm Sørensen ;
  • Dirk Müter ;
  • Susan Louise Svane Stipp ;
  • Kim N Dalby ;
  • Arno P. Merkle ;
  • Leah Lavery ;
  • Jeff Gelb ;
  • Nicolas Piche ;
  • Jiří Janáček ;
  • Lucie Kubínová ;
  • Xiao W Mao ;
  • Phil Fraundorf ;
  • Jamie Daugherty ;
  • P. Fraundorf ;
  • Agustin J Avila-Sakar ;
  • Blake M Milner ;
  • Fei Guo ;
  • Wen Jiang ;
  • B. Ellen Scanley ;
  • Thomas E Sadowski ;
  • Candice I Pelligra ;
  • Melissa E Kreider ;
  • Chinedum O Osuji ;
  • Christine C Broadbridge ;
  • Stephen C Murray ;
  • Jesus G Galaz-Montoya ;
  • Grant Tang ;
  • John F Flanagan ;
  • Steven J Ludtke

3D EDS Applications Using Destructive and Non-Destructive FIB-Based Techniques

Time-Resolved 3D Imaging of Ion Beam Induced Surface Damage in Gold Nanoparticles

Model-Based Iterative Reconstruction for Low-Dose Electron Tomography

Atomic Resolution Tomography of Magnetically Anisotropic FePt Nanoparticles

Electron Diffraction-Based Tilt Angle Measurements in Electron Tomograph

A Model Based Method for Tomographic Reconstructions of Nanoparticle Assemblies

Energy-Filtered Transmission Electron Microscope Tomography of Silicon Nanoparticles in Silicon Dioxide Deposited with High Density Plasma Chemical Vapor Deposition

Data Intensive Imaging for 3D Atom Probe

Compositional Analysis of As-Cast and Crystallized Pd43Cu27Ni10P20 Bulk Metallic Glass

Multi-scale 3D Mapping of Tomography Data

X-Ray Tomography and Finite Elements Simulations of Rock Mechanics

Fusing Multi-Scale and Multi-Modal 3D Imaging and Characterization

Tracing Tubular Objects in 3D Confocal Images Using Haptic Device.

Digital Darkfield Analysis of Lattice-Fringe Images with ImageJ

RGB Analysis of Wedge Angles Around a Perforation in Silicon

Image Restoration via Phase-Derived Drift Correction of Movies of 2D Crystals Acquired with a CMOS Direct Electron Detector.

Use of the Gabor Filter for Edge Detection in the Analysis of Zinc Oxide Nanowire Images

EMAN2.1 - A New Generation of Software for Validated Single Particle Analysis and Single Particle Tomography

Platform Session 2

Wednesday, August 06, 2014 8:30 AM - Wednesday, August 06, 2014 10:00 AM

CCC - Room 17

  • Basma Khoury ;
  • Erin Bigelow ;
  • Lauren Smith ;
  • Robert Goulet ;
  • Erica Scheller ;
  • Nelly Andarawis-Puri ;
  • Karl Jepsen ;
  • Nikolaus L. Cordes ;
  • Srivatsan Seshadri ;
  • George J. Havrilla ;
  • Brian M. Patterson ;
  • Michael Feser ;
  • Xiaoli Yuan ;
  • Ying Gu ;
  • Deming Wang ;
  • Kevin C Henderson ;
  • Paul Gibbs ;
  • Seth D Imhoff ;
  • Amy J. Clarke ;
  • Misa Hayashida ;
  • Michael Bergen ;
  • Peng Li ;
  • Marek Malac ;
  • Jovana Zecevic ;
  • Cedric Gommes ;
  • Heiner Friedrich ;
  • Petra E. de Jongh ;
  • Krijn P. de Jong

The Use of NanoComputed Tomography to Enhance Musculoskeletal Research

Subsurface Particle Analysis using X-Ray Computed Tomography and Confocal X-Ray Fluorescence

Multi-scale Imaging of Al-7at.per. Cu Eutectics using Micro- and Nano-scale X-ray Computed Tomography

Nano-Dot Markers for Electron Tomography Formed by Electron Beam-Induced Deposition: Nanoparticle Agglomerates Application

3D Nanoscale Analysis of Zeolite Catalysts by Electron Tomography and Image Processing

Platform Session 3

Wednesday, August 06, 2014 10:30 AM - Wednesday, August 06, 2014 12:00 PM

CCC - Room 17

  • Tim Dahmen ;
  • Niels de Jonge ;
  • Guillaume Lucas ;
  • Cécile Hébert ;
  • Frédéric Voisard ;
  • Nicolas Brodusch ;
  • Hendrix Demers ;
  • Raynald Gauvin ;
  • Bernard Heymann ;
  • Toby Sanders ;
  • John D Roehling ;
  • Joost Batenburg ;
  • Bruce C. Gates ;
  • Peter Binev ;
  • Ilke Arslan ;
  • Yi Jiang ;
  • Robert Hovden ;
  • David A Muller ;
  • Veit Elser

TFS: Combined Tilt- and Focal Series Scanning Transmission Electron Microscopy.

Optimization of the Data Acquisition and Processing Using a Prior Knowledge of the Camera Characteristics: An EFTEM Case Study.

Monte Carlo Simulation and Experimental High-Angle Annular Dark Field Tomography

The Phantom in the Noise and Validation of 3D EM Reconstructions

Advanced 3-D Reconstruction Algorithms for Electron Tomography

Compressed Sensing, Sparsity, and the Reliability of Tomographic Reconstructions

A13 - Practical Applications and Analytical Trends of Metallography and Microstructure

  • Frauke Hogue, Hogue Metallography ;
  • Frank Mücklich, Saarland University;

Platform Session 1

Wednesday, August 06, 2014 8:30 AM - Wednesday, August 06, 2014 10:00 AM

HM - Ballroom B

  • Dominik Britz ;
  • Andreas Hegetschweiler ;
  • Frank Mücklich, Saarland University; ;
  • Jose L Garcia ;
  • George F Vander Voort

Opening the Door to Fundamental Understanding of Structure and Color Metallography – a Correlative Microscopy Study on Steel

Design of Novel Graded Microstructures for Cutting Tools Assisted by High Resolution Microscopy and Thermodynamic Modeling

Correlative Tomography – Extraction of Reliable Information with Adequate Resolution from mm scale down to sub-nm scale

Measurement of Decarburization of Heat Treated Steel Surfaces

Platform Session 2

Wednesday, August 06, 2014 1:30 PM - Wednesday, August 06, 2014 3:00 PM

HM - Ballroom B

  • Sunniva R Collins ;
  • Yinsheng He ;
  • Kejian Li ;
  • In Shik Cho ;
  • Chang Soon Lee ;
  • In Gyu Park ;
  • Keesam Shin ;
  • Jeff Gelb ;
  • Allen Gu ;
  • Arno P. Merkle ;
  • Leah Lavery ;
  • George F Vander Voort ;
  • Frederick E Schmidt ;
  • Donald F Susan ;
  • Tom E Buchheit ;
  • Jordan M Massad ;
  • Jim R McElhanon ;
  • Mark Reece ;
  • Anita Garg ;
  • Ronald D Noebe

Metallographic Techniques for Revealing the Microstructure of the Expanded Austenite Case on Surface-Hardened Corrosion-Resistant Alloys

Microstructural Evolution of SS304 upon Various Shot Peening Treatments

4D Characterization of Deformation Processes in Aluminum Foams: New Dimensions in Materials Engineering

Microstructure of the Muonionalusta Octahedrite Meteorite

Confirming the Composition of Shape Memory Alloys by Microstructural Characterization

Platform Session 3

Thursday, August 07, 2014 8:30 AM - Thursday, August 07, 2014 10:00 AM

HM - Ballroom B

  • Jessica A Booth ;
  • Jennifer Carter ;
  • John Lewandowski ;
  • Katherine P Rice ;
  • Robert R. Keller ;
  • Matthew M Nowell ;
  • Stuart I Wright ;
  • Travis Rampton ;
  • René de Kloe ;
  • Ilona Müllerová ;
  • Šárka Mikmeková ;
  • Eliška Mikmeková ;
  • Zuzana Pokorná ;
  • Luděk Frank ;
  • Haibo Yu ;
  • Yu Sun ;
  • Pamir Alpay ;
  • Mark Aindow

EBSD Analysis for Microstructure Characterization of Zr-based Bulk Metallic Glass Composites

Thickness-Dependent Beam Broadening in Transmission EBSD

Advances in Scattered Electron Intensity Distribution Imaging for Microstructural Visualization and Correlations with EBSD Measurements

Exploitation of Contrasts in Low Energy SEM to Reveal True Microstructure

Characterization of the Surface Layer of Ag/W Electrical Contacts

Poster Session 1

Thursday, August 07, 2014 10:30 AM - Thursday, August 07, 2014 12:00 PM

CCC - Exhibit Hall AB

  • Jose Bernal ;
  • Abel García ;
  • Arul M Varman ;
  • Matthew D Hecht ;
  • Bryan A Webler ;
  • Yoosuf N. Picard, Carnegie Mellon University ;
  • Amith D Darbal ;
  • Win-Jin Chang ;
  • Haw-Long Lee ;
  • Yu-Ching Yang ;
  • Young Heon KIM ;
  • Francisco J Baldenebro-Lopez ;
  • Wilber Antunez-Flores ;
  • Enrique Torres-Moye ;
  • Ivanovich Estrada-Guel ;
  • Jose M Herrera-Ramírez ;
  • Cynthia D Gómez-Esparza ;
  • Roberto Martínez-Sánchez ;
  • Nabraj Bhattarai ;
  • Subarna Khanal ;
  • Daniel BAhena ;
  • Arturo Ponce ;
  • Miguel Jose-Yacaman ;
  • C. G. Garay-Reyes ;
  • I. Estrada-Guel ;
  • J.L. Hernández-Rivera ;
  • H.J. Dorantes-Rosales ;
  • J .J Cruz-Rivera ;
  • R. Martínez-Sánchez ;
  • Audel santos ;
  • Veronica Gallegos ;
  • claudia rodriguez ;
  • Hooman Yaghoobnejad Asl ;
  • Louis V. Gambino ;
  • Neal J. Magdefrau ;
  • Mark Aindow ;
  • Yaoyao Ding ;
  • Matthew Gallaugher ;
  • Nicolas Brodusch ;
  • Raynald Gauvin ;
  • Richard R Chromik

A Characterization Study of Initial Gamma Prime Phase Formation Produced by Microwave

A Novel Method for Microstructural Characterization of Cast Iron

A Method for Quantitative Analysis of Carbide Network Path Lengths in Ultrahigh Carbon Steel.

Precession Electron Diffraction Detection and Phase Mapping of Retained Austenite and Carbides in a Heat Treated Low Alloy Carbon Steel Using a JEOL ARM 200 TEM with an AppFive Topspin System for Synchronized Beam Scanning and Precession

Dynamic Analysis of Nanomachining with a Multi-Cracked AFM Cantilever

A Transmission Electron Microscopy Study on Self-Catalyzed GaAs Nanostructures

Equiatomic NiCoAlFeMoTiCrx (x= 0,1) High Entropy Alloys Produced by Mechanical Alloying

Study of Au/Pd and Au/Co Bimetallic Nanoparticles Using Aberration Corrected STEM

Study of coarsening in γ` precipitates by diffusion couples

Influence of Cooling Rate on Corrosion Resistance of the A383 Aluminum to Biofuels E10, E30 and E100

Phase Identification by EBSD Analysis of Non-Metallic Crystallites

Analysis of Titanium Microalloying in As-Received and Oxidized Crofer® 22 APU

Effect of a Coating Induced Residual Stress on Magnetic Domain Structure in Non-Oriented Electrical Steels

Platform Session 4

Thursday, August 07, 2014 1:30 PM - Thursday, August 07, 2014 3:00 PM

HM - Ballroom B

  • Gerhard Schneider ;
  • Natasha Erdman ;
  • Masateru Shibata ;
  • Tara Nylese ;
  • Loïc Sorbier ;
  • Maxime Moreaud ;
  • Frédéric Bazer-Bachi ;
  • Virginie Moizan-Basle ;
  • Lihua Zhang ;
  • Matthew A Wall ;
  • Stefan Harmsen ;
  • Charles Michael Drain ;
  • Moritz F Kircher

Automated Quantitative Materials Microscopy​

Nanoscale Crystallographic Analysis in FE-SEM Using Transmission Kikuchi Diffraction

Use of the Distance Transform for the Integration of Local Measurements: Principle and Application in the Field of Chemical Engineering

Determination on the Structure of Au Nanorods with Pentagonal Cross-Sections by Various TEM Techniques

A14 - Advances in Cathodoluminescence and Soft X-ray Microanalysis

  • Colin M. MacRae, CSIRO-Minerals ;
  • Marion A. Stevens-Kalceff, University of New South Wales ;
  • Scott A. Wight, National Institute of Standards and Technology

Platform Session 1

Thursday, August 07, 2014 8:30 AM - Thursday, August 07, 2014 10:00 AM

CCC - Room 16

  • Masami Terauchi ;
  • Simon Burgess ;
  • Xiaobing Li ;
  • James Holland ;
  • Peter Statham ;
  • Santokh Bhadare ;
  • David Birtwistle ;
  • Alan Protheroe ;
  • Patrick P Camus ;
  • Reinhard Buchhold ;
  • Nick C Wilson ;
  • Colin M. MacRae, CSIRO-Minerals ;
  • Aaron Torpy

Valence Electron State of Carbon Materials Studied by TEM-SXES

Development of Soft X-ray Microanalysis Using Windowless SDD Technology

Using Accurate Solid Angle Tools When Comparing EDS Detector Geometries

Mapping of Weak Cathodoluminescence Signals

Poster Session 1

Thursday, August 07, 2014 10:30 AM - Thursday, August 07, 2014 12:00 PM

CCC - Exhibit Hall AB

  • Norihisa Mori ;
  • Takanori Murano ;
  • Hideyuki Takahashi, JEOL Inc ;
  • Scott A. Wight, National Institute of Standards and Technology ;
  • Greg Gillen

The Present State of Chemical State Analysis in EPMA and WD-SXES

Cathodoluminescence and DART Mass Spectrometry for the Forensic Identification of Explosive and Narcotic Particle Residues on Surfaces

Platform Session 2

Thursday, August 07, 2014 1:30 PM - Thursday, August 07, 2014 3:00 PM

CCC - Room 16

  • John M Hanchar ;
  • Paul R Edwards ;
  • Michael J Wallace ;
  • Gunnar Kusch ;
  • Gunasekar Naresh-Kumar ;
  • Jochen Bruckbauer ;
  • Carol Trager-Cowan ;
  • Kevin P O'Donnell ;
  • Robert W Martin ;
  • Colin M. MacRae, CSIRO-Minerals ;
  • Nick C Wilson ;
  • Aaron Torpy ;
  • Mark Pownceby ;
  • John Hanchar ;
  • Cameron Davidson ;
  • Victor Hugo

Cathodoluminescence Spectra Acquisition Using an Imaging Spectrograph and CCD Detector: Materials Ccharacterization Using Trivalent REE Doped Synthetic and Natural Materials

Cathodoluminescence Hyperspectral Imaging of Nitride Semiconductors: Introducing New Variables.

Zircon Metamictisation Study by Cathodoluminescence and X-ray Imaging

Platform Session 3

Thursday, August 07, 2014 3:30 PM - Thursday, August 07, 2014 5:00 PM

CCC - Room 16

  • Marion A. Stevens-Kalceff, University of New South Wales ;
  • Jens Götze ;
  • Jolana Kološová ;
  • Jaroslav Jiruše ;
  • Colin M. MacRae, CSIRO-Minerals ;
  • Nick C Wilson ;
  • Aaron Torpy ;
  • Steven Kidder ;
  • Zhongsheng Li ;
  • Claudio Delle Piane ;
  • David Dewhurst ;
  • Michael Gaft ;
  • Christoph Lenz ;
  • John M Hanchar ;
  • Gerard Barmarin ;
  • Lutz Nasdala

Cathodoluminescence Microanalysis of Amorphised Quartz

Novel Cathodoluminescence Detector with Extremely Large Field of View

Quartz Overgrowths in Shales and Sandstones studied by EPMA and SIMS

Luminescence Database: An Update

A15 - Cs-Correctors: Current State and Ongoing Developments

  • Max Haider, CEOS Gmbh ;
  • Rolf Erni, EMPA

Platform Session 1

Tuesday, August 05, 2014 8:30 AM - Tuesday, August 05, 2014 10:00 AM

CCC - Room 22

  • Juri Barthel ;
  • Thust Andreas ;
  • Demie M Kepaptsoglou ;
  • Andrew R. Lupini ;
  • Dorothea Mücke-Herzberg ;
  • Gareth Vaugan ;
  • Quentin M Ramasse ;
  • Peter Hartel ;
  • Martin Linck ;
  • Frank Kahl ;
  • Heiko Müller ;
  • Max Haider, CEOS Gmbh ;
  • Niklas Dellby ;
  • George J Corbin ;
  • Zeno Dellby ;
  • Tracy C Lovejoy ;
  • Zoltan S Szilagyi ;
  • Matthew F Chisholm ;
  • Ondrej L Krivanek

Lifetime of Optical States in Transmission Electron Microscopy

Performance and Stability of Aberration-Corrected STEMs: a User's Perspective

On Proper Phase Contrast Imaging in Aberration Corrected TEM

Tuning High Order Geometric Aberrations in Quadrupole-Octupole Correctors

Platform Session 2

Tuesday, August 05, 2014 10:30 AM - Tuesday, August 05, 2014 12:00 PM

CCC - Room 22

  • Angus I. Kirkland, University of Oxford ;
  • Etienne Snoeck ;
  • Florent Houdellier ;
  • Yoshifumi Taniguchi ;
  • Aurelien Masseboeuf ;
  • Christophe Gatel ;
  • Julien Nicolai ;
  • Martin J Hytch ;
  • Heiko Müller ;
  • Stephan Uhlemann ;
  • Peter Hartel ;
  • Joachim Zach ;
  • Maximilian Haider ;
  • Koji Kimoto ;
  • Kazuo Ishizuka

Applications of Aberration Corrected TEM and Exit Wave Reconstruction in Materials Science

Off-Axial Aberration Correction Using a B-COR for Lorentz and HREM Modes

Overview of Commercially Available CEOS Hexapole-Type Aberration Correctors.

Quantitative Assessment of Lower-Voltage TEM Performance Using 3D Fourier Transform of Through-Focus Series

Platform Session 3

Tuesday, August 05, 2014 1:30 PM - Tuesday, August 05, 2014 3:00 PM

CCC - Room 22

  • Knut W. Urban ;
  • Chun-Lin Jia ;
  • Lin L. Jin ;
  • Shao-Bo Mi ;
  • Marin M Alexe ;
  • Dietrich M Hesse ;
  • Juri Barthel ;
  • Dawei Wang ;
  • Rafal E. Dunin-Borkowski ;
  • Andreas Thust ;
  • J.G. Wen ;
  • Dean J. Miller ;
  • Russ E Cook ;
  • Nestor J Zaluzec

Aberration-Corrected Transmission Electron Microscopy Reveals Nanoscale Disorder in Bismuth Ferrite Single Crystals

Atomically Resolved 3D Shape Determination of a MgO Crystal Using a Single Aberration Corrected HRTEM Image

Amplitude Contrast Imaging: High Resolution Electron Microscopy Using a Spherical and Chromatic Aberration Corrected TEM

Poster Session 1

Tuesday, August 05, 2014 3:30 PM - Tuesday, August 05, 2014 5:00 PM

CCC - Exhibit Hall AB

  • Edgar Voelkl ;
  • Peter Tiemeijer ;
  • Martin Linck ;
  • Benjamin McMorran ;
  • Jordan Pierce ;
  • Peter Ercius ;
  • Benjamin L. Rickman ;
  • W. Andreas Schroeder ;
  • Reiner Ramlau ;
  • Reinhard Schneider ;
  • John H Roudebush ;
  • Robert J Cava

A Need for Bandwidth Limitations in Electron Microscopes

Aberration-Corrected STEM by Means of Diffraction Gratings

Circumventing Scherzer's Theorem: Large Numerical Aperture Objective Lenses for Pulsed Electron Microscopy

The Real Structure of Cu3Ni2SbO6 and Cu3Co2SbO6 Delafossites with Honeycomb Lattices by Aberration-Corrected HRTEM

A16 - Correlative Microscopy and Microanalysis from Macro to Pico

  • Brian P. Gorman, Colorado School of Mines ;
  • Christoper J. Gilpin, Purdue University ;
  • Mor Baram, McMaster University

Platform Session 1

Monday, August 04, 2014 1:30 PM - Monday, August 04, 2014 3:00 PM

CCC - Room 21

  • Harvey Guthrey ;
  • Steve Johnston ;
  • Brian Gorman ;
  • Mowafak Al-Jassim ;
  • Ann N Chiaramonti ;
  • Jeffrey W Sowards ;
  • Daniel K Schreiber ;
  • James R Fekete ;
  • Michael Engstler ;
  • Jenifer Barrirero ;
  • Naureen Ghafoor ;
  • Magnus Odén ;
  • Frank Mücklich, Saarland University; ;
  • Subhashish Meher ;
  • Peeyush Nandwana ;
  • Tanaporn Rojhirunsakool ;
  • Rajarshi Banerjee ;
  • Yufeng Zheng ;
  • Robert E. A. Williams ;
  • Soumya Nag

Characterization of Photovoltaics: From Cells Properties to Atoms

Understanding the High-Temperature Mechanical Properties of A710 (HSLA-80) Steel With Use of Complementary Atom Probe Tomography and Electron Microscopy

3D Microstructure Characterization and Analysis of Al-Si Foundry Alloys at Different Length Scales

Probing the Crystallography of Ordered Phases by Coupling Orientation Microscopy and Atom Probe Tomography

Investigation of Possible Nucleation Mechanisms for Producing an Ultra-Refined Alpha Phase Microstructure in Beta Titanium Alloys Using High-Resolution Electron Microscopy and 3D Atom Probe Tomography

Platform Session 2

Tuesday, August 05, 2014 8:30 AM - Tuesday, August 05, 2014 10:00 AM

CCC - Room 21

  • Anders Palmquist ;
  • Kathryn Grandfield ;
  • Matthew D Hecht ;
  • Bryan A Webler ;
  • Yoosuf N. Picard, Carnegie Mellon University ;
  • Tom Wirtz ;
  • David Dowsett ;
  • Santhana Eswara Moorthy ;
  • Yves Fleming ;
  • Shen J Dillon ;
  • Kyong Wook Noh

From Micro to Nano: Correlative 3D Microscopies for Analysis of Biointerfaces

Investigating the Effects of a Heat Treatment on Microstructure of an Ultrahigh Carbon Steel through SEM and In Situ CLSM studies.

SIMS Based Correlative Microscopy for High-Resolution High-Sensitivity Nano-Analytics

In-situ EM Characterization of Li-ion Battery Through Multiple Cycles

Platform Session 3

Tuesday, August 05, 2014 10:30 AM - Tuesday, August 05, 2014 12:00 PM

CCC - Room 21

  • Santhana Eswara Moorthy ;
  • David Dowsett ;
  • Tom Wirtz ;
  • Chikara Sato ;
  • Takaaki Kinoshita ;
  • Takeshi Uemura ;
  • Kazumi Hiarno ;
  • Hidetoshi Nishiyama ;
  • Mari Sato ;
  • Tatsuhiko Ebihara ;
  • Mitsuo Suga ;
  • Shoko Nishihara ;
  • Peijun Zhang ;
  • Sangmi Jun ;
  • Gongpu Zhao ;
  • Zandrea Ambrose ;
  • Simon c Watkins ;
  • Aric W. Sanders ;
  • Kavita Jeerage ;
  • Cindi Schwartz ;
  • Alexandra E Curtin ;
  • Ann N Chiaramonti ;
  • Nassirhadjy Memtily ;
  • Kazuhiro Mio

Correlative Microscopy Using TEM and SIMS: Parallel Ion Electron Spectrometry (PIES) for High-Resolution, High-Sensitivity Elemental Mapping for Applications in Materials Science and Biology

The Atmospheric Scanning Electron Microscope (ASEM) Observes Axonal Segmentation and Synaptic Induction in Solution

Correlative Imaging and Cryo-FIB Processing for Direct Visualization of HIV-1 infection

Correlating Multiscale Measurements of Nanoparticles in Primary Cells

Observation of Tissues in Solution by Atmospheric Scanning Electron Microscope (ASEM)

Poster Session 2

Tuesday, August 05, 2014 3:30 PM - Tuesday, August 05, 2014 5:00 PM

CCC - Exhibit Hall AB

  • LiLung Lai ;
  • Jenny Goulden ;
  • Scott D Sitzman ;
  • Kim Larsen ;
  • Hui Jiang ;
  • Alexandra E Curtin ;
  • Ryan Skinner ;
  • Aric W. Sanders ;
  • Arno P. Merkle ;
  • Jeff Gelb ;
  • Alexander Orchowski ;
  • Jochen Fuchs ;
  • Tanaporn Rojhirunsakool ;
  • Antariksh Singh ;
  • Soumya Nag ;
  • Jaimie S Tiley ;
  • Rajarshi Banerjee ;
  • Jaroslav Jiruše ;
  • Martin Haničinec ;
  • Miloslav Havelka ;
  • Olaf Hollricher ;
  • Wolfram Ibach ;
  • Peter Spizig ;
  • Frank F Hitzel ;
  • Nils Anspach ;
  • Fang Zhou ;
  • Soeren Eyhusen ;
  • Hugues Francois-Saint-Cyr ;
  • Isabelle Martin ;
  • Wilfried Blanc ;
  • Philippe LeCoustumer ;
  • Chrystel Hombourger ;
  • Daniel Neuville ;
  • David Larson ;
  • Ty J Prosa ;
  • Christelle Guillermier ;
  • Santoshrupa Dumpala ;
  • Adedapo A Oni ;
  • Sonal Padalkar ;
  • Scott R Broderick ;
  • James M LeBeau ;
  • Krishna Rajan ;
  • Bruce W Arey ;
  • Daniel E Perea ;
  • Libor Kovarik ;
  • Jia Liu ;
  • Andrew R Felmy ;
  • Wayne Zhao ;
  • Hugh Porter ;
  • Raghaw Rai ;
  • Esther Chen ;
  • Jeremy Russell ;
  • Ingo Schulmeyer ;
  • William G Janssen ;
  • Hugo H Hanson ;
  • Barbara L Armbruster ;
  • Sander V. den Hoedt ;
  • Dirk Schumann ;
  • Sebastian Fuchs ;
  • Jessica Stromberg ;
  • Alexandre Laquerre ;
  • David Mayer ;
  • Michael W Phaneuf ;
  • Hojatollah Vali ;
  • Neil Banerjee ;
  • Alexandra F. Elli ;
  • Eric Hummel ;
  • Christian Boeker ;
  • Mari Sakaue ;
  • Masamichi Shiono ;
  • Mami Konomi ;
  • Junichiro Tomizawa ;
  • Eiko Nakazawa ;
  • Koji Kawai ;
  • Susumu Kuwabata ;
  • Audrey MOLZA ;
  • Jean-Louis MANSOT ;
  • Yves BERCION ;
  • Farid BEGARIN ;
  • Linda Nikolova

The Strategy of Advanced Analysis in Semiconductor Nano-device: from Nanoprobing to Nanoscopy and Nanoanalysis

Multi-scale EBSD and EDS for Detection and Analysis of Spatially Rare Grains and Phases

A Simplified Approach to Determining Resolution of Optical, Ion and Electron Microscope Images

X-ray Microscopy: the Cornerstone for Correlative Characterization Methods in Materials Research and Life Science

Multi-Scale Characterization of Different Generations of Gamma Prime Precipitates in Nickel-based Superalloys Using Correlative Microscopy Techniques

FIB-SEM Instrument with Integrated Raman Spectroscopy for Correlative Microscopy

Hybrid SEM/AFM System from Carl Zeiss Revolutionizes Analysis of Functional Micro- and Nanostructured Specimen

Correlative Compositional Analysis of Fiber-Optic Nanoparticles

Correlative Imaging of Stacking Faults using Atom Probe Tomography (APT) and Scanning Transmission Electron Microscopy (STEM)

Understanding Fayalite Chemistry Using Electron Microscopy and Atom Probe Tomography

Beware of Artifacts When Characterizing Nanometer Device Features Smaller Than a TEM Lamella Thickness in Semiconductor Wafer-foundries

Comprehensive Nanofabrication by Correlating Crossbeam and ORION Nanofab

A Streamlined Technique to Examine Cell Monolayers by Means of Correlative Light and Transmission Electron Microscopy

The SECOM Platform: an Integrated CLEM Solution

Combining Terapixel-Scale SEM Imaging and High-Resolution TEM Studies for Mineral Exploration

Correlative Light and Electron Microscopy – on the way from 2D towards 3D

New preparation Method Using Ionic Liquid for Quick and Faithful SEM Observation of Biological Specimens

Investigation of Friction Wear Process in the Presence of Exfoliated Graphite Nanoparticles Using Correlative In Situ Raman Micro Spectrometry and Post Mortem Raman, Analytical Scanning and Transmission Electron Microscopies

Ionic Liquids Preparation for SEM Observation of Minute Crustacean

Development of High Pressure Freezing and Correlative Light/Electron Microscopy for Drosophila Larvae

A17 - Extended Crystal Defects: Quantification of Strain, Local Atomic Structure and Chemistry

  • Douglas L. Medlin, Sandia National Laboratories ;
  • Jim Ciston Lawrence, Berkeley National Laboratory ;
  • Yoosuf N. Picard, Carnegie Mellon University

Platform Session 1

Monday, August 04, 2014 1:30 PM - Monday, August 04, 2014 3:00 PM

CCC - Room 12

  • C. Barry Carter ;
  • Marc DeGraef ;
  • Carol Trager-Cowan ;
  • G. Naresh-Kumar ;
  • Nouf Allehiani ;
  • Simon Kraeusel ;
  • Ben Hourahine ;
  • Stefano Vespucci ;
  • David Thomson ;
  • Jochen Bruckbauer ;
  • Gunnar Kusch ;
  • Paul R Edwards ;
  • Rob W Martin ;
  • Christof Mauder ;
  • Austin P Day ;
  • Aimo Winkelmann ;
  • Arantxa Vilalta-Clemente ;
  • Angus J Wilkinson ;
  • Peter J Parbrook ;
  • Menno J Kappers ;
  • Michelle A Moram ;
  • Rachel A Oliver ;
  • Colin J Humphreys ;
  • Philip Shields ;
  • Emmanuel D Le Boulbar ;
  • Dima Maneuski ;
  • Val O'Shea ;
  • Ken P Mingard

Imaging Extended Defects by TEM

Towards a Uniform Model for Lattice Defect Image Simulations

Electron Channeling Contrast Imaging of Defects in III-Nitride Semiconductors

Poster Session 1

Monday, August 04, 2014 3:30 PM - Monday, August 04, 2014 5:00 PM

CCC - Exhibit Hall AB

  • Michael B Katz ;
  • Mark E Twigg ;
  • Sergey I Maximenko ;
  • Nabil D. Bassim ;
  • Nadeem A Mahadik ;
  • Glenn G Jernigan ;
  • Chad L Canedy ;
  • Joshua Abell ;
  • Chaffra A Affouda ;
  • Amith D Darbal ;
  • Raman D Narayan ;
  • Catherine Vartuli ;
  • Toshi Aoki ;
  • John Mardinly ;
  • Stavros Nicolopoulos ;
  • Jon Karl Weiss ;
  • Noriaki Endo ;
  • Yukihito Kondo ;
  • Juntao Li ;
  • Kangguo Cheng ;
  • Ali Khakifirooz ;
  • Junli Wang ;
  • Alexander Reznicek ;
  • Anita Madan ;
  • Bruce Doris ;
  • Nicolas Loubet ;
  • Hong He ;
  • John Gaudiello ;
  • Wenpei Gao ;
  • Jian-Min Zuo ;
  • Hasti Asayesh-Ardakani ;
  • Mincong Liu ;
  • Yoosuf N. Picard, Carnegie Mellon University

Electron Channeling Contrast Imaging for Non-Destructive Analysis of Extended Defects in Semiconductor Thin Films and Device Structures

Applications of Automated High Resolution Strain Mapping in TEM on the Study of Strain Distribution in MOSFETs

Accuracy of Strain in Strain Maps Improved by Averaging Multiple Maps

Strain Quantification Analysis of Epitaxial SiGe on SOI by Nanobeam Diffraction (NBD)

Measurement of Local Atomic Displacements Reveals Interaction of Au Nanocrystals with Rutile (TiO2) Surface Steps

Atomic Resolution Study of Local Strains in Doped VO2 Nanowires

Strain Associated with Surface-Penetrating Dislocations Visible by Electron Channeling Contrast Imaging

Platform Session 2

Tuesday, August 05, 2014 8:30 AM - Tuesday, August 05, 2014 10:00 AM

CCC - Room 12

  • Marc Heggen ;
  • Michael S Titus ;
  • Akane Suzuki ;
  • Michael J Mills ;
  • Tresa M Pollock ;
  • Amy Wang ;
  • Marc DeGraef ;
  • Timothy L Smith ;
  • Matthew L Bowers

Metadislocations in Complex Metallic Alloys

Sub-nanometer Resolution Chemi-STEM EDS Mapping of Superlattice Intrinsic Stacking Faults in Co-based Superalloys

Using Bethe Potentials in the Scattering Matrix for Defect Image Simulations

STEM-Based Characterization of Dislocations and Stacking Faults in Structural Materials

Platform Session 3

Tuesday, August 05, 2014 10:30 AM - Tuesday, August 05, 2014 12:00 PM

CCC - Room 12

  • Naoya Shibata ;
  • Scott D. Findlay ;
  • Yuichi Ikuhara ;
  • Miaolei Yan ;
  • Marc DeGraef ;
  • Yoosuf N. Picard, Carnegie Mellon University ;
  • Paul A Salvador ;
  • Qian He ;
  • Ryo Ishikawa ;
  • Andrew R. Lupini ;
  • Liang Qiao ;
  • Michael D Biegalski ;
  • Albina Borisevich ;
  • Dan Zhou ;
  • Wilfried Sigle ;
  • Yi Wang ;
  • Marion Kelsch ;
  • Yuze Gao ;
  • Hanns-Ulrich Habermeier ;
  • Peter A. van Aken ;
  • Chad M Parish ;
  • Yutai Katoh ;
  • Takaaki Koyanagi ;
  • Sisuke Kondo

Polar Oxide Interface Characterization by Differential Phase Contrast STEM

Defect Analysis in La0.7Sr0.3MnO3 Epitaxial Thin Films by Electron Channeling Contrast Imaging (ECCI)

Toward 3D Mapping of Octahedral Rotations at Perovskite Thin Film Heterointerfaces Unit Cell by Unit Cell

Chemical and Defect Analysis in a ZrO2/LSMO Pillar-Matrix System

Atomic-Resolution Investigation of Irradiation-Induced Defects in Silicon Carbide

Platform Session 4

Tuesday, August 05, 2014 1:30 PM - Tuesday, August 05, 2014 3:00 PM

CCC - Room 12

  • Martin J Hytch ;
  • Christophe Gatel ;
  • Axel Lubk ;
  • Thibaud Denneulin ;
  • Lise Durand ;
  • Nikolay Cherkashin ;
  • Etienne Snoeck ;
  • Burak Ozdol ;
  • Christoph Gammer ;
  • Michael Sarahan ;
  • Andrew Minor ;
  • Martin Couillard ;
  • Adedapo A Oni ;
  • Xiahan Sang ;
  • Aakash Kumar ;
  • Selva V Raju ;
  • Srikant Srinivasan ;
  • Susan B Sinnott ;
  • Surendra K Saxena ;
  • Krishna Rajan ;
  • James M LeBeau ;
  • Suhyun Kim ;
  • Sungho Lee ;
  • Younhuem Jung ;
  • Joong Jung Kim ;
  • Gwangseon Byun ;
  • sunyoung Lee ;
  • Heabum Lee

Local Strain Measurements at Dislocations, Disclinations and Domain Boundaries

Nano-scale Strain Mapping Using Advanced STEM with a Direct Electron Detector

Measuring Strain Fields surrounding Grain-Boundary Dislocations in Silicon using Scanning Transmission Electron Microscopy

Direct Lattice Parameter Measurements Using HAADF-STEM

Quantitative Strain Measurement in Semiconductor Devices by Scanning Moiré Fringe Imaging

Poster Session 2

Tuesday, August 05, 2014 3:30 PM - Tuesday, August 05, 2014 5:00 PM

CCC - Exhibit Hall AB

  • C. Austin Wade ;
  • Masashi Watanabe ;
  • Matthew T Janish ;
  • Paul G. Kotula, Sandia National Laboratories ;
  • Brad L Boyce ;
  • C. Barry Carter ;
  • Amin Azizi ;
  • Xiaolong Zou ;
  • Peter Ercius ;
  • Zhuhua Zhang ;
  • Ana L Elias ;
  • Néstor Perea-López ;
  • Mauricio Terrones ;
  • Boris I. Yakobson ;
  • Nasim Alem ;
  • David C Bell ;
  • Estelle Kalfon-Cohen ;
  • D. L. Medlin ;
  • K. J. Erickson ;
  • S. J. Limmer ;
  • W. G. Yelton ;
  • M. P. Siegal

Ad Hoc Determination of Local Misorientations and Boundary Planes between Grains in TEM by a Dedicated Software Package Developed for the Gatan DigitalMicrograph Platform

Investigation of Bi Segregation of Cu Bicrystal Boundaries Using Aberration-Corrected STEM Depth Sectioning

Observations on Heavily Deformed Tantalum

Atomic-scale Observation of Grains and Grain Boundaries in Monolayers of WS2

Imaging Defects in Quantum Materials

An Electron Microscopic Investigation of (1/3)<0 -1 1 1> Dislocations in Bi2Te3 Nanowires: Defect Crystallography and Relationship to 7-layer Bi3Te4 Defects

Platform Session 5

Wednesday, August 06, 2014 8:30 AM - Wednesday, August 06, 2014 10:00 AM

CCC - Room 12

  • Chen Li ;
  • Yelong Wu ;
  • Andrew R. Lupini ;
  • Naba R Paudel ;
  • Yanfa Yan ;
  • Stephen J. Pennycook ;
  • Colin Ophus ;
  • Haider Rasool ;
  • Alex Zettle ;
  • Michael F Crommie ;
  • Ulrich Dahmen ;
  • Robert Hovden ;
  • Jonathan Alden ;
  • Adam W Tsen ;
  • Pinshane Y Huang ;
  • Lola Brown ;
  • Jiwoong Park ;
  • Paul L McEuen ;
  • David A Muller ;
  • Yihan Zhu ;
  • Yu Han ;
  • Jianwei Miao

Column-by-Column Imaging of Dislocation Slip Processes in CdTe

Statistical Characterization of High Angle Graphene Grain Boundaries at Atomic Resolution

Atomic Imaging Across Strain Boundaries in Bilayer Graphene with ADF-STEM and DF-TEM

Experimental Evidence of Chiral Gold Nanowires with Boerdijk-Coxeter-Bernal Structure by Atomic-Resolution Imaging

Three-Dimensional Imaging of Dislocations and Defects in Materials at Atomic Resolution Using Electron Tomography

A18 - Vendor Symposium: New Tools for Life and Materials Sciences

  • Alice C. Dohnalkova, Pacific Nortwest National Laboratory ;
  • Elizabeth R. Wright, Emory University ;
  • Mark A. Sanders, University of Minnesota

Platform Session 1

Monday, August 04, 2014 1:30 PM - Monday, August 04, 2014 3:00 PM

CCC - Room 25

  • Madeline J Dukes ;
  • Albert D. Dukes ;
  • Kate L. Klein ;
  • Rebecca L. Thomas ;
  • Deborah F. Kelly ;
  • John Damiano ;
  • Christian Theriault ;
  • Jessica Guttenfelder ;
  • Craig B Arnold ;
  • Thomas J Tague ;
  • Robert A Heintz ;
  • Mark J Wall ;
  • Jennifer L Ramirez ;
  • Richard Price ;
  • Brad Matola ;
  • David C. Joy, University of Tennessee

Applications and Design of Reinforced Silicon Nitride Windows for In-Situ Liquid Transmission Electron Microscopy

TAG Lens: Revolutionizing Optical Microscopy With Ultra-High Speed Variable Focus

A Novel Compact Stand-alone FTIR Microscope for the Analysis of Small Samples

Rapid, High-Resolution Raman Imaging of Pharmaceutical, Biological, and Other Materials with the Thermo Scientific DXRxi.

The Unique Capabilities of Auger Electron Spectroscopy

Secondary Electron Imaging in the Helium Ion Microscope

Poster Session 1

Monday, August 04, 2014 3:30 PM - Monday, August 04, 2014 5:00 PM

CCC - Exhibit Hall AB

  • Keith Thompson ;
  • Noriyuki Inoue ;
  • Ronald Vane ;
  • C. A. Moore ;
  • Markus Bornschlegl ;
  • Adrian Niculae ;
  • Heike Soltau ;
  • Rouven Eckhardt ;
  • Kathrin Hermenau ;
  • Kolawole Bello ;
  • Mileva Radonjic ;
  • Fernandp Godinez ;
  • Omar Solorza-Feria ;
  • Christian Kisielowski ;
  • Petra Specht ;
  • Hector A Calderon ;
  • John M Miller ;
  • Daan Hein Alsem ;
  • Norman Salmon ;
  • Nils Johnson ;
  • James Hutchison ;
  • Johannes Mulders ;
  • Piet Trompenaars ;
  • Erik Bosch ;
  • Remco Geurts ;
  • Ralf Terborg ;
  • Vasile-Dan Hodoroaba ;
  • Meiken Falke ;
  • Andi Käppel ;
  • Robin Cantor ;
  • Hideo Naito ;
  • Andreas Liebel ;
  • Niculae Adrian ;
  • S Kawai ;
  • I Onishi ;
  • T Ishikawa ;
  • K Yagi ;
  • T Iwama ;
  • K Miyatake ;
  • Y Iwasawa ;
  • M Matsushita ;
  • T Kaneyama ;
  • Y Kondo ;
  • Masashi Nojima ;
  • Masato Suzuki ;
  • Tatsuya Adachi ;
  • Sam Hotta ;
  • Makiko Fujii ;
  • Toshio Seki ;
  • Jiro Matsuo ;
  • Yusuke Ominami ;
  • Shinsuke Kawanishi ;
  • Tatsuo Ushiki ;
  • Sukehiro Ito ;
  • Andrew J McCulloch ;
  • Yoann Bruneau ;
  • Guyve Khalili ;
  • Daniel Comparat ;
  • Sean Mulligan ;
  • Tilak Jain ;
  • Erika Duggan ;
  • Er Liu ;
  • Jeffrey A Speir ;
  • Anchi Cheng ;
  • John Nolan ;
  • Bridget Carragher ;
  • Clinton S Potter ;
  • Ty J Prosa ;
  • Brian P Geiser ;
  • Robert M Ulfig ;
  • Thomas F Kelly ;
  • David J Larson

Are EDS Specifications Still Relevant

Introduction of a New Conventional SEM: JSM-IT300LV: The Observation of a Water Containing Specimen with a Cooling Stage at 650 Pa.

Advancements in Decontamination of Vacuum Systems Using Plasma Cleaning

Measurement of Downstream Charge Transport During Plasma Cleaning of Vacuum Chambers

New X-ray Transparent and Light Tight Windows for EDS Detectors

Geochemical Evaluation of Geopressured Geothermal Wellbore Cement

Atomic Resolution Characterization of Ni-base Nanoparticles for Energy Devices.

Functionalized Surfaces to Improve Imaging Conditions in Liquid Cell Transmission Electron Microscopy

A New In-situ Broad Ion Beam, With Energy Range 1 – 500 eV

On the Characterization of the Geometrical Collection Efficiency of Modern EDS Systems

Ultrahigh-Resolution X-ray Microanalysis with a Cryogen-Free Microcalorimeter Spectrometer

Solid State Backscattered Electron Detectors with Improved Image Contrast and Detection Speed

A Double Silicon Drift Type Detector System for EDS with Ultrahigh Efficiency and Throughput for TEM

Development of Au-GCIB Dynamic SIMS and Cluster Size Filtering System

Observation of Wet Samples Using a Novel Atmospheric Scanning Electron Microscope

High-Flux Monochromatic Electron and Ion Beams from Laser Cooled Atoms

Typhon: Multiplexed TEM Sample Preparation

Measurement of Detection Efficiency in Atom Probe Tomography

Platform Session 2

Tuesday, August 05, 2014 8:30 AM - Tuesday, August 05, 2014 10:00 AM

CCC - Room 25

  • David Wall ;
  • Fabian-Cyril Sasam ;
  • Tomas Vystavel ;
  • Petr Wandrol ;
  • Jaroslav Jiruše ;
  • Miloslav Havelka ;
  • Martin Haničinec ;
  • Jan Polster ;
  • Tomáš Hrnčíř ;
  • Christian Lang ;
  • Anthony Hyde ;
  • Matthew Hiscock ;
  • Simon Burgess ;
  • James Holland ;
  • Peter Statham ;
  • Chris E Meyer ;
  • Niklas Dellby ;
  • Zeno Dellby ;
  • Gwyn S Skone ;
  • Ondrej L Krivanek ;
  • Ingo Schulmeyer ;
  • Martin Kienle ;
  • Aaron Lewis ;
  • A Komissar ;
  • A Ignatov ;
  • Oleg Fedoroyov ;
  • Eran Maayan

Optimized Electron Column and Detection Scheme for Advanced Imaging and Analysis of Metals

New High-Resolution Low-Voltage and High Performance Analytical FIB-SEM System

Automated SEM Analysis in Industrial Process Control and Scientific Research

Using Nion Swift for Data Collection, Processing, Display and Analysis

Enabling Future Nanotomography and Nanofabrication with Crossbeam technology

AFM integrated with SEM/FIB for complete 3D metrology measurements

Platform Session 3

Tuesday, August 05, 2014 10:30 AM - Tuesday, August 05, 2014 12:00 PM

CCC - Room 25

  • Yoshitaka Aoyama ;
  • Matthew M Nowell ;
  • Stuart I Wright ;
  • Travis Rampton ;
  • René de Kloe ;
  • Andreas Liebel ;
  • Rouven Eckhardt ;
  • Markus Bornschlegl ;
  • Alois Bechteler ;
  • Adrian Niculae ;
  • Heike Soltau ;
  • Robert M Ulfig ;
  • David J Larson ;
  • Thomas F Kelly ;
  • Peter H Clifton ;
  • Ty J Prosa ;
  • Daniel R. Lenz ;
  • Ed X Oltman ;
  • Ryll Henning ;
  • Robert Hartmann ;
  • Martin Huth ;
  • Sebastian Ihle ;
  • Julia Schmidt ;
  • Martin Simson ;
  • Lothar Strueder ;
  • Jan Herrmann ;
  • Gordon Krenz ;
  • Gerhard Lutz

Image Collection using an Auto Data Acquisition System and An Application to Ice Embedded Ribosome

A New Microstructural Imaging Approach Through EBSD Pattern Region of Interest Analysis

Concepts for an Annular Pole Piece Detector for the Simultaneous Measurement of X-Rays and Backscattered Electrons Inside a SEM

Performance Advances in LEAP Systems

The pnCCD for Applications in Transmission Electron Microscopy: Further Development and New Operation Modes

Large Solid Angle Silicon Drift Detectors for EDX Analysis in TEM