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  • Measuring Strain Fields surrounding Grain-Boundary Dislocations in Silicon using Scanning Transmission Electron Microscopy

    • Martin Couillard ;
    Title: Measuring Strain Fields surrounding Grain-Boundary Dislocations in Silicon using Scanning Transmission Electron Microscopy
    Martin Couillard

    Symposium: A17 - Extended Crystal Defects: Quantification of Strain, Local Atomic Structure and Chemistry
    Date and Time: Tuesday, Aug 5 1:30 PM - 3:00 PM
    Room: CCC - Room 12