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  • Monday
  • An Electron Microscopic Investigation of (1/3)<0 -1 1 1> Dislocations in Bi2Te3 Nanowires: Defect Crystallography and Relationship to 7-layer Bi3Te4 Defects

    • D. L. Medlin ;
    • K. J. Erickson ;
    • S. J. Limmer ;
    • W. G. Yelton ;
    • M. P. Siegal ;
    Title: An Electron Microscopic Investigation of (1/3)<0 -1 1 1> Dislocations in Bi2Te3 Nanowires: Defect Crystallography and Relationship to 7-layer Bi3Te4 Defects
    D. L. Medlin;K. J. Erickson;S. J. Limmer;W. G. Yelton;M. P. Siegal

    Symposium: A17 - Extended Crystal Defects: Quantification of Strain, Local Atomic Structure and Chemistry
    Date and Time: Tuesday, Aug 5 3:30 PM - 5:00 PM
    Room: CCC - Exhibit Hall AB