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  • Monday
  • Quantitative Strain Measurement in Semiconductor Devices by Scanning Moiré Fringe Imaging

    • Suhyun Kim ;
    • Sungho Lee ;
    • Younhuem Jung ;
    • Joong Jung Kim ;
    • Gwangseon Byun ;
    • sunyoung Lee ;
    • Heabum Lee ;
    Title: Quantitative Strain Measurement in Semiconductor Devices by Scanning Moiré Fringe Imaging
    Suhyun Kim;Sungho Lee;Younhuem Jung;Joong Jung Kim;Gwangseon Byun;sunyoung Lee;Heabum Lee

    Symposium: A17 - Extended Crystal Defects: Quantification of Strain, Local Atomic Structure and Chemistry
    Date and Time: Tuesday, Aug 5 1:30 PM - 3:00 PM
    Room: CCC - Room 12