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  • Monday
  • Correlative Imaging of Stacking Faults using Atom Probe Tomography (APT) and Scanning Transmission Electron Microscopy (STEM)

    • Santoshrupa Dumpala ;
    • Adedapo A Oni ;
    • Sonal Padalkar ;
    • Scott R Broderick ;
    • James M LeBeau ;
    • Krishna Rajan ;
    Title: Correlative Imaging of Stacking Faults using Atom Probe Tomography (APT) and Scanning Transmission Electron Microscopy (STEM)
    Santoshrupa Dumpala;Adedapo A Oni;Sonal Padalkar;Scott R Broderick;James M LeBeau;Krishna Rajan

    Symposium: A16 - Correlative Microscopy and Microanalysis from Macro to Pico
    Date and Time: Tuesday, Aug 5 3:30 PM - 5:00 PM
    Room: CCC - Exhibit Hall AB